Highly Accelerated Life Testing Device (HALT)
Detect product weaknesses in a short period during the initial stage of the productization process, which is development/design! "Towards shortening product development lead time and further improving reliability."
This is a testing tool designed to quickly detect product weaknesses and eliminate potential defects in the manufacturing process during product development. By repeatedly detecting and improving weaknesses and adding evaluations, the reliability of the product is further enhanced. 【Features】 ■ Wide temperature range: -100℃ to +250℃ ■ Rapid temperature change: 60℃/min or more ■ Random vibration with 6 degrees of freedom due to repeated shocks 【Main effects expected from HALT testing】 ■ Improved product robustness By applying "strong stress" (rapid temperature changes and 6 degrees of freedom vibrations) that exceeds product specifications, design weaknesses are made apparent. Improving the failure points enhances the robustness of the product. ■ Shortened development cycle By discovering and improving potential defects during the development phase, risks and rework that occur in later processes are reduced. Reliability comparisons during changes in parts or with existing models can also be confirmed in a short period through testing under "strong stress." As a result, the development cycle can be shortened further. ■ Reduction of warranty costs, etc. By addressing latent defects that are difficult to detect with conventional testing, troubles after market release can be prevented, thereby reducing total costs, including warranty expenses associated with the product.
- Company：エスペック
- Price：Other
![[Application Example] Mobile Phone Solution](https://image.mono.ipros.com/public/product/image/bb6/216632026/IPROS82261865164468241644.jpeg?w=280&h=280)
