[Example] Contact at narrow pitch and multiple points with a stacked probe.
Contributing to reduced inspection time and improved production through simultaneous multi-point contact.
We would like to introduce the narrow pitch and multi-point contact of the "stacked probe" that we handle. By stacking 50 probes with a thickness of 0.1mm in a fan shape at a 0.2mm pitch, we have achieved simultaneous contact at 50 points. This has led to a reduction in inspection time and contributed to increased productivity. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.
- Company:インクス
- Price:Other