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Radio-frequency anechoic chamber Product List and Ranking from 43 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

Radio-frequency anechoic chamber Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 芹沢システムリサーチ Gunma//Industrial Electrical Equipment
  2. ノイズ研究所(NoiseKen) Kanagawa//Testing, Analysis and Measurement
  3. 富山電気ビルデイング Toyama//Industrial Electrical Equipment
  4. 4 テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  5. 5 リケン環境システム Saitama//Electronic Components and Semiconductors

Radio-frequency anechoic chamber Product ranking

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Surge Test Device 【JASO D001-94】 芹沢システムリサーチ
  2. Metal heating element "PYROMAX" リケン環境システム
  3. Optocan2000 CANバスネットワーク光変換装置 エレナ電子
  4. 4 Motor preventive maintenance and rotating machinery failure prediction monitoring system 富士電機 パワエレ営業本部 産業ソリューション統括部
  5. 5 Eiyou Techno Co., Ltd. NPO諏訪圏ものづくり推進機構

Radio-frequency anechoic chamber Product List

136~150 item / All 217 items

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S2 set (magnetic field probe for E1)

Only operable with the SGZ21 Burst Generator included in the "E1 Set"!

The "S2 Set" is a product that includes active and passive near-field probes. These measure non-reactive first transient pulse magnetic fields within electronic devices and assemblies under interference. It can analyze the effects of bursts and ESD interference that cause problems in the DUT. The magnetic field probes transmit the measurement signals to the optical receiver of the SGZ21 burst generator via LWL connection. 【Set Contents (Partial)】 ■MSA 02: Magnetic Field Probe (active) ■05K black: Probe Head (for MSA 02) ■05R white: Probe Head (for MSA 02) ■05U orange: Probe Head (for MSA 02) ■MS 101: Magnetic Field Probe ■MS 102U: Magnetic Field Probe *For more details, please download the PDF (English version) or feel free to contact us.

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HR-R 8-1 Set (Magnetic Field Probe)

Frequency range: up to 40GHz! PCB emission near-field probe type.

The "HR-R 8-1 Set (Magnetic Field Probe)" includes the HR-R 8-1 B magnetic field probe. This probe enables magnetic field measurements of up to 40GHz. The probe head of the HR-R 8-1 is designed to measure ICs, circuit board structures, and components, allowing for the identification of high-frequency magnetic field locations. [Set Contents] ■ HR-R 8-1: Near-field probe ~40GHz B-field ■ CS-ESA: ViewerChipScan-ESA Viewer Software/USB ■ HR-R char: HR-R 8-1 individual data ■ User manual ■ Case *For more details, please download the PDF (English version) or feel free to contact us.

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SESD216

In contact discharge, it has a contact control function that prevents discharge when not in contact!

We would like to introduce our EMC testing equipment, the 'SESD216'. The ESD simulator (electrostatic discharge tester) is well-suited for EMC testing of systems and devices defined in the IEC/EN61000-4 Part 2 standard. This test conducts resistance testing against electrostatic discharge, featuring two modes: air discharge and contact discharge. It comes equipped with an air discharge test probe for non-contact testing and a contact discharge test probe for contact testing. 【Features】 ■ Compact handheld type without a control base unit ■ Display function for actual discharge voltage during air discharge ■ Automatic testing via programming ■ Large and easy-to-read LCD panel ■ Simple selection and setting of test content from the LCD panel *For more details, please refer to the related links or feel free to contact us.

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STE1420

Achieve connection to coupling pliers and three-phase coupling networks through high voltage output!

The 『STE1420』 is an EMC testing device that simulates burst noise for EFT testing as defined by the IEC 61000-4-4 and DIN EN 61000-4-4 standards. With a very short rise time of 5ns, individual pulses can generate a wideband RF spectrum of up to 300MHz. Standard test levels 1, 2, 3, and 4 are programmed, and additional test sequences can also be saved via the memory function. 【Features】 ■ Generation of wideband RF spectrum ■ Simple operation ■ Color touch display ■ Parameters can be changed during testing ■ Memory function *For more details, please refer to the related links or feel free to contact us.

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SFT2400

Very short rise time of 5 ns! Individual pulses generate a wideband RF spectrum up to 300 MHz.

The "SFT2400" is an EMC testing device that simulates burst noise for EFT testing defined by the IEC 61000-4-4 and DIN EN 61000-4-4 standards. It also offers various special features, such as simulating "real bursts" and "noise" to mimic natural phenomena. The "IFM" and "DFM" (increase or decrease of frequency within the burst packet) functions are important tools for investigating the effects of resonance or saturation on the EUT. 【Features】 ■ Generation of wideband RF spectrum ■ Simple operation ■ Color touch display ■ Connection to coupling pliers or three-phase coupling networks via high voltage output ■ Parameters can be changed even during testing *For more details, please refer to the related links or feel free to contact us.

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PBS1 set (magnetic field and electric field probes)

It is possible to measure interference sources with high precision up to DC~9GHz and identify their locations!

We would like to introduce the 'PBS1 Set (Magnetic Field and Electric Field Probes)' that we handle. The set includes four magnetic field probes for measuring the magnetic field (H field) and one electric field probe, along with standard calibration data for each. The probes are equipped with high-quality insulation layers to protect against mechanical damage and environmental influences, allowing for safe measurement of oscillators and power lines. 【Features】 ■ Identification of interference sources ■ Estimation of interference electric field strength ■ Verification of shielding and filtering measures ■ Identification of faulty components ■ Detection of circuits that are overly sensitive to interference *For more details, please refer to the related links or feel free to contact us.

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PBS2 set (magnetic field and electric field probe with preamplifier)

The probe can be connected to any spectrum analyzer or oscilloscope!

We would like to introduce the "PBS2 Set (Magnetic Field and Electric Field Probes with Preamplifier)" that we handle. The set includes four magnetic field probes for measuring magnetic fields (H field) and one electric field probe, along with standard calibration data for each, and comes with a high-performance preamplifier. In addition to monitoring for EMC measures, it is also possible to generate fields for immunity testing in conjunction with a signal generator. 【Features】 ■ Identification of interference sources ■ Estimation of interference electric field strength ■ Verification of shielding and filtering measures ■ Identification of faulty components ■ Detection of circuits that are overly sensitive to interference *For more details, please refer to the related links or feel free to contact us.

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SX1 set (magnetic field and electric field probe)

It is possible to inspect IC pins, conductive paths, components, and connectors, and identify interference sources!

The "SX1 Set (Magnetic and Electric Field Probes)" includes three passive magnetic field probes and one dedicated cable. It is capable of measuring electric and magnetic fields in the high clock frequency range of 1GHz to 10GHz on electronic assemblies and ICs during the development process. Langer's near-field probes are compact and very easy to use, and they are electrically well-shielded due to the current-damping sheath. 【Set Contents】 ■SX-E 03: E-Field Probe 1GHz–10GHz ■SX-B 3-1: H-Field Probe 1GHz–10GHz ■SX-R 3-1: H-Field Probe 1GHz–10GHz ■SMA-SMA: 1m Cable ■Case *For more details, please refer to the related links or feel free to contact us.

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RF4-E Set (Electric Field Probe)

The corresponding frequency range is 30MHz to 1.5GHz/3GHz! PCB emission near-field probe type.

The "RF4-E Probe Set" includes two passive electric field probes that measure electric fields in the frequency range of 30MHz to 3GHz (1.5GHz) for comparative purposes. These probes are designed for analyzing electric field distribution, detecting coupling mechanisms on modules, and evaluating RF voltage in power systems at signal lead switching edges. Langer's near-field probes are compact and very easy to use, and they are electrically well-shielded due to the current-damping sheath. 【Set Contents】 ■RF-E 02: E-Field Probe 30MHz to 1.5GHz ■RF-E 05: E-Field Probe 30MHz to 3GHz ■SMB-BNC: 1m cable ■Case *For more details, please refer to the related links or feel free to contact us.

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LF1 set (magnetic field probe)

Using high-resolution probes such as LF-B 3, LF-U 5, and LF-U 2.5 to detect interference sources more accurately!

The "LF1 Near-Field Probe Set" includes four magnetic field probes and a dedicated cable, allowing for the measurement of longwave, mediumwave, and shortwave frequencies emitted from electronic devices during the development process. The probe heads in this set are designed to progressively detect electromagnetic interference sources from IC pins to large components on the assembly. They can be connected to a spectrum analyzer or oscilloscope with a 50Ω input. 【Set Contents】 ■LF-R 400: H-Field Probe 100kHz to 50MHz ■LF-B 3: H-Field Probe 100kHz to 50MHz ■LF-U 2.5: H-Field Probe 100kHz to 50MHz ■LF-U 5: H-Field Probe 100kHz to 50MHz ■SMB-BNC: 1m Cable ■Case *For more details, please refer to the related links or feel free to contact us.

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SX-R 3-1 (H field magnetic field probe)

It is also possible to access narrow spaces such as between IC pins and components!

The "SX-R 3-1 Magnetic Field Probe" is a passive near-field probe equipped with a compact probe head. It can measure RF magnetic fields with very high resolution and can detect small components as interference sources. Langer's near-field probes are compact and very easy to use, and they are electrically well-shielded by a current-damping sheath. 【Specifications】 ■ Type: Near-field Probe ■ Size: Φ3mm Probe Head ■ Frequency Range: 1GHz to 10GHz ■ Connector: SMA female, Jack ■ Resolution: 1mm *For more details, please refer to the related links or feel free to contact us.

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SX-R 20-1 (H field magnetic field probe)

Can be connected to a 50Ω input spectrum analyzer or oscilloscope!

The "SX-R 20-1 Magnetic Field Probe" is a passive near-field probe that covers a frequency range of up to 20GHz. With its very compact probe head, it is possible to trace and identify very small RF magnetic field sources on components and ICs. Langer's near-field probes are compact, very easy to use, and are electrically well-shielded due to the current-damping sheath. 【Specifications】 ■ Type: Near-field Probe ■ Size: 6x6mm Probe Head ■ Frequency Range: 1GHz to 20GHz *For more details, please refer to the related links or feel free to contact us.

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SX-E 03 (E field electric field probe)

Can be connected to a 50Ω input spectrum analyzer or oscilloscope!

The "SX-E 03 Electric Field Probe" is a passive near-field probe. The lower electrode surface of the probe head is approximately 4x4mm, allowing for the identification of small electric field sources such as conductive paths and single components on printed circuit boards. The lower surface of the probe head is placed directly on the object being measured to detect the emitted electric field. Langer's near-field probes are compact and very easy to use, and they are electrically well-shielded by a current-damping sheath. 【Specifications】 ■ Type: Near-field Probe ■ Size: 4x4mm Probe Head ■ Frequency Range: 1GHz to 10GHz ■ Connector: SMA female, Jack *For more details, please refer to the related links or feel free to contact us.

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XF-E 04s (E field electric field probe)

Functions well within a distance of 0.5 to 10 mm on the assembly! Same basic structure as the "XF-E 09s" probe.

The 『XF-E 04s』 electric field probe is a passive near-field probe. The lower electrode surface of the probe head is approximately 5x5mm, detecting separated electric fields on the surface of the IC. By placing and holding a small square electrode surface on components or printed circuit boards, it can detect sources of electrical interference. 【Specifications】 ■ Type: Near-field probe ■ Size: 5x5mm probe head ■ Frequency range: 30MHz to 6GHz ■ Connector: SMA female, Jack *For more details, please refer to the related links or feel free to contact us.

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XF-E 09s (E field electric field probe)

Compact and very easy to use, and with the current attenuation sheath, it is electrically well shielded!

The "XF-E 09s" electric field probe is a passive near-field probe. The electrodes of the probe head detect separated electric fields on the surface of the IC. It works well within a distance of 0.5 to 10 mm on the assembly. It has the same basic structure as the "XF-E 04s" probe, but by placing and holding small square electrode surfaces on components or printed circuit boards, it can detect sources of electrical interference. 【Specifications】 ■ Type: Near-field probe ■ Size: 10x10mm probe head ■ Frequency range: 30MHz to 6GHz ■ Connector: SMA female, Jack *For more details, please refer to the related links or feel free to contact us.

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