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Probe×インクス - List of Manufacturers, Suppliers, Companies and Products

Probe Product List

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Features of layered probes

Features of layered probes

Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.

We would like to introduce the features of the Inks' layered probe. The semi-layered probe contacts with a single metal plate, allowing for measurements with structurally stable contact resistance. Additionally, it is resistant to degradation of spring properties due to heat, making it suitable for measuring power semiconductors that apply high current and high voltage. It can make contact with points arranged in narrow pitches, such as semiconductor lead parts and connector contacts, up to a maximum pitch of 0.05. Furthermore, by varying the shape of the probe body and the thickness of the auxiliary V-shaped leaf spring, it is possible to adjust the load from high to low continuously. 【Features】 ■ Stable contact resistance value (demonstrates power in precise measurements) ■ Supports high current and high voltage (contributes to application and measurement of power semiconductors) ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch) ■ Adjustable contact load (contact tailored to the characteristics of the measured object) *For more details, please refer to the external link page or feel free to contact us.

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Explained in a video! The mechanism of layered probes [Free case study provided]

Explained in a video! The mechanism of layered probes [Free case study provided]

A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!

In today's world of miniaturization, are you facing difficulties with measurements using conventional probes? With Inks' "Stacked Probes," we can make contact with a single metal plate, allowing us to accommodate a minimum pitch of 0.05 mm. On this page, we present a video showcasing our "Stacked Probes" in action. Please take a look. 【Features】 ■ Stable contact resistance values ■ Supports high current and high voltage ■ Compatible with narrow pitches ■ Adjustable contact load, etc. *For more details, please download the PDF or contact us.

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Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

【Layered Probe Brochure Giveaway】Compatible with high current and high temperature. Achieving stable contact resistance values!

The "Layered Probe Brochure" introduces the excellent features of layered probes in comparison to conventional spring probes. Are you facing issues such as "unstable contact resistance," "looking for probes that can handle narrow pitches," "wanting to measure under high current and high temperature," or "seeking probes with superior durability"? With Inks' "Layered Probes," these problems can be resolved! 【Contents】 ■ Structure of Layered Probes ■ Features of Layered Probes ■ Layered Probes Q&A, etc. *For more details, please download the PDF or contact us.

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[Example] Stable contact of the stacked probe

[Example] Stable contact of the stacked probe

Introduction to stable contact with the package lead.

The wiping effect of the "stacked probe" removes the oxide film while making contact, achieving stable contact. Additionally, a coating that suppresses tin transfer has been applied to the probe tip, resulting in increased longevity. For magnetic sensor packages, it is also possible to construct the probe unit using only non-magnetic materials. In this case, stable contact was achieved with 2 million cycles of no maintenance. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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[Example] Contact at narrow pitch and multiple points with a stacked probe.

[Example] Contact at narrow pitch and multiple points with a stacked probe.

Contributing to reduced inspection time and improved production through simultaneous multi-point contact.

We would like to introduce the narrow pitch and multi-point contact of the "stacked probe" that we handle. By stacking 50 probes with a thickness of 0.1mm in a fan shape at a 0.2mm pitch, we have achieved simultaneous contact at 50 points. This has led to a reduction in inspection time and contributed to increased productivity. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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[Example] Probe design tailored to existing equipment (narrow space)

[Example] Probe design tailored to existing equipment (narrow space)

Designed probes to fit within limited space, contributing to cost reduction.

We would like to introduce the probe design (for narrow spaces) tailored to the existing equipment for our "stacked probes." In this case, we used a probe for LED inspection. Since we can design the probe to fit into the limited space of existing equipment, there is no need to purchase new equipment, contributing to cost reduction. 【Features of Stacked Probes】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Durability of layered probes

Durability of layered probes

Contributed to improved productivity and cost reduction with 1 million to 10 million contact achievements.

The "laminated probe" is made of a single-piece leaf spring structure, which eliminates issues such as component interference from multiple parts, resulting in exceptional durability. When the contact target is tin (Sn), applying a conductive coating to the tip of the probe suppresses tin transfer, enabling stable inspection. Additionally, due to its high sliding properties and very hard membrane, it excels in wear resistance and durability. As a result, the probe is expected to have a longer lifespan. 【Expected Effects】 ■ Prolonged lifespan of the probe ■ Improved test yield ■ Reduced re-inspection ■ Decreased cleaning and maintenance tasks ■ Increased operational rate of evaluation equipment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Sensitive Probe (IB/IF Series) *CAD data available

Sensitive Probe (IB/IF Series) *CAD data available

IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!

The "IB series" is an integrated contact probe that achieves low contact resistance, ranging from types below 10 mΩ to types below 50 mΩ, without the need for a socket. The "IF series" enables probing at narrow pitches. Utilizing a structure where tungsten wire moves within a flexible guide tube, the body can be spread out in a fan shape and fixed, allowing the tip to be arranged at a narrow pitch. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract manufacturing
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【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]

In recent years, as products have become smaller, the components used have also been miniaturized year by year. However, isn't it becoming difficult to measure and analyze these miniaturized components with existing probes? The "stacked probe" can handle a minimum pitch of 0.05 mm, which conventional probes cannot accommodate, and it also performs well as a probe for power semiconductors that require high current. This means that even small semiconductors that could not be measured before can now be measured. 【Features】 - Achieves precise measurements due to stable contact resistance - Capable of handling high current and high voltage - Supports narrow pitches of up to 0.05 mm, etc. *For more details, please download the PDF or contact us.

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