ＩＭＶ Product Lineup

The migration tester "Van-EE (MIG-87)" is compact and lightweight, allowing you to start tests anytime and anywhere without needing to choose a specific installation location. Confirming migration occurrence is easy, and setting test conditions, controlling, and displaying data can be easily operated from a connected computer via LAN cable. For more details, please download the catalog.

The migration tester "MIG-8600B" uses a 1CH→1 power supply method from the MIG series, providing stable voltage individually, with no influence between channels during normal operation as well as during migration events. It is equipped with insulation resistance measurement for each channel, allowing for high-precision continuous measurement.

The migration tester "MIG-87C" has become capable of measuring stable data with high precision. The MIG series features individual power supplies and measurement circuits for all channels. Each channel is equipped with a current limiting circuit, so no protective resistors are needed. For more details, please download the catalog.

The pulse application unit "PMU-100" is an option for the migration tester (MIG) and enables DC insulation measurement when the MIG is in constant time measurement. Between constant time measurements, it allows for pulse (AC) drive. Four modes of pulse waveform can be selected.

The Ion Migration Tester "MIG-88" not only measures traditional insulation resistance (Rx) but also measures the dielectric loss tangent (tanδ) of the sample, enabling the identification of insulation degradation trends during testing that could not be discerned with traditional Rx measurements alone. It is a high-performance tester that proposes a new evaluation method for migration tests, unlike anything seen before.

The high-side migration tester "MIG-9000" is equipped with open Kelvin detection, which is fundamental for high-side measurements, on both the high-side and return-side across all channels as standard. It uses a memory card for storing measurement data. With a compact display, it can show operational status and abnormal conditions even without a host PC.

The communication reliability tester "JET-80" achieves high-speed and high-precision "multi-channel (up to 320 channels simultaneous measurement)" through the collaboration of a "lock-in amplifier" that picks up weak signals buried in noise, the "four-terminal measurement method" that eliminates the influence of contact resistance, and a "semiconductor scanner" that removes movable parts (such as mechanical relays) that can cause failures. For more details, please download the catalog.

The dedicated constant temperature and humidity chamber for migration testing, "THC-64/120," eliminates the occurrence of "mechanical vibrations," which are said to adversely affect migration tests, by removing the compressor-type refrigeration unit. Furthermore, it does not require "compressors" or "special refrigerants," which have been one of the major causes of failures in conventional chambers, thus avoiding troublesome maintenance.