High-brightness halogen light source device 'YP-1501'
High-brightness halogen light source device perfect for ultra-precision flat surface inspection! It enables defect detection of less than 0.2μm with astonishing illumination!
The "YP-1501" is a micro-observation lighting device designed to detect various defects such as foreign substances, scratches, polishing unevenness, haze, and slips on the final finishing surface, which requires the most manual labor during the processing of semiconductor wafers and LCD substrates. It can illuminate the sample surface to over 400,000 lux. Additionally, it uses a halogen lamp as the light source, resulting in a high color temperature, minimal lighting unevenness, and very stable, sharp illumination. 【Features】 ■ Uses a halogen lamp as the light source ■ Capable of illuminating the sample surface to over 400,000 lux ■ Reduces thermal effects to one-third compared to conventional aluminum mirrors ■ Allows for one-touch switching between high and low illumination observation *For more details, please request materials or view the PDF data from the download.
- Company：山田光学工業
- Price：Other
