Probeのメーカーや取扱い企業、製品情報、参考価格、ランキングをまとめています。
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Probe - メーカー・企業154社の製品一覧とランキング

更新日: 集計期間:Oct 08, 2025~Nov 04, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

Probeのメーカー・企業ランキング

更新日: 集計期間:Oct 08, 2025~Nov 04, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  3. ウェーブクレスト Saitama//Industrial Electrical Equipment
  4. 4 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
  5. 4 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment

Probeの製品ランキング

更新日: 集計期間:Oct 08, 2025~Nov 04, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 AC Current Probe "CWT Mini50HF" 日本オートマティック・コントロール 電子システム部

Probeの製品一覧

496~510 件を表示 / 全 662 件

表示件数

XF-E 10 (E field electric field probe)

Can be connected to a 50Ω input spectrum analyzer or oscilloscope!

The "XF-E 10" electric field probe is a passive near-field probe. The electrode width of the probe head is approximately 0.2mm, allowing it to pinpoint the location of even the smallest electric field sources such as conductive paths of 0.1mm width or single IC pins. It has the same basic structure as the "XF-E 04s" and "XF-E 09s" probes but offers higher resolution. Since it is necessary to place the electrode surface directly on the measurement target with high electric field strength, it is not suitable for wide-range measurements. 【Specifications】 ■ Type: Near-field probe ■ Size: 0.5x2mm probe head ■ Frequency range: 30MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 0.2mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

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ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

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RF-R 400-1 (H field magnetic field probe)

The current attenuation sheath provides a solid electrical shield!

The "RF-R 400-1" magnetic field probe is a passive near-field probe with a head size of 25mm in diameter. It has high sensitivity and is suitable for measurements in a range of up to 10cm around assemblies and devices. The larger the tip diameter, the higher the sensitivity, allowing for the detection of magnetic fields over a wider area. It has the same basic structure as the "RF-R 50-1" and "RF-R 3-2". 【Specifications】 ■ Type: Near-field probe ■ Size: Φ25mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

RF-U 5-2 (H field magnetic field probe)

A compact and very easy-to-use near-field probe from Langer!

The RF-U 5-2 magnetic field probe is a passive near-field probe designed to detect magnetic fields from a wide range of conductive paths, cables, connectors, electronic components, and more. The probe functions like a coupling clamp. When the probe head is placed directly on a component, it can detect magnetic field lines coming from other sources either straight on or from the side. It can be connected to a 50Ω input spectrum analyzer or oscilloscope. 【Specifications】 ■ Type: Near-field probe ■ Size: 6x6mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack ■ Resolution: 5mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

RF-E 02 (E field electric field probe)

Bring the underside of the probe head close to the object being measured and detect the emitted electric field!

The "RF-E 02" electric field probe is a passive near-field probe. It detects separated electric field sources on bus structures, large components, or the surfaces of power supplies. The lower electrode surface of the probe head is approximately 2x5 cm and works well at a distance of 1 to 2 cm from the component. It has the same basic structure as the "RF-E 05" and "RF-E 10" probes. 【Specifications】 ■ Type: Near-field probe ■ Size: 23x53 mm probe head ■ Frequency range: 30 MHz to 1.5 GHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

RF-E 03 (E field electric field probe)

Can be connected to a 50Ω input spectrum analyzer or oscilloscope!

The RF-E 03 electric field probe is a passive near-field probe designed for use with scanners manufactured by Langer. The lower electrode surface of the probe head measures approximately 4x4mm, allowing for the identification of small electric field sources such as conductive paths and single components on printed circuit boards. The lower surface of the probe head is placed directly on the object being measured to detect the emitted electric field. 【Specifications】 ■ Type: Near-field probe ■ Size: 4x4mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

RF-E 04 (E field electric field probe)

The lower electrode surface of the probe head is approximately 5x5mm! It detects the separated electric fields on the surfaces of clocked lines and ICs.

The RF-E 04 electric field probe is a passive near-field probe designed for use with scanners manufactured by Langer. It has the same basic structure as the "RF-E 03" and "RF-E 09" probes. It functions well at distances of 0.5 to 10 mm from the assembly. By placing and holding a small square electrode surface on components or printed circuit boards, it can detect sources of electrical interference. 【Specifications】 ■ Type: Near-field probe ■ Size: 5x5 mm probe head ■ Frequency range: 30 MHz to 3 GHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

RF-E 05 (E field electric field probe)

It has the same basic structure as the "RF-E 02" and "RF-E 10" probes, but it detects electric fields in a very narrow range!

The RF-E 05 electric field probe is a passive near-field probe designed for use with scanners manufactured by Langer. The electrode width of the probe head is approximately 0.5mm, allowing for accurate identification of electric fields around clocked lines, IC pins, and small components. By placing and holding it on components or printed circuit boards, it can detect sources of RF electrical interference. 【Specifications】 ■ Type: Near-field probe ■ Size: 1x8mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack ■ Resolution: 0.6mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

RF-E 10 (E field electric field probe)

It has the same basic structure as the "RF-E 02" and "RF-E 05" probes, but with higher resolution!

The "RF-E 10" electric field probe is a passive near-field probe. The electrode width of the probe head is approximately 0.2mm, allowing it to pinpoint the location of even the smallest electric field sources, such as a conductive path of 0.1mm or a single IC pin. Since the electrode surface needs to be placed directly on the measurement target where the electric field strength is high, it is not suitable for wide-range measurements. For measuring larger areas, please use the "RF-E 02" or "RF-E 05". 【Specifications】 ■ Type: Near-field probe ■ Size: 0.5x2mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack ■ Resolution: 0.2mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

LF-R 3 (H field magnetic field probe)

It is compact and very easy to use, and it is also electrically well shielded due to the current attenuation sheath.

The "LF-R 3 Magnetic Field Probe" is a passive near-field probe that directly detects RF magnetic fields on assemblies with high resolution, including IC pins, IC cases, conductive paths, decoupling capacitors, and areas surrounding EMC components. It has the same basic structure as the "LF-R 50" and "LF-R 400" probes, but this product offers the highest resolution. It is suitable for measurements close to components with high magnetic field strength, but not for measurements from a distance. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ3mm probe head ■ Frequency range: 100kHz to 50MHz ■ Connector: SMB male, Jack ■ Resolution: 1mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

LF-U 5 (H field magnetic field probe)

Can be connected to a 50Ω input spectrum analyzer or oscilloscope!

The "LF-U 5 Magnetic Field Probe" is a passive near-field probe designed to detect magnetic fields from a wide range of conductive paths, cables, connectors, electronic components, and more. The probe functions like a coupling clamp. Position the curved bottom of the probe on the surface of the component. It also detects magnetic field lines coming straight or from the side from other sources relative to the probe. 【Specifications】 ■ Type: Near-field Probe ■ Size: 6×6mm Probe Head ■ Frequency Range: 100kHz to 50MHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

LF-R 50 (H field magnetic field probe)

The larger head allows for the detection of larger components as potential sources of interference!

The "LF-R 50 Magnetic Field Probe" is a passive near-field probe with a head size of 10mm in diameter, designed to measure assemblies, devices, or cables up to 3cm away. This product offers performance that is intermediate between the "LF-R 400" and "LF-R 3" probes in terms of diameter, sensitivity, and resolution. Langer's near-field probes are compact and very easy to use, and they are electrically well-shielded due to the current-damping sheath. 【Specifications】 ■ Type: Near-field Probe ■ Size: Φ10mm Probe Head ■ Frequency Range: 100kHz to 50MHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

LF-U 2.5 (H field magnetic field probe)

During measurement, place the probe head gap on the object being measured!

The "LF-U 2.5 Magnetic Field Probe" is a passive near-field probe designed to selectively detect RF currents in conductive paths, SMD components, and IC pins. The probe head features a magnetically active gap approximately 0.5mm wide. It functions similarly to the "LF-U 5" probe. While the "LF-U 5" is suitable for larger components such as cables and connectors, this product is designed for SMD components and pins. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ4mm probe head ■ Frequency range: 100kHz to 50MHz ■ Connector: SMB male, Jack ■ Resolution: 0.5mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

MFA 02 Set (Active Magnetic Field Probe)

Please use the correction data to convert the probe's output voltage into either the magnetic field or the current flowing through the conductor.

The "MFA 02 Set" includes, for example, two high-resolution near-field microprobes capable of measuring low-frequency magnetic fields up to 1GHz in signal conductors (150μm), SMD components, or IC pins, along with a bias tee and a dedicated cable. The preamplifier (9V, 100mA) is powered through a bias tee BT 706 with an impedance of 50Ω, and the magnetic field microprobes are connected to a spectrum analyzer or oscilloscope via the BT 706. 【Specifications】 ■ Type: PCB Emission Near-Field Microprobe ■ Supported Frequency Range: 1MHz to 1GHz *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

MFA-R 0.2-6 (Magnetic Field Microprobe)

Equipped with a very small and high-resolution probe head, it is suitable for measuring RF magnetic fields up to 6 GHz.

The "MFA-R 0.2-6 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. It detects magnetic fields from IC pins on components, thin conductive paths, and tiny SMD components. It has the same basic structure as the "MFA-R 0.2-75," but only the frequency characteristics differ. There is a black dot marked laterally on the coil opening of the probe head, so please check the orientation before measuring. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 100MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 300μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

Microprobe for optical microscopes

The self-driving nano-probe robot 'miBot' is different from conventional manipulators!

This innovative nano-probing system can control up to eight miBot nano-probers and can be offered with various configurations and options. Customization is possible to meet application-specific requirements and installation conditions for the equipment. The compact and lightweight platform for miBot can accommodate various electron microscopes and can be mounted on sample stages such as SEM or introduced into the sample chamber via a load lock. It also supports high-resolution imaging using semi-in-lens objective lenses, enabling nano-probing tests under high-resolution imaging at low acceleration voltages below 0.5 kV using the new FE-SEM. Additionally, the entire nano-probing system can be tilted using the tilt mechanism of the SEM sample stage. This allows for circuit modifications using FIB and nano-probing to be performed in the same environment, resulting in faster and more accurate failure analysis results. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録