東京電子交易 List of Products and Services

The model 1100-LUP is a latch-up testing machine that combines a dedicated test head and power supply, allowing for the cost-effective construction of systems tailored to customer needs. Additionally, the control software on the PC can automatically execute the latch-up test from start to result collection.

• Testing Equipment and Devices

Since 1964, BIRTH Electronics has been a specialized manufacturer of high-speed, high-voltage pulse products, providing reliable coaxial products daily across various fields. Thanks to this, our products are now used as a standard by researchers around the world.

• Time-frequency measurements

EM Predix Co., Ltd. has proposed measurement and countermeasure technologies for plasma damage and electrostatic discharge across various industries over the past 14 years (and has accumulated relevant experience prior to that). This document introduces the Plasma Continuous Monitoring System FS1000, which detects electromagnetic waves emitted from abnormal discharges occurring within the plasma chamber that are completed in nanoseconds (ns). 【Features】 - Detects discharges at all positions within the chamber - Detects transient electromagnetic waves emitted by discharges - Detects, predicts, and controls abnormal discharges For more details, please contact us or download the catalog.

• Power Monitoring Equipment

The Model 1200 series is a testing device that enables ESD/CDM/LATCH-UP testing with a single unit, ensuring stable and efficient testing through a maximum of 256 programmable pin combinations. Its greatest feature is the spacious work area, which allows for ESD/CDM application on complex-shaped semiconductor devices, surface-mounted components, and module products. Additionally, by creating DUT boards tailored to specific applications, it can be used for a wide range of product evaluations, from LED components to multi-pin devices. 【Features】 ○ Capable of conducting over four types of reliability evaluation tests, including HBM, MM, CDM, and latch-up testing with a single unit. For more details, please contact us or download the catalog.

• Testing Equipment and Devices

The Model 400SW is a highly user-friendly new type of ESD tester that automatically determines destruction and degradation after applying HBM and MM ESD pulses to samples of various shapes. Its greatest feature is that ESD testing can be performed easily and quickly by anyone at any time. Conventional ESD testers required chips to be encapsulated in packages, and IC sockets to be designed and manufactured before ESD evaluation could take place. This device can conduct ESD tests not only on chips and packages but also on wafers, significantly reducing both time and financial burdens. 【Features】 - Comprehensive ESD tolerance evaluation from wafers to packages - Maintenance of high-reliability processes through periodic evaluation of wafers For more details, please contact us or download the catalog.

• Testing Equipment and Devices

The CDM test device is a testing apparatus that measures the reliability of electronic components in cases where the metal electrode parts of charged electronic components come into contact with external metals, or when the metal in contact with a charged object (such as the human body) touches the metal electrodes of the electronic components, resulting in stress caused by extremely rapid charge movement. For more details, please contact us or download the catalog.

• Testing Equipment and Devices

ESD/LATCH-UP Tester "Model 7000X Series" determines the ESD model using an ESD pulse generation unit mounted on a single-axis robot. Therefore, updates to the new waveform standards, which occur every few years, can be accommodated solely by changing the ESD pulse generation unit, allowing for long-term use. Additionally, it is easy to revert from the latest standard compliance to older standards for testing. Currently, if standards such as the transient latch-up standard, which are under discussion, are established, they can be addressed quickly. [Features] [LATCH-UP Section] ○ Complies with latch-up standards such as JEITA and JEDEC ○ Latest standards for latch-up testing, with standard input pin conditions max HI/min LO ○ Clock/pattern generator ○ Device stabilization function For more details, please contact us or download the catalog.

• Testing Equipment and Devices

The Model 7000B is the latest model developed as a successor to the conventional Model 7000. It features high expandability with a maximum system of 1024 pins and the convenience of being able to utilize the evaluation board (DUT) from the Model 7000. Additionally, changes to the relay matrix structure allow for a maximum of 6 power supplies for latch-up testing, and the pattern supply necessary for device stabilization and dynamic latch-up testing can be programmatically selected, significantly improving usability. [Features] [LATCH-UP Section] - The number of latch-up detection power supplies is up to 6. - Standard features include Max-Hi Min-Low 3 power supplies and clock/pattern functionality. - Additional external power supply (optional). - High-temperature latch-up testing at 155°C (optional). For more details, please contact us or download the catalog.

• Testing Equipment and Devices

A testing machine that can check in advance where malfunctions may occur in your company's electronic devices and systems. Demo units are available for loan, and on-site testing is possible! Please feel free to contact us. ■Points When induced ESD* occurs inside electronic devices, it radiates wideband electromagnetic waves that can trigger malfunctions. We utilize this principle to identify the malfunctioning areas. *Induced ESD: This occurs when changing static electricity causes electrostatic induction, and the resulting potential difference is applied to a narrow gap (approximately 0.1mm or less) between conductors, leading to ultra-fast electrostatic discharge. *Please note that product specifications may change without prior notice. Thank you for your understanding. ◆For more details, please contact us or refer to the catalog◆

• Other inspection equipment and devices

The Ecdm series is a low-cost, manually operated benchtop ESD simulator. By exchanging external connection probes/adapters, it can simulate all types of ESD, including Human Body Model (HBM), Machine Model (MM), Charged Device Model (CDM), and Charged Package Model (CPM, referred to as FI-CDM in foreign countries). *Please note that product specifications are subject to change without notice. Thank you for your understanding.*

• Testing Equipment and Devices

The EV-10A is a device that detects ESD (electrostatic discharge) and DCI (induced charging) and collects data to a computer. The number of electronic components sensitive to ESD continues to increase rapidly. In manufacturing or embedded lines for these electronic components, if static electricity is not carefully controlled, it can worsen yield rates. When the EV-10A is connected to a computer, it can continuously monitor the received ESD and DCI, recording the occurrence time and reception level. By comparing the recorded results with the occurrence of defects on the manufacturing line, it is possible to investigate whether static electricity countermeasures are necessary. Additionally, it allows for the evaluation of the line after implementing countermeasures. *Please note that product specifications may change without notice. Thank you for your understanding.*

• Testing Equipment and Devices

When a high electric field is applied to an IC at high temperatures, there may be instances of non-compliance with the IC's catalog specifications (for example, Icc, input leakage, AC parameters, functional characteristics). This phenomenon is referred to as electric-thermal-induced parasitic gate leakage (GL). Devices that exhibit GL are considered "defective," but GL defects typically recover after baking at 125°C for 4 hours (or 150°C for 2 hours). This device generates an electric field at high temperatures and conducts GL tests in accordance with AEC-Q100-006 REV-C. There are manual test model 6900M and automatic test model 6900A available. *Please note that product specifications are subject to change without notice. Thank you for your understanding.*

• Testing Equipment and Devices

This device is a high-voltage electro-migration testing apparatus for conducting migration tests of insulating films within a high-temperature chamber. The interior of the unit is divided into four blocks, allowing for resistance evaluation at different voltages and times for each block. It can operate at a maximum high voltage of 2KV, significantly reducing the evaluation time. *Please note that product specifications may change without prior notice. Thank you for your understanding.*

• Testing Equipment and Devices

The Model 6300A is a semiconductor device running test equipment that records the electrical characteristics of FETs and transistors for extended periods under burn-in test conditions. The detection resistance can be replaced according to the characteristics of the FETs and transistors. *Product specifications are subject to change without notice. Thank you for your understanding.*

• Testing Equipment and Devices

The ISC-2000A series is a low-cost multi-pin checker that tests contacts such as IC sockets, connectors, and cables at high speed. By adopting logic circuits instead of relay scanners and resistance meters, and controlling it with a computer, we have achieved an inexpensive and fast checker. It has excellent pin count expandability, allowing configurations of over 2000 pins. It is ideal not only for IC sockets but also for connections and non-contact checks of backplanes, cables, and PC boards. *Please note that product specifications may change without notice. Thank you for your understanding.*

• Testing Equipment and Devices

There are two types of electrostatic discharge tests: HBM (Human Body Model) tests and CDM (Charge Device Model) tests. HBM tests simulate the effects of static electricity generated by the human body and evaluate how much static electricity the device can withstand. On the other hand, CDM tests assess the impact when the device itself, in a charged state, comes into contact with other objects. *Please note that product specifications may change without prior notice. Thank you for your understanding.*

• Testing Equipment and Devices
• EMC Testing

Troubles caused by electrostatic discharge (ESD) frequently occur in environments handling cutting-edge electronic components and devices. Typical examples include degradation and destruction during the assembly process of electronic components, as well as malfunctions of computers, electronic calculators, and electronic devices. The majority of unexplained freezes in computers are caused by ESD. The main culprits that trigger ESD are people who move freely, and products such as clothing, shoes, flooring, and wristbands are used to suppress the generation of static electricity. The chair introduced here also holds an important position among these products. *Please note that product specifications may change without prior notice. Thank you for your understanding.*

• Anti-static products