Inspection device "Probe Card Analyzer"
A simple and user-friendly interface! Easily create inspection data and image processing procedures.
The "Probe Card Analyzer" is an inspection device that achieves positioning and measurement accuracy on the micrometer order through image processing and a unique correction method. It allows for individual contact measurements of needles, enabling accurate measurement even for needles that are shorted with others on the substrate. Additionally, the software's rotation and offset correction functions eliminate the need for adjustments such as alignment during the work set, allowing inspections to begin immediately after installation. 【Features】 ■ Up to 500 measurement channels ■ Inspection area of 150mm square ■ Compatible with large substrates for multiple DUTs ■ Simple and user-friendly operation screen ■ Easy creation of inspection data and image processing procedures *For more details, please download the PDF or feel free to contact us.
- 企業:九州エレクトロン
- 価格:Other