COF/TAB Automatic Inspection Device
High-speed, high-resolution detection processing using the light speed image Fourier transform difference method! A cutting-edge machine employing innovative technology.
The "COF/TAB Automatic Inspection Device" enables online inspection through high-speed processing of optical speed image differential methods. It allows for simplification of the substrate tape feeding mechanism and does not require strict precision for substrate positioning in principle. Additionally, it can automatically punch and engrave good and defective products, as well as display enlarged monitoring of defects and save logs. 【Features】 ■ High-speed, high-resolution detection processing using optical speed image Fourier transform differential method ■ Inspection tailored to the manufacturing line ■ Master creation time for reference images: 10 minutes ■ Simplification of the substrate tape feeding mechanism is possible ■ Does not require strict precision for substrate positioning in principle *For more details, please refer to the PDF document or feel free to contact us.
- 企業：高度技術研究所
- 価格：Other
