We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Contact Probe.
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Contact Probe Product List and Ranking from 13 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 精研 本社 Tokyo//Electronic Components and Semiconductors
  3. UIGREEN Kanagawa//Machine elements and parts
  4. 4 日本電針 Saitama//Electronic Components and Semiconductors
  5. 5 湘南エンジニアリング Kanagawa//Industrial Electrical Equipment
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Contact Probe Product ranking

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Contact Probe Long Stroke NCP Series サンケイエンジニアリング 本社
  3. Screw-mounted contact probe CPM series サンケイエンジニアリング 本社
  4. 4 Contact Probe Short Stroke CPS Series サンケイエンジニアリング 本社
  5. 4 [Contact Probe Selection Service] We will solve the "contact failure" of contact probes. サンケイエンジニアリング 本社

Contact Probe Product List

61～68 item / All 68 items

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Contact probes for semiconductor testing, IC sockets, probe cards

Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing tailored to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ▼ Contact Probes We offer not only standard products but also flexible solutions tailored to testing conditions. ▼ Probe Cards and IC Sockets We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suited to the inspection targets at low costs. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: High frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 ▼ Contact Probes - Reduces the hassle of replacement. Durable "rare metal probes." - Revised internal structure. "New bias probes" for stable resistance value measurement. ▼ IC Sockets - Non-magnetic sockets, high heat resistance sockets. ▼ Probe Cards - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Other semiconductors
  • Contact Probe

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Custom order for contact probes

Custom order for contact probes

We will design probes according to the measurement temperature as a response to high temperatures. It is also possible to accommodate as a unit.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measuring special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Contact Probe

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Custom order for contact probes

Custom order for contact probes

We accept the design and manufacturing of custom probes.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Contact Probe

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Custom order for contact probes compatible with high current.

Custom order for contact probes compatible with high current.

Probes for 300A, 220A, 200A, 150A, and 70A are available.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special residual materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Contact Probe

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Custom order for contact probes

Custom order for contact probes

Probes made with special materials. Dimension changes for probes. Custom design and manufacturing to suit measurements are available.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Contact Probe

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【Contract Measurement Service】Probe Tip Wear Degree Confirmation Experiment

【Contract Measurement Service】Probe Tip Wear Degree Confirmation Experiment

What changes occur at the probe tip depending on the number of contacts?

"What is actually happening...?" We support quantification and visualization (image acquisition) through experiments. 【Examples of Experiments】 - Durability tests for 1 million cycles - Measurement of contact resistance values every 100,000 cycles - Verification of probe tips using an electron microscope every 50,000 cycles - Conducting durability tests with probes made of various materials - Observation of contact marks on the measured object - Measurement of contact temperatures between the measured object and the probe during continuous current of 300A and more Various measurements are possible through combinations of devices and measuring instruments. We also offer suggestions and fabrication of contact probes based on measurement results. We are always available to respond to requests for tours of experimental equipment and measuring instruments. For details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other measurement, recording and measuring instruments
  • Contract measurement
  • Other electronic parts
  • Contact Probe

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Contracted measurement service: Reproducing the environment where defects occur.

Contracted measurement service: Reproducing the environment where defects occur.

Reproducing the same conditions. You can check what is happening.

With 40 years of experience, we have been manufacturing contact probes that can achieve the desired measurements by measuring various measurement conditions and the electrical contact resistance of workpieces. We replicate conditions equivalent to those in which defects occur and convert the situation into data. Based on this data, we also propose solutions. Please utilize this for identifying causes and developing new products. Please contact us through our website first. ★http://www.sankei-engineering.com/★

  • Contract measurement
  • Contact Probe

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Sensitive Probe (IB/IF Series) *CAD data available

Sensitive Probe (IB/IF Series) *CAD data available

IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!

The "IB series" is an integrated contact probe that achieves low contact resistance, ranging from types below 10 mΩ to types below 50 mΩ, without the need for a socket. The "IF series" enables probing at narrow pitches. Utilizing a structure where tungsten wire moves within a flexible guide tube, the body can be spread out in a fan shape and fixed, allowing the tip to be arranged at a narrow pitch. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract manufacturing
  • probe
  • Contact Probe

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