We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Elemental Analysis Equipment.
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Elemental Analysis Equipment Product List and Ranking from 7 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated: Aggregation Period:Jul 22, 2026~Aug 18, 2026
This ranking is based on the number of page views on our site.

Elemental Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Jul 22, 2026~Aug 18, 2026
This ranking is based on the number of page views on our site.

  1. アイテス Shiga//Electronic Components and Semiconductors
  2. 一般財団法人材料科学技術振興財団 MST Tokyo//Testing, Analysis and Measurement
  3. FOSS JAPAN Co., Ltd. Tokyo//Testing, Analysis and Measurement
  4. 4 Kyoritsu Electric Corporation Shizuoka//Industrial Electrical Equipment
  5. 5 ジェイ・サイエンス・ラボ 本社 Kyoto//Testing, Analysis and Measurement

Elemental Analysis Equipment Product ranking

Last Updated: Aggregation Period:Jul 22, 2026~Aug 18, 2026
This ranking is based on the number of page views on our site.

  1. Examples of cross-sectional observation of wire bonding with various compositions. アイテス
  2. Elemental analysis device "Micral" FOSS JAPAN Co., Ltd.
  3. MST [Chitose Sales Office] OPEN! 一般財団法人材料科学技術振興財団 MST
  4. 4 [Analysis Case] Evaluation of Two-Dimensional Electron Gas Layer in Normally Off GaN HEMT 一般財団法人材料科学技術振興財団 MST
  5. 4 Elemental analysis device "Agilent 4210 MP-AES" Kyoritsu Electric Corporation

Elemental Analysis Equipment Product List

31~55 item / All 55 items

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[Analysis Case] Comprehensive Evaluation of Lithium-Ion Secondary Battery Materials

We will conduct an evaluation that combines various methods to solve the problem.

Lithium-ion secondary batteries have excellent characteristics among secondary batteries and are widely used as power sources for various portable devices. However, there are still various challenges remaining, such as increasing output, capacity, longevity, and reliability. Comprehensive evaluation of battery materials is possible using various analytical methods.

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  • Elemental Analysis Equipment

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How to send a sample

I have summarized how to send samples for analysis to MST.

If you have any questions, please feel free to contact us. ◆ Other Notes - Please provide instructions so that the measurement surface is clear. - Please be careful not to touch the sample surface (measurement surface). - If the sample is at risk of deterioration due to exposure to the atmosphere, please consult us separately. - For fragile samples, please ship them in a cardboard box with cushioning material.

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  • Contract Analysis
  • Elemental Analysis Equipment

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[Analysis Case] Condition Assessment of Highly Degraded Organic Materials

It is possible to accurately evaluate materials through sampling under controlled atmospheric conditions.

Organic EL has advantages such as high brightness, high-resolution color, and thinness due to its self-emission principle, and it is expected to be one of the next-generation devices. Accurate analysis and evaluation of materials are crucial for improving characteristics, extending lifespan, and enhancing reliability; however, caution is required in handling them due to the use of highly reactive materials. A comparison between samples exposed to the atmosphere and those handled under a high-purity argon atmosphere confirms that oxidation (such as molecular ions +O, +OH, etc.) observed in atmospheric exposure is suppressed when handled in a high-purity argon environment.

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  • Elemental Analysis Equipment

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[Analysis Case] Impurity Evaluation of Crystalline Si Solar Cells

Trace analysis of metallic elements and atmospheric component elements.

We propose a method for evaluating the control of impurity levels required in each process from substrate growth to cell formation of crystalline silicon solar cells, using high-sensitivity analysis for element concentration measurement. Metal elements can be measured at concentrations below ppb, and atmospheric component elements containing hydrogen can be measured at concentrations below ppm. Measurement methods: SIMS, ICP-MS, etching, disassembly Product field: Solar cells Analysis purpose: Trace concentration evaluation, product investigation For more details, please download the materials or contact us.

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  • Elemental Analysis Equipment

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[Analysis Case] Evaluation of Impurities in Metal Wires

Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.

SIMS analysis can be applied to various shapes of samples beyond wafers and substrates. In this case study, we will introduce an example of evaluating the distribution of impurities in a wire. The results of evaluating the impurity distribution in the depth direction from the side of the wire (Figure 2) indicate that the impurity profiles of H, O, F, S, and Cl vary in intensity with depth, suggesting that they are localized within the wire. The elemental mapping of the wire cross-section (Figure 3) confirmed the localization of impurities within the wire.

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  • Elemental Analysis Equipment

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[Analysis Case] Evaluation of Dopant and Carrier Concentration Distribution in Power Devices

Evaluation of activation rate is possible through composite analysis.

By comparing the impurity concentration distribution obtained from SIMS with the carrier concentration distribution from SRA, not only can we understand the activation state of the dopants, but the presence of unknown impurities and inherent structural issues are also suggested in areas that do not align. Using Profile Viewer, it is possible to overlay and analyze SIMS data and SRA data on your own. As an example, we will introduce a case where SIMS and SRA were performed on a commercially available diode chip, specifically on the central part of the surface and the outer edge (Figure 1) as well as the backside after the package was opened.

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  • Elemental Analysis Equipment

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[Analysis Case] Analysis of Microscopic Contaminants on Wafer Surface

Composition analysis of 30nm size is possible without processing.

AES analysis is a method for obtaining compositional information from the surface down to a depth of several nanometers, and it is an effective analysis for investigating the composition of contaminants and foreign substances that occur on the surface during the manufacturing process. Since it rarely detects information about the substrate or base material, it allows for a simple examination of only the abnormal areas, such as foreign substances, without preprocessing. Additionally, by conducting surface analysis, it is possible to obtain elemental distribution images. In this case study, we will present data evaluated using AES analysis regarding foreign substances present on a Si wafer.

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  • Elemental Analysis Equipment

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[Analysis Case] Evaluation of Nitrogen Components in Solution

It is possible to analyze inorganic nitrogen by form.

Nitrogen is utilized in various forms across a wide range of fields including chemistry, materials, food, and pharmaceuticals. Nitrogen compounds consist of inorganic nitrogen compounds such as nitrates, nitrites, and ammonia, as well as organic nitrogen compounds like amino acids. In the case of samples in aqueous solution, inorganic nitrogen compounds such as nitrate ions, nitrite ions, and ammonium ions can be evaluated using ion chromatography, while organic nitrogen can be assessed using HPLC or LC/MS. Total nitrogen, which includes both inorganic and organic nitrogen compounds, can be evaluated using spectrophotometry.

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  • Elemental Analysis Equipment

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[Analysis Case] Evaluation of Metal Element Concentration Near the Surface of Gallium Oxide Ga2O3 Film

High sensitivity analysis even in extremely shallow areas.

Gallium oxide (Ga2O3) has a wider bandgap than SiC and GaN, and possesses excellent physical properties, making it a material of interest for high-efficiency, low-cost power devices. Controlling the impurity concentration, which affects the characteristics, is crucial in wafer development. This document presents a case study of quantitative analysis of metal elements in the vicinity of Ga2O3 films. TOF-SIMS allows for highly sensitive evaluation even in very shallow regions.

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  • Elemental Analysis Equipment

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[Analysis Case] Analysis of Nonylphenol Ethoxylates in Fibers

Inspection of various fiber products made from different materials is possible.

Nonylphenol ethoxylate (NPnEO) is used in industrial cleaning agents, but in January 2016, a restriction on the use of NPnEO in textile products was added to the European REACH regulation (Regulation on the Registration, Evaluation, Authorization, and Restriction of Chemicals). From February 3, 2021, the sale of specific textile products containing NPnEO (at 0.01 weight% or more) will be prohibited. This document presents the measurement results of NPnEO in various textile products.

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  • Elemental Analysis Equipment

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[Analysis Case] Elemental Analysis of Wire Bonding Interface

By using a combination of processing, elemental analysis of the interface is possible.

AES analysis is a method for obtaining compositional information and elemental distribution at the very surface (to a depth of a few nanometers). By combining it with cross-sectional processing, similar information can also be obtained within layered structures and at structural interfaces. This allows for the evaluation of alloy layers, elemental diffusion, and segregation, making it effective for failure analysis and defect investigation of devices. Below, we present a case where a cross-section was prepared using IP processing to evaluate the state near the bonding interface of wire bonding, followed by assessment through AES analysis.

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  • Elemental Analysis Equipment

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[Analysis Case] Hair Component Analysis

It is possible to evaluate hair components according to the purpose.

TOF-SIMS allows for simultaneous elemental analysis and molecular information analysis of organic and inorganic substances, and it also enables imaging analysis, making it an effective method for analyzing the distribution and penetration of target components in samples. By combining measurement methods and processing for hair, it is possible to evaluate the surface, cross-section, and depth distribution of hair from various perspectives, allowing for component comparison and permeability assessment in hair according to specific objectives.

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  • Elemental Analysis Equipment

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[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification

Evaluation of microscopic atomic structures is possible through computational simulation.

β-Ga2O3 has a wide band gap and is expected to be a promising material for next-generation power devices and oxide semiconductors in terms of excellent power transmission efficiency and cost reduction. In recent years, it has been reported that β-Ga2O3 can be n-doped with Si or Sn. In this study, we conducted structural optimization calculations for models of β-Ga2O3 doped with Si or Sn and evaluated which sites each dopant is more likely to occupy in the crystal. Subsequently, we calculated the density of states from the obtained structural models and investigated the changes in electronic states due to doping.

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  • Other semiconductors
  • Elemental Analysis Equipment

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Case study of anomaly evaluation using AI and machine analysis.

We will scientifically investigate the essence of anomalies by leveraging the anomaly detection accuracy and processing power of AI.

Anomaly detection is a technique for finding data that does not match other patterns within large amounts of data. By incorporating anomaly detection into product development and manufacturing, labor-saving in quality control and other areas is expected. Furthermore, by conducting equipment analysis, the essence of anomalies can be scientifically investigated.

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  • Other image-related equipment
  • Elemental Analysis Equipment

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MST [Chitose Sales Office] OPEN!

We aim to further improve our services for customers in the Hokkaido area, based at the Chitose Sales Office.

We will open the Chitose Sales Office, the first in the Hokkaido area as MST. Based in the Chitose Sales Office, we aim to further improve our services for customers in the Hokkaido area. We will also achieve satisfactory quality and delivery times through close collaboration with our Tokyo headquarters (lab). Please look forward to it! Opening date: Thursday, April 11, 2024 Address: Room 160, Chitose Arcadia Plaza, 1-3-1 Kashiwadai Minami, Chitose City, Hokkaido *Please send samples to the headquarters located in Setagaya, Tokyo. Headquarters address: 1-18-6 Kitami, Setagaya, Tokyo Phone number: 090-4001-1578 (Contact: Yanagimachi)

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  • Elemental Analysis Equipment

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[Analysis Case] Impurity Analysis of FeCoNi Alloy

It is possible to simultaneously analyze 77 elements using GDMS.

When impurities are mixed into metallic materials, depending on the combination of elements, it can affect the reduction of toughness and corrosion resistance. Therefore, it is important to understand the amount of impurities in metallic materials for quality control. GDMS can simultaneously analyze 77 elements without standard samples, making it effective for impurity analysis of samples with unknown contained elements, regardless of the matrix. This document presents a case study of impurity analysis of FeCoNi alloys using GDMS. Measurement method: GDMS Product field: Manufacturing equipment and parts Analysis purpose: Trace concentration evaluation For more details, please download the document or contact us.

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  • Elemental Analysis Equipment

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[Analysis Case] Comprehensive Evaluation of Positive Electrode Active Materials in Secondary Batteries

Proposing an evaluation that combines structure, composition, and electricity to solve development issues.

This article introduces a case study evaluating the surface morphology, cross-sectional structure, components, composition, crystal structure, and resistance value distribution of Li(NiCoMn)O2 (NCM), which is used as a positive electrode in lithium-ion secondary batteries. Based on a comprehensive evaluation of structure, composition, and electrical properties, MST proposes assessments suitable for solving development challenges aimed at improving characteristics and enhancing reliability.

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[Analysis Case] Precursor Adsorption Simulation in ALD Film Formation

Information on the activation energy and reaction heat during precursor adsorption on the substrate can be obtained!

Our organization is conducting simulations of precursor adsorption in ALD film deposition using first-principles calculations. ALD (Atomic Layer Deposition) is a film deposition technology that utilizes continuous chemical reactions in the gas phase. It is widely used in the semiconductor field, where fine processing is required, due to its ability to precisely control film thickness, operate at low temperatures, and provide good step coverage. In general, to understand the differences in film deposition rates between different substrates in the slow deposition process of ALD, it is necessary to elucidate the precursor adsorption mechanisms on the substrate. [Measurement Methods and Processing Techniques] ■ Computational Science, AI, Data Analysis *For more details, please download the PDF or feel free to contact us.

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Elemental analysis device "Agilent 4210 MP-AES"

Using magnetic excitation microwave plasma! Costs are reduced by the nitrogen generator.

The "Agilent 4210 MP-AES" is an elemental analysis device that uses nitrogen from the air instead of flammable gases for measurements. It has high sensitivity with detection limits down to the ppb level and is faster than conventional flame atomic absorption (AA) for general multi-element analysis. It is suitable for industries such as mining, food, and agriculture, as well as applications like remote analysis and environmental monitoring. 【Features】 ■ Minimal ownership costs ■ No need for flammable or oxidizing gases ■ Once the method is set, anyone can reliably and quickly perform measurements ■ Supports a wide range of analyses ■ Automation software allows for remote control of the equipment *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices
  • Elemental Analysis Equipment

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Elemental analysis device "Micral"

Significantly reduce analysis costs! It is possible to continuously analyze up to 60 samples.

"Micral" is an elemental analysis device that allows anyone to perform precise quantitative analysis of six macroelements and six microelements. Since it can conduct analysis without using reagents, it enables environmentally friendly analysis, improves the number of processed samples, and achieves low-cost analysis while significantly reducing the work required for analysis without compromising laboratory safety. Additionally, it can increase sample processing capacity while reducing the burden on training and staff. 【Features】 ■ Rapid simultaneous measurement of 12 elements ■ Low-cost analysis ■ No special training required ■ No need for decomposition treatment using hazardous chemicals like strong acids ■ Minimal sample preparation only *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment and Devices
  • Elemental Analysis Equipment

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Changing the common knowledge of elemental analysis" New generation elemental analysis device "Micral

Changing the Common Knowledge of Elemental Analysis" Invitation to the Preview of the Next Generation Elemental Analysis Device "Micral

We are pleased to announce that our company will hold a preview event for our newly released device, "Micral," which overturns the conventional wisdom of elemental analysis. Micral is equipped with the latest LIBS technology (Laser-Induced Breakdown Spectroscopy) and represents a next-generation solution that achieves both "significant simplification of sample preparation" and "overwhelming analysis speed."

  • Testing Equipment and Devices
  • Elemental Analysis Equipment

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Material and trace element analysis

Implement appropriate processing according to the purpose of the analysis and the condition of the sample! We will promptly report accurate analysis results.

We offer a wide range of analyses, from the main component analysis and trace analysis of impurities in various products such as chemical products, organic solvents, and ceramics. Additionally, we conduct analyses according to customer requests, including official methods and industry standards. For the main pretreatment, we analyze using various physical and chemical methods. In cases where samples are difficult to decompose, we combine these methods to perform appropriate treatments and provide accurate analysis results. We also conduct elemental analysis of various elements in steel products and non-ferrous metals. Please feel free to contact us when needed. 【Features】 ■ Physical methods - Cutting, crushing, freeze grinding, filtration, drying, concentration ■ Chemical methods - Acid decomposition (open system, closed system), microwave decomposition, alkaline fusion method, dry ashing, tubular furnace combustion, extraction, co-precipitation *For more details, please refer to the related links or feel free to contact us.

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TruMac nitrogen protein analysis in soil and plant tissue

This is a special report on the analysis of nitrogen proteins in soil and plant tissues.

At LECO Japan, we will pick up samples that are expected to enhance the precision, efficiency, and safety of your analysis operations using LECO's analytical instruments, and we will present them as a special report. Please take a look. If you would like to know whether similar samples can be applied, please feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Elemental Analysis Equipment

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TruMac nitrogen protein analysis in bacon, ham, and turkey

This is a special report on the analysis of nitrogen proteins in bacon, ham, and turkey.

At LECO Japan, we will pick up samples that are expected to enhance the precision, efficiency, and safety of your analysis operations using LECO's analytical instruments, and we will present them as a special report. Please take a look. If you would like to know whether similar samples can be applied, please feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Elemental Analysis Equipment

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Analysis of milling samples with oxygen of different grades using TruMacN

This is a special report on the analysis of milling samples using oxygen of different grades.

At LECO Japan, we will pick up samples that are expected to enhance the precision, efficiency, and safety of your analysis operations using LECO's analytical instruments and present them as a special report. Please take a look. If you would like to know whether similar samples can be applied, please feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Elemental Analysis Equipment

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