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Thickness Measuring Instrument Product List and Ranking from 19 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Oct 15, 2025~Nov 11, 2025
This ranking is based on the number of page views on our site.

Thickness Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Oct 15, 2025~Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. フジワーク 製品開発事業部 Osaka//Testing, Analysis and Measurement
  2. 松尾産業 東京支店 Kanagawa//Testing, Analysis and Measurement
  3. null/null
  4. 4 エビック Tokyo//Testing, Analysis and Measurement
  5. 5 シロ産業 Osaka//Industrial Electrical Equipment

Thickness Measuring Instrument Product ranking

Last Updated: Aggregation Period:Oct 15, 2025~Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. Film Tester Thickness Measurement Device HKT *Demo Available 松尾産業 東京支店
  2. Film Tester Thickness Measurement Device HKT-Master Series フジワーク 製品開発事業部
  3. Thickness measuring device エビック
  4. MILATU Stapler-type Thickness Measuring Instrument Series フジワーク 製品開発事業部
  5. 4 Film Tester Continuous Thickness Measurement Device *Demo Available! 松尾産業 東京支店

Thickness Measuring Instrument Product List

16~30 item / All 36 items

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Film Tester Thickness Measuring Device HKT-Master 0.01AA

Elimination of variability by the measurer: Comfortable and accurate measurement of ultra-thin films with a thickness of less than 1μm!

Features of the HKT Series 〇 Low Measurement Pressure The minimum measurement pressure is 0.14N, making it difficult to damage the film and allowing for accurate measurements. 〇 Selectable Resolution You can choose a model with the necessary resolution according to your application. 〇 Excellent Measurement Reproducibility An air release that maintains a constant descent speed of the measurement head reduces damage to the film and eliminates variability caused by the operator, allowing for accurate measurements of the film. 〇 Foot-operated Air Release Using a foot-operated air release allows you to hold the measurement object with both hands for stable measurements. 〇 Optional Items Data can be transferred to a PC using dedicated software. It can also be changed to a hand pump.

  • Other inspection equipment and devices

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Film Tester Thickness Measuring Device HKT-Master0.01BB

Elimination of variability by the measurer: Comfortable and accurate measurements of ultra-thin films with a thickness of less than 1μm!!

Features of the HKT Series 〇 Low Measurement Pressure The minimum measurement pressure is 0.14N, which minimizes damage to the film and allows for accurate measurements. 〇 Selectable Resolution You can choose a model with the necessary resolution according to your application. 〇 Excellent Measurement Reproducibility An air release that maintains a constant descent speed of the measurement head reduces damage to the film and eliminates variability caused by the operator, allowing for accurate measurements of the film. 〇 Foot-operated Air Release Using a foot-operated air release allows for stable measurements while holding the object with both hands. 〇 Optional Items Data can be transferred to a PC using dedicated software. It can also be changed to a hand pump.

  • Other inspection equipment and devices

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Arnea Laboratory Co., Ltd. wafer thickness measurement device

The thickness of the silicon substrate is measured in real-time with high sensitivity and non-contact using a wavelength scanning method.

- Non-contact measurement of wafer thickness such as silicon and indium phosphide - Measurement possible in harsh environments, such as real-time measurement during wet etching - High sensitivity measurement with a precisely controlled wavelength-variable light source - High reproducibility with a measurement accuracy of less than 0.1μm - Customizable for measurement targets, sizes, and shapes other than silicon

  • Other measurement, recording and measuring instruments
  • Coating thickness gauge
  • Other optical parts

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Non-contact thickness measurement device "POA-Series"

Compact and lightweight all-in-one! A non-contact thickness measuring device that can also be customized for contact measurement.

The POA-Series is a non-contact thickness measurement device that automatically measures thickness with high precision at the nano level. It allows for the selection of sensors according to the required specifications, and the receiving platform, measurement method, and display can be freely customized to match the selected object. The sensor controller, control unit, and display unit are integrated into the measuring device, achieving compactness. 【Features】 ■ Amazingly low price ■ Of course, high precision ■ High precision non-contact ■ Space-saving without the need for a PC * For more details, please download the PDF or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Image Analysis Particle Size Distribution and Thickness Measurement Device 'D-3000'

Add thickness evaluation to size and shape! Capture particles with two cameras from directly above and from the side.

We would like to introduce our image analysis particle size distribution and thickness measurement device, the 'D-3000'. The feeder, shaped like a bowl with spiral grooves, vibrates to disperse the particles. The particles dispersed by a special disperser are transported to the imaging position on a conveyor belt, where they are captured by two cameras positioned directly above and to the side. Additionally, with the adoption of a color camera, it is possible to observe the particles in color and examine the distribution based on color parameters. 【Features】 ■ Disperses particles with a special feeder ■ Captures images with two cameras ■ Evaluates the thickness of particles ■ Observes particles in color *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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X-ray transmission thickness gauge

X-ray transmission thickness gauge

●High Precision The drive for the X-ray tube and sensor employs servo motors, ball screws, and LM guides, ensuring that the X-ray does not interfere with particles or diffuse against the measurement material. Additionally, improvements in the light sensor design have enhanced repeatability accuracy. ●Safety and Security It uses electrically controlled radiation-type soft X-rays. Simply turning off the power will stop the X-ray emission. There are no effects on the human body during normal operation. While no certified radiation handler is required, notification to the relevant labor standards inspection office is necessary. ●User-Friendly Operability The display system utilizes Windows, allowing for operability, data analysis, network construction, and a graphical interface. Furthermore, during the introduction of new product types, the automatic absorption coefficient acquisition eliminates the need for cumbersome calibration curve creation as much as possible.

  • Radiation detector

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Film Tester Continuous Thickness Measurement Device *Demo Available!

You can easily measure the thickness continuously just by setting the film cut from the manufacturing line!

The "Film Tester" has been updated! It simplifies operation and reduces measurement variability caused by human factors! Place the film cut from the line on the measurement platform, and just lower the lever to set it up. Measurement will automatically stop at the end point of the film. The measurement results are automatically saved in CSV format on your PC, allowing for editing and comparison with dedicated software. 【Features】 ■ Achieves high-precision measurement with a resolution of 0.01μm and repeatability of 0.2μm ■ Continuous measurement is easy for anyone to perform ■ Measurement probes are available according to the measurement target ■ In addition to high-end models, we also offer machines with suction tables and compact models Download the catalog here▼ https://www.matsuo-sangyo.co.jp/catalogs/ For product details, click here▼ https://www.matsuo-sangyo.co.jp/products/continuous-film/

  • Coating thickness gauge

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Film tester thickness measuring device - handheld type *Demo available!

Compact body, easy-to-hold handy series.

Handy Series The original air release ensures a constant descent speed of the measuring device. It reduces damage to the film and minimizes variability caused by the operator. 【Features】 ■ Easy to measure anywhere ■ Low measuring pressure minimizes damage to the film, allowing for accurate measurements. ■ A wide range of options available *Testing is currently available at the Shin-Yokohama demo room! Online demos are also being conducted. Please feel free to contact us. Download the catalog here▼ https://www.matsuo-sangyo.co.jp/catalogs/ For product details, click here▼ https://www.matsuo-sangyo.co.jp/products/continuous-film-handy/

  • Coating thickness gauge

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Thickness measuring device "ME-3000"

Measure the minimum display value of 0.01μm! Measure the thickness of glass, metal, film, plastic, etc.

The "ME-3000" is a contact-type ultra-high precision thickness measurement device. It measures the thickness of materials such as glass, metal, film, and plastic using two laser hologauges, making contact with the workpiece from both sides, calculating the distance, and displaying the measurement values digitally. Furthermore, it is a measurement device that can input measurement data to a computer via digital RS-232C output. 【Features】 ■ Capable of high-precision thickness measurement ■ Minimum display value: 0.01μm ■ Measurement accuracy: within ±0.05μm at ±2σ ※ Condition: Measurement error of 10 repeated measurements at a fixed point on a block gauge of 1.0mm (thickness) *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments

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Resistance and Thickness Measuring Instrument 【EC-80SCAN】

Resistance and Thickness Measuring Instrument 【EC-80SCAN】

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Wafer thickness measurement device

It is equipped with transfer functionality and thickness measurement functionality.

This is a wafer thickness measurement device equipped with transfer and thickness measurement functions. It is capable of measuring the thickness at each point within the specified wafer. It supports 6-inch and 8-inch wafers. 【Features】 ■ Equipped with transfer and thickness measurement functions ■ Supports 6-inch and 8-inch wafers ■ Capable of measuring up to 2000 points (Thickness measurement points can be set arbitrarily) ■ Equipped with real-time monitoring function for acquired data

  • Other semiconductor manufacturing equipment

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Constant Pressure Thickness Measuring Instruments FFG, FFA, FFD Series

Three types are available according to the purpose (FFG, FFA, FFD series).

The constant pressure thickness measuring instruments of the FFG, FFA, and FFD series are measuring devices that can perform inspections in accordance with JIS standards for various sheets, films, artificial leather, polyurethane foam, and more. We offer three types to suit different applications: the compact handheld type "FFG series," the stand type "FFA series," and the digital type "FFD series," allowing you to choose from a wide range of models. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments

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Continuous Thickness Measurement Device for Testing, Experimentation, and Analysis Systems

Accurate judgment by measuring thickness continuously! It can operate automatically, eliminating the need for manual measurements!

In continuous thickness measurement, by using continuous thickness data instead of point thickness of the measured object, it becomes easier to determine the pass or fail status of the object's condition. This system is designed to measure thickness continuously, with the measurement target being sandwiched from above and below by displacement sensors. Since the measurement is taken from below, it can still be measured even if there is vertical movement. Additionally, the measurement amount from the displacement sensors is output as pulses and input into a high-speed counter unit of a sequencer. 【Measurement Method】 - Since 1 pulse equals 0.1 μm, the thickness is calculated by multiplying the pulse count by 0.1. - The signals from the upper and lower displacement sensors are processed to determine the thickness. - The measured object is sandwiched by rollers and fed at a constant speed by two stepping motors before and after the displacement sensors. - The stepping motor is activated by the measurement start button on the touch panel. - When the measurement is complete, the stepping motor stops. *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices

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