Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
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Precision processing/structural evaluation is possible over a wide area of several hundred micrometers.
It achieves high positional accuracy and wide-area cross-section production, making it usable as a new large-capacity analysis application. Even small structures within a large area can be targeted for processing, enabling wide-area structural analysis.
XRD: X-ray diffraction method
Pole figure measurement is a method that focuses on specific crystal planes and evaluates the distribution of crystal orientations by directing X-rays from various directions onto the sample. The detector is fixed at the diffraction angle (2θ) of the crystal plane of interest, and the two parameters, α (the tilt angle of the sample) and β (the in-plane rotation angle of the sample), are varied to measure crystal planes tilted in all directions. This indicates that the crystal orientations are concentrated in the directions where high diffraction intensity is observed. Additionally, the measurement results are represented in a pole figure as shown in the diagram at the bottom right.
![[Use Case] Structural Analysis](https://image.mono.ipros.com/public/product/image/d28/2000116870/IPROS1996258189925396261.jpg?w=280&h=280)
It is a field of engineering that deals with the behavior of structures subjected to dynamic loads (vibrations).
Structural analysis is a field of engineering that deals with the behavior of structures subjected to dynamic loads (vibrations). While it is possible to accurately predict the behavior of structures under static loads, dynamic loads require parameters that are difficult to model, such as structural damping. Therefore, to accurately determine the response of structures to dynamic loads, it is necessary to conduct some form of structural analysis test, such as a modal test. Modal testing allows for the experimental determination of the modal parameters of a structure. Modal parameters include resonance frequency, damping, and mode shapes. The resonance frequency is the frequency at which the response is amplified significantly beyond the applied excitation force. When the excitation force is close to the structure's resonance frequency, it often leads to adverse effects, making it important to know the resonance frequency. Excessive vibrations caused by resonance can lead to fatigue failure, damage to delicate parts of the structure, and in extreme cases, structural collapse. For more details, please contact us.
Panasonic ReRAM-equipped MN101LR05D 8-bit microcontroller
The MN101LR05D is a low-power 8-bit single-chip microcontroller developed for portable healthcare, security devices, and sensor processing. The MN101LR05D features a CPU core with a 10MHz 8-bit AM13L, 64KB of ReRAM capacity, and 4KB of SRAM capacity. The MR101LR05D is the world's first mass-produced practical example of ReRAM (Resistive RAM), and it is expected to be widely utilized as a successor technology to existing non-volatile memory. The MN101LR05D is manufactured using a 180nm CMOS process with four layers of AI metallization. The ReRAM cell of this metal oxide is formed between stack W vias connecting metal 3 to metal 4. The results of the report are based on data from scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy-dispersive X-ray analysis (TEM-EDS), electron energy loss spectroscopy (TEM-EEKS), and spreading resistance measurement (SRP).
