Testing, Analysis and Measurement

プレシテック・ジャパン

addressTokyo/Shinagawa/6th Floor, Sumitomo Life Gotanda Building, 5-1-11 Osaki
phone03-6420-3955
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プレシテック・ジャパン List of Catalogs

1～45 item / All 69 items

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Data Sheet Color Aberration Confocal Sensor Version 20250522

Product catalog

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Data Sheet Spectral Interference Sensor Version 20250423

Product catalog

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Doppler wafer measurement - High-speed and high-precision measurement using a non-contact optical sensor.

Application note

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30kW Variable Spot Diameter Laser Cutting Head "Prime"

Product catalog

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Data Sheet: High-Speed Full Wafer Measurement System for 12" Wafers

Specification document

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White Paper: Non-contact Thickness Measurement of Plasma Spray Coatings

Application note

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Introduction to Products and Applications of Color Aberration Confocal 3D Line Sensors

Application note

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Distance/Shape Measurement - Presitech Chromatic Aberration Confocal Sensor

Product catalog

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Non-contact optical sensor vial measurement - Glass application documentation

Application note

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YW52 + CANUNDA HP Beam Shaping

Product catalog

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Battery-oriented laser drying monitoring sensor - Enovsaense

Application note

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LWM4.0 Welding Monitoring Device Practical Case Study

Technical data・examples

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High-power light source equipped CHRocodile 2S HP - Thickness measurement/Shape measurement

Application note

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2024 Battery Japan Autumn Materials_Exhibited Product Information

Application note

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Easy-to-use wire meat deposition head "CoaxPrinter"

Product catalog

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Presitech CHRocodile Sensor Lineup Spectral Interference Thickness Measurement

Product catalog

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Welding Internal Defect Measurement Sensor Enovasense Field Sensor

Application note

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Laser photo-thermal thickness measurement and internal defect inspection Enovasense field sensor

Product catalog

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New Product - CHRocodile 2 SX Optical Wide-Range Thickness Measurement Sensor

Product catalog

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White Paper - Thickness Management of Laser-Cladded Layers for Automotive Brake Discs

Application note

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All-purpose laser cutting head "Thunder"

Product catalog

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Low-cost laser cutting head "MiniCutter"

Product catalog

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White Paper: Thickness Measurement of High Concentration Doped Wafer

Other documents

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Elias Scanner Flying Spot Scanner 310

Product catalog

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Data Sheet - Thickness Measurement Sensor CHRocodile 2LR ver2

Specification document

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Intelligent "ScanMaster" that enables ultra-fast shape recognition and optimization of processing conditions.

Product catalog

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LWM4.0 Digital Welding Monitoring Device

Product catalog

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LWM Laser Welding Monitoring Device

Product catalog

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Case studies, applications, and measurement overview materials for Enovasense's laser photo-thermal sensors.

Technical data・examples

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Battery foil thickness measurement solution application document

Technical data・examples

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Prestech's lineup of non-contact thickness measurement sensors

General catalog

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Enovasense's laser heating thickness measurement sensor

Product catalog

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No scanning stage required. High-speed thickness/distance measurement sensor (area scanner) with a maximum measurement range of 12 inches.

Product catalog

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Semiconductor Packaging Bond Line Thickness (BLT) Measurement White Paper

Technical data・examples

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Introduction to Battery Cells and Manufacturing Applications

Technical data・examples

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Solutions for Semiconductor Pretech Products_20220628

Technical data・examples

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Surface roughness measurement - Comparison report with contact measurement results - CHRocodile CHRocodile color aberration confocal sensor

Other documents

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Case Study Collection: Thickness Measurement and 3D Shape Measurement of Semiconductor Wafers Using Non-Contact Sensors

Technical data・examples

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Collection of Measurement Examples: Application of Non-contact Sensors in Semiconductors - Thickness Measurement - Flatness Management

Technical data・examples

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Introduction to the application of the non-contact 3D shape measurement line sensor CLS - A non-contact, high-speed optical sensor.

Product catalog

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Thickness measurement application

Technical data・examples

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Prestech Sensor - Usage Examples for Batteries

Technical data・examples

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Compact Single-Point Sensor "CHRocodile Mini"

Product catalog

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Quality Assurance through Pre-Technology Sensors in the Manufacturing Process

Product catalog

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Proposal for Non-Contact Wafer Thickness Measurement Sensor During In-Process for Semiconductors

Other documents

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