3D Profilometer Technical Documentation: Measurement of Transparent Films on Transparent Substrates
This is a PDF document on 'Measurement of Transparent Films on Transparent Substrates.' Please download it for details.
If both the "thickness" and "surface roughness" of a transparent thin film material coated on a transparent substrate can be measured with a single device, it would be very convenient for both development and quality control. It is clear that this is difficult because conventional stylus-based contact surface profilometers find it challenging to accurately measure soft films. On the other hand, other optical technologies also struggle to measure transparent thin films on transparent substrates. While there are other devices that can measure the thickness of this thin film, they do not have the capability to measure roughness.
- Company:アイ・ティー・エス・ジャパン
- Price:Other