Crystal structure analysis for semiconductor thin films 'CrystalDiffract'
Refinement of thin film powder diffraction data using the Rietveld method.
In the field of semiconductor thin films, structural analysis of thin films is a crucial factor that influences product quality and performance. In particular, accurately understanding the crystal structure and composition of thin films is essential for comprehending device characteristics and conducting optimal designs. Powder diffraction data is an important source of information for analyzing the structure of thin films, but refining the data requires advanced technology and expertise. CrystalDiffract was developed to address this challenge. 【Usage Scenarios】 - Crystal structure analysis of thin films - Structural evaluation of multilayer films - Composition analysis of thin film materials 【Benefits of Implementation】 - Accurate information regarding the structure of thin films - Optimization of device design - Increased efficiency in research and development
- Company:ヒューリンクス
- Price:100,000 yen-500,000 yen