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  1. Home
  2. Testing, Analysis and Measurement
  3. プレシテック・ジャパン
Testing, Analysis and Measurement
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プレシテック・ジャパン

addressTokyo/Shinagawa/6th Floor, Sumitomo Life Gotanda Building, 5-1-11 Osaki
phone03-6420-3955
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last updated:Aug 28, 2023
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  • Company information
  • Products/Services(54)
  • catalog(72)
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プレシテック・ジャパン Company Profile

We provide intelligent and reliable solutions for laser material processing and optical measurement technology.

Presitech is a specialist in laser material processing and optical measurement technology. We are not just a supplier of systems and components, but a professional partner in ensuring a smooth processing process for our customers. We offer consultations from the foundational stage and accurately consult with customers on their requests and objectives. We understand that the key to success in unique processing processes lies in the four components of exhibition, monitoring, processing, and control. Only by doing so can we provide appropriate solutions for our customers' applications. Our high-quality products, such as laser processing heads, quality monitoring systems, and optical measurement systems for spacing/thickness measurement, allow customers to directly benefit from our decades of experience. Our optical sensors are characterized by the highest precision and dynamic adaptability. Furthermore, they detect accurate values even in high-speed measurements.

Business Activities

■Laser Processing Related - Processing Head - Welding Head - Process Monitor ■Optical Sensors <Distance, Shape, Thickness Measurement> - Chromatic Aberration Confocal CHRocodile Series - Single Point 2S/2SE: High Precision 2HS: High Power - Dual Point 2DPS - Economical Single Point C: Integrated with Probe Mini: Separate from Probe - Line Sensor CLS: Low Crosstalk Noise CLS2.0: Long Line Length, Wide Measurement Range CLS2 PRO: Long Line Length, High Angle Tolerance - Spectral Interference CHRocodile Series - Single Point 2IT: High Precision 2DW: Compatible with Doped Wafers 2RW: Compatible with Rough Wafers 2SX: Wide Measurement Range for Processing Monitoring - Area Scanner for Spectral Interference Sensors Flying Spot Scanner: Φ40–310mm *Combined with CHRocodile Series <Thickness Measurement> Laser Photo-Thermal Sensor Enovasense Sensor: Non-contact Measurement of Opaque Objects

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Products/Services (54)

High-performance sensor for laser welding monitoring LWM8.5 product image
High-performance sensor for laser welding monitoring LWM8.5
CutBOX Pro Maintaining Cutting Quality Imitation & Head Control Device product image
CutBOX Pro Maintaining Cutting Quality Imitation & Head Control Device
30kW compatible variable optical magnification laser cutting head product image
30kW compatible variable optical magnification laser cutting head
SEMI-compliant 12-inch wafer thickness and shape measurement system product image
SEMI-compliant 12-inch wafer thickness and shape measurement system

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catalog(72)

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Artificial intelligence (machine learning) improves the quality inspection of laser welding. LWM-AI

Artificial intelligence (machine learning) improves the quality inspection of laser welding. LWM-AI

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LWM 8.5 Sensor

LWM 8.5 Sensor

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High-speed, high-precision 3D Line Sensor CLS2 Series

High-speed, high-precision 3D Line Sensor CLS2 Series

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Data Sheet Color Aberration Confocal Sensor Version 20250522

Data Sheet Color Aberration Confocal Sensor Version 20250522

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news(7)

Nepcon Japan 2026

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We will be exhibiting at Nepcon Japan 2026, which will be held at Tokyo Big Sight from January 21 (Wed) to January 23 (Fri), 2026. If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Chromatic aberration confocal optical line sensor CLS2 3. Non-contact thickness measurement sensor for opaque materials Enovasnese

Nov 25, 2025

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The 1st Kyushu Semiconductor Industry Exhibition

  • SEMINAR_EVENT

We will be exhibiting at the Kyushu Semiconductor Industry Exhibition held at Marine Messe Fukuoka on September 25 (Wednesday) and September 26 (Thursday), 2024. If you are interested, please come to the venue. ■ Products to be exhibited - Spectral interference optical thickness sensor CHRocodile 2 DW/2IT - Chromatic aberration confocal optical line sensor CLS2.0 - Chromatic aberration confocal optical single-point sensor CHRocodile 2S, C, Mini *This time, there will be no actual display of the FSS for 12" wafer thickness mapping measurement, but if you need an explanation or would like to request a demo, please come to our booth.

Aug 08, 2025

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Semicon Japan 2024

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We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor

Aug 08, 2025

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Detailed information

Company name プレシテック・ジャパン
Contact addresspostalcode 141-0032 Tokyo/ Shinagawa/ 6th Floor, Sumitomo Life Gotanda Building, 5-1-11 OsakiView on map TEL:03-6420-3955 FAX:03-6420-3977
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Industry Testing, Analysis and Measurement
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