Probeのメーカーや取扱い企業、製品情報、参考価格、ランキングをまとめています。
イプロスは、 製造業 ・ BtoB における情報を集めた国内最大級の技術データベースサイトです。

Probe - メーカー・企業41社の製品一覧とランキング

更新日： 集計期間:Aug 20, 2025～Sep 16, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

Probeのメーカー・企業ランキング

更新日： 集計期間:Aug 20, 2025～Sep 16, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. サンケイエンジニアリング Kanagawa//Manufacturing and processing contract 本社
  2. 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 Tokyo//Testing, Analysis and Measurement （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社
  3. ヴァイサラ Tokyo//Testing, Analysis and Measurement
  4. 4 テクノプローブ Chiba//Testing, Analysis and Measurement
  5. 5 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
企業ランキングへ

Probeの製品ランキング

更新日： 集計期間:Aug 20, 2025～Sep 16, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  5. 5 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

Probeの製品一覧

496～510 件を表示 ／ 全 658 件

表示件数
Probe for Bear Board Tester "C-0.31 Series"

Probe for Bear Board Tester "C-0.31 Series"

Introducing contact probes compatible with a 0.6mm pitch, highly regarded worldwide!

At Nippon Denshin, we primarily manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.31 series' is a probe for bare board testers compatible with a 0.6mm pitch. 【Features】 ■ Compatible with 0.6mm pitch ■ Five types of tip shapes ■ Lead wire processing for sockets is also possible ■ Achieves stable high quality, low price, and short delivery times ■ Accommodates various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Probe for Bear Board Tester "C-04 Series"

Probe for Bear Board Tester "C-04 Series"

Introducing contact probes compatible with a 1mm pitch! Highly rated worldwide.

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-04 series' is a probe for bare board testers compatible with a 1mm pitch. 【Features】 ■ Compatible with 1mm pitch ■ 8 types of tip shapes ■ Lead wire processing for sockets is also possible ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Probe for Bear Board Tester "C-05 Series"

Probe for Bear Board Tester "C-05 Series"

Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!

At Nippon Denshin, we primarily manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by many years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-05 series' is a probe for bare board testers compatible with a 1.27mm pitch. 【Features】 ■ Compatible with 1.27mm pitch ■ Five types of tip shapes ■ Thorough quality control ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Inspection fixtures made by probe manufacturers

Inspection fixtures made by probe manufacturers

A wide variety of probes in stock! Leave the selection of probes to us!

Our company offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types. Since we design in-house, we can also manufacture components, allowing us to meet customer requests in a short delivery time. As a probe manufacturer, we have many inspection fixtures that we can create, so please feel free to consult with us. 【Features】 ■ Low price ■ Support for small quantities of probes ■ Short delivery time with in-house design ■ Components can also be manufactured in-house *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
In-circuit tester probe "ND050S series"

In-circuit tester probe "ND050S series"

Introducing probes suitable for connectors and interfaces with a 1.27mm pitch!

The "ND050S series" is a short and narrow pitch probe. The recommended stroke for spring pressure is 1.1mm. There are two types of tip shapes available: "E1" and "P1." Additionally, it is designed to be robust, making it suitable for connectors and interfaces. 【Features】 ■ Short length ■ Narrow pitch ■ Robustness *For more details, please refer to the PDF document or feel free to contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
High Current Probe "HC1 Series"

High Current Probe "HC1 Series"

Easy management of hole diameter! Introducing a high-current probe with a constant phase current of 20A.

The "HC1 Series" is a high-current probe equipped with a press ring, making hole diameter management easy. It is made from beryllium copper with a specially treated low contact resistance plunger. This product is pre-assembled and can be pressed directly into the board. 【Features】 ■ Constant phase rated current 20A ■ Made from beryllium copper with a specially treated low contact resistance plunger ■ Equipped with a press ring for easy hole diameter management ■ Pre-assembled and can be pressed directly into the board *For more details, please refer to the PDF document or feel free to contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
New Switch Pin "ND-SW Series"

New Switch Pin "ND-SW Series"

A switch pin with a single internal contact that significantly improves durability.

The "ND-SW Series" is one of our features, incorporating the know-how of integrated probes that have been used by many customers over the years, into a switch pin. We offer the "ND-SW-2.4 (φ3.0 POM)" and its corresponding socket, which allows the rear end to move when the tip strokes. Additionally, since there is only one internal contact, it excels in durability and cost performance. 【Features】 ■ Incorporates know-how of integrated probes ■ Only one internal contact ■ Excellent durability and cost performance *For more details, please refer to the PDF document or feel free to contact us.

  • switch

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Hot-wire anemometer smart probe 'testo405i' [Rental]

Hot-wire anemometer smart probe 'testo405i' [Rental]

A wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication.

The testo 405i is a thermal wire anemometer smart probe that can measure wind speed, wind temperature, and air volume. It is compact and highly portable, and the measurements can be checked on a smartphone or tablet via Bluetooth communication. Additionally, specialized analysis results can be easily obtained through calculation and display functions provided by a dedicated app. 【Features】 ■ Displays measurement values on Android/iOS devices (smartphones and tablets) ■ Connects up to 6 probes to a single device for simultaneous measurements ■ Capable of graphing, saving (Android only), and emailing measurement data ■ Duct information can be set in air volume calculation mode ■ The dedicated app can be downloaded from Google Play and the App Store (free) ■ Wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication ■ The rod with a scale indicating insertion length is up to 400mm long, can be bent 180°, and allows measurements at any angle.

  • Wind Speed/Volume Meter

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Probe 'Fe-0.6Pen' for film thickness gauge SWT [Rental]

Probe 'Fe-0.6Pen' for film thickness gauge SWT [Rental]

This is an electromagnetic probe for SWT-8000-2, 9000, and 8200-2. It is used for measuring paint thickness in narrow areas and small parts.

■Measurement range: 0 to 600μm

  • Coating thickness gauge

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Thickness gauge SWT with eddy current probe for thick materials 'NFe-8' [Rental]

Thickness gauge SWT with eddy current probe for thick materials 'NFe-8' [Rental]

This is an eddy current probe for SWT-8000-2, 9000, and 8200-2.

Measurement range: 0 to 8mm

  • Coating thickness gauge

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
High-frequency (millimeter wave) probe "Precision ultra-short probe"

High-frequency (millimeter wave) probe "Precision ultra-short probe"

Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!

We provide probes designed with consideration for the conditions of high-frequency measurement, allowing for highly accurate measurements. The measurable frequency range is 7GHz, suitable for 50Ω lines on high-frequency substrates. *For more details, please download the PDF or contact us.*

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Inks Co., Ltd. Business Introduction

Inks Co., Ltd. Business Introduction

Providing precision probes, precision parts, and precision models (such as desktopZERO).

Inks Corporation provides precision probes, precision parts, and precision models (such as desktopZERO). In the probe business, we achieve high performance through innovative technology with spring probes, high-frequency probes, and stacked probes. To pursue high performance, we do not use automated machines and manufacture by hand. In our product business, we incorporate the foundational press technology with the experience, knowledge, and know-how cultivated in the consumer business to solve our customers' problems. 【Business Overview】 ■ Probe Business: Design, prototyping, mass production, and sales of precision probes ■ Product Business: Design, prototyping, mass production, and sales of precision parts ■ Consumer Business: Planning, design, production, and sales of consumer products *For more details, please refer to the PDF materials or feel free to contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Features of layered probes

Features of layered probes

Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.

We would like to introduce the features of the Inks' layered probe. The semi-layered probe contacts with a single metal plate, allowing for measurements with structurally stable contact resistance. Additionally, it is resistant to degradation of spring properties due to heat, making it suitable for measuring power semiconductors that apply high current and high voltage. It can make contact with points arranged in narrow pitches, such as semiconductor lead parts and connector contacts, up to a maximum pitch of 0.05. Furthermore, by varying the shape of the probe body and the thickness of the auxiliary V-shaped leaf spring, it is possible to adjust the load from high to low continuously. 【Features】 ■ Stable contact resistance value (demonstrates power in precise measurements) ■ Supports high current and high voltage (contributes to application and measurement of power semiconductors) ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch) ■ Adjustable contact load (contact tailored to the characteristics of the measured object) *For more details, please refer to the external link page or feel free to contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Explained in a video! The mechanism of layered probes [Free case study provided]

Explained in a video! The mechanism of layered probes [Free case study provided]

A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!

In today's world of miniaturization, are you facing difficulties with measurements using conventional probes? With Inks' "Stacked Probes," we can make contact with a single metal plate, allowing us to accommodate a minimum pitch of 0.05 mm. On this page, we present a video showcasing our "Stacked Probes" in action. Please take a look. 【Features】 ■ Stable contact resistance values ■ Supports high current and high voltage ■ Compatible with narrow pitches ■ Adjustable contact load, etc. *For more details, please download the PDF or contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

【Layered Probe Brochure Giveaway】Compatible with high current and high temperature. Achieving stable contact resistance values!

The "Layered Probe Brochure" introduces the excellent features of layered probes in comparison to conventional spring probes. Are you facing issues such as "unstable contact resistance," "looking for probes that can handle narrow pitches," "wanting to measure under high current and high temperature," or "seeking probes with superior durability"? With Inks' "Layered Probes," these problems can be resolved! 【Contents】 ■ Structure of Layered Probes ■ Features of Layered Probes ■ Layered Probes Q&A, etc. *For more details, please download the PDF or contact us.

  • probe

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

Probeに関連する検索キーワード

COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.