東レリサーチセンター List of News Articles

When conducting structural analysis of organic compounds, IR, NMR, and MS can be considered the three sacred treasures. If the analysis is performed correctly, it is possible to elucidate the structure of even quite complex compounds. However, actual spectra are often not of a single compound, as seen in textbooks, which can lead to significant challenges in interpreting results for beginners in analysis. Additionally, while database searches are a useful tool in structural analysis, the ability to read spectra is necessary to select the correct structure from among the candidates, not just pattern matching. In this course, we will lecture on the basic ways to interpret IR, NMR, and MS spectra, including simple explanations of principles, points to be aware of during analysis, and how to proceed with actual analysis, incorporating some exercises as well.

To create high-performance semiconductor devices, it is necessary to understand and control the electrical properties and physical characteristics of each material used in device formation. This is because, even as the miniaturization and complexity of semiconductor devices progress to their limits, the need to maximize the inherent properties of the materials remains unchanged. This course is structured in two parts: the first half introduces the mercury probe, which is useful for evaluating the fundamental electrical characteristics of insulating films and semiconductors used in semiconductor devices, such as capacitance-voltage (C-V) characteristics and current-voltage (I-V) characteristics, and demonstrates the relationship between film quality and the electrical properties of semiconductor materials in combination with various physical analyses. The second half presents Deep Level Transient Spectroscopy (DLTS), a method for electrically detecting defects that affect the characteristics of semiconductor devices, highlighting its usefulness based on case studies evaluating defects at the semiconductor and insulating film/semiconductor interface.

To determine the structure of organic compounds, knowing the molecular weight of the compound is extremely important, and mass spectrometry is an indispensable method for structural analysis of organic compounds, alongside IR and NMR. However, to perform mass spectrometry, the compound must be ionized, and it is necessary to choose the appropriate ionization method based on the properties and molecular weight of the compound. In this course, we will explain the principles of mass spectrometry, the configuration of the equipment, and various ionization methods, including how to select ionization methods and points to consider when analyzing industrial materials. Furthermore, we will also conduct basic exercises on the analysis of mass spectra.

Gas chromatography (GC) is a representative method for analyzing volatile organic compounds, and it will continue to play an active role in various fields such as industry, environment, and pharmaceuticals, both now and in the future. Recent advancements in electronics technology have significantly improved the precision and sensitivity of GC/MS (gas chromatography-mass spectrometry) compared to the past, and its operation has become easier. As a result, even those with little experience can use it easily, allowing for rapid and straightforward identification of compounds through mass spectra and quantification from peak areas. On the other hand, many people can use the equipment but lack detailed knowledge of the principles and mechanisms of the devices, which sometimes prevents them from fully utilizing the performance of GC in the development of new analytical methods, including sample preparation. This course aims to provide the foundational knowledge necessary to understand GC more deeply and use it correctly. It will not only explain the basic principles, specialized terminology, and the structure and function of the equipment but also clearly describe sample preparation techniques such as extraction and derivatization, the procedures for setting up analytical methods utilizing these techniques, and troubleshooting.

Inorganic element analysis is required in various situations, including understanding the composition of industrial materials and products, the content of impurity elements, troubleshooting in manufacturing processes, and investigating factory wastewater and market products, covering research and development, production, and quality assurance. The main methods for inorganic element analysis include Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES), Inductively Coupled Plasma Mass Spectrometry (ICP-MS), and Atomic Absorption Spectroscopy (AAS). ICP-OES, ICP-MS, and AAS require the samples to be in solution form for analysis, and sometimes complex chemical pretreatment that requires skill is necessary. This course will provide a basic explanation of the principles, characteristics, measurement procedures, precautions during measurement, and how to interpret spectra for each analytical method. Additionally, it will introduce basic pretreatment methods and processing environments needed to obtain the required solutions for measurement, as well as points to be cautious about during the work. Finally, recent application examples related to ICP-MS will be presented.

RBS (Rutherford Backscattering Spectrometry) is a method for analyzing the composition of thin films on solid surfaces, characterized by its non-destructive nature and the absence of a need for standard samples for quantitative analysis. In this course, we will clearly explain the analytical method, points of caution, and more. Furthermore, we will also introduce related techniques that use high-energy ions, such as hydrogen analysis (HFS) and nuclear reaction analysis (NRA), including their applications. By delving into the measurement principles and analysis methods, we aim to provide a unified understanding of the content and help participants acquire practical knowledge for on-site application. SIMS (Secondary Ion Mass Spectrometry) is the most sensitive method among surface analysis techniques and is optimal for depth profiling of impurities in various solid materials, including semiconductors. It has a long history of use in both industrial and research applications. However, the quality of the data can vary significantly based on the measurement conditions, making it a technique that requires expertise. In this course, we will explain the fundamental aspects of Dynamic-SIMS, including its principles, characteristics, effectiveness, and the workings of the equipment, as well as specific methods for obtaining high-quality data, such as addressing sensitivity changes, optimizing depth resolution, and reducing background (residual components within the equipment).

Infrared spectroscopy is an analytical method that utilizes the absorption of specific wavelengths by a substance when it is irradiated with infrared light, allowing for the acquisition of information about chemical bonds such as functional groups. It is widely used as a composition analysis technique for organic compounds and polymers. With various measurement modes, such as the ATR method, it can be adapted to evaluate samples of various forms, including inorganic substances, gases, and liquids, by selecting the appropriate mode based on the sample type and purpose. This course will explain the principles and measurement modes of infrared spectroscopy for those who will be using it in the future and will introduce case studies of analyses using infrared spectroscopy. Raman spectroscopy is a technique that detects the scattered light generated when a substance is irradiated with light and analyzes the vibrational modes of molecules or crystals. In addition to obtaining similar chemical bond information as infrared spectroscopy, it is also used to analyze structures that contribute to material properties, such as orientation, crystallinity, and stress. While it has a wide range of applications, understanding the method and materials, as well as making appropriate adjustments during analysis, is necessary for effective utilization. This course will explain the basic concepts of Raman spectroscopy and key points of analysis. It will also touch on comparisons with infrared spectroscopy and considerations for method selection, while introducing case studies that leverage the strengths of Raman spectroscopy.

A collaborative research group led by Professor Kazunori Ikebukuro and Professor Yasumoto Nakazawa from the Graduate School of Engineering at Tokyo University of Agriculture and Technology, along with Naoya Iwano from Toray Research Center, Yasushi Ohyama from Japan Spectroscopic Co., Ltd., and Professor Hiroshi Hayashida from the University of North Carolina at Chapel Hill, has revealed for the first time that guanine-rich DNA, known to be involved in various biological functions, can specifically bind to proteins without forming guanine quadruplex structures (G4 structures). In particular, the study focused on the guanine-rich insulin aptamer "IGA3" and analyzed in detail how it interacts with insulin. Previously, IGA3 was thought to bind to insulin by forming a G4 structure; however, this research discovered that it does not bind in the G4 structure but instead forms a new structure to bind to insulin. For more details, please check the related links below.

On Friday, June 27, 2025, Toray Research Center, Inc. will hold a "Semiconductor and Electronic Materials Poster Session" at Kyoto Terrsa, near Kyoto Station. This event is designed to introduce the latest analytical technologies related to semiconductors and electronic materials to customers from semiconductor device, equipment, and material manufacturers. We will display 51 posters focusing on the latest case studies of analytical technologies. Participants will have the opportunity to engage directly with our researchers and gain a deeper understanding of the details and applications of the technologies. Participation is free of charge, and we sincerely hope many of you will join us. *We kindly ask that representatives from competing companies refrain from participating. Thank you for your understanding. ◆Registration: Please check the "Details and Registration" below.

This time, at the request of the Japan Isotope Association's newsletter "Isotope News," I contributed an article on "Analysis of the Fine Structure of Living Cells Using Small-Angle Scattering." Contribution: Fine Structure Sensing of Living Cells Using Small-Angle X-ray Scattering Author: Katsu Nakata, Toray Research Center, Inc. Kazuaki Matsumura, Japan Advanced Institute of Science and Technology Magazine Title: Isotope News "TRACER," April 2025, No. 798, pp. 22–25 https://www.jrias.or.jp/books/cat3/list.html In this issue, we introduce examples of evaluations using small-angle X-ray scattering as a method to measure the nanoscale intracellular fine structure of living cells under various extracellular environments.

Our company (hereinafter referred to as "TRC") has established the "Integrated Bioanalysis Research Department" as of April 1st, by integrating departments responsible for structural analysis, characterization analysis, stability testing, and quality testing, in order to strengthen support for the research and development of diverse biopharmaceuticals represented by antibody drugs, nucleic acid/mRNA drugs, and cell therapies. Traditionally, TRC has provided analytical support at various stages of drug development, including structural analysis and analytical method development to support drug discovery research, pharmacokinetic analysis under GLP conditions, and stability testing under GMP conditions. However, in response to the recent acceleration and diversification of drug development, we determined that an integrated organization of the existing analytical departments would be effective, leading to the establishment of the new organization. The Integrated Bioanalysis Research Department brings together staff engaged in analysis at various stages of drug development, providing high-quality analytical services to our customers in a seamless manner. This will enhance the sophistication of analytical techniques for biopharmaceuticals, which are evolving daily, while also strengthening our proposal capabilities to customers and aiming for further service evolution. Under the fundamental philosophy of "contributing to society with advanced technology," TRC will continue to grow together with our customers through the analytical expertise and quality cultivated over many years, contributing to the life sciences field, including drug development.

Our company (hereinafter referred to as "TRC") has launched a service for pharmaceutical applications of extracellular vesicles, titled "Extracellular Vesicle Pharmaceutical Application Support." Extracellular vesicles are small vesicles (membrane-bound structures) secreted by cells that transport biomolecules such as proteins and nucleic acids, playing a crucial role in intercellular communication. In recent years, the development of drugs utilizing extracellular vesicles as drug delivery systems (extracellular vesicle pharmaceuticals) has been advancing. However, there are few companies capable of conducting analyses that meet the stringent standards for pharmaceutical applications, making the establishment of an analytical framework for drug applications urgent. Therefore, TRC has initiated quality evaluation services for the development and application of extracellular vesicle pharmaceuticals, contributing to the social implementation of extracellular vesicles. For more details, please check the related links.

This course will introduce the principles, characteristics, and application examples of two widely used analytical methods for analyzing surface composition, chemical structure, and functional groups: X-ray photoelectron spectroscopy (XPS / ESCA) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). [1] X-ray photoelectron spectroscopy (XPS / ESCA): A method for evaluating the composition and chemical bonding states of all elements, except for hydrogen and helium, present in the surfaces of inorganic and organic materials, as well as polymers. By combining etching, it allows for depth profiling analysis of inorganic and organic materials, and by applying gas-phase chemical modification methods, it is also possible to detect and quantify carboxyl groups, hydroxyl groups, and primary amines in organic materials. Additionally, it can analyze electronic states such as work function. [2] Time-of-flight secondary ion mass spectrometry (TOF-SIMS): A method for qualitative analysis of trace organic and inorganic substances in the microregions (~several μm) of the very surface of materials, effective for analyzing trace surface contaminants and foreign substances. While absolute quantification is difficult, it is possible to compare the amounts of detected compounds between samples. By using a gas cluster ion beam (GCIB), depth profiling can be performed on organic materials while minimizing surface damage.

This is a course for those who want to learn about surface analysis from the basics. It provides easy and compact explanations on the following topics: - Surface analysis - TOF-SIMS: Time-of-flight secondary ion mass spectrometry (principles, spectrum examples) - RBS: Rutherford backscattering spectrometry (principles, spectrum examples) - XPS: X-ray photoelectron spectroscopy (principles, spectrum examples) - Measurement case: Organic EL devices As a benefit of taking the course, there is a "Q&A service for course content," where an analysis expert will answer questions such as "I want to deepen my understanding of the principles of analytical methods" or "I have unclear points about measurement cases and would like a detailed explanation," which may be difficult to convey in video lectures. ◎ For details on how to apply, please visit here: https://www.toray-research.co.jp/service/seminar/online/

Our company (hereinafter referred to as "TRC") has introduced a system at our Shiga facility to re-liquefy helium gas used as a refrigerant in analytical instruments, in preparation for the helium crisis that has garnered particular attention in recent years. This has enabled us to establish a framework for the stable and continuous provision of specialized analytical services for nuclear magnetic resonance (NMR) and other ultra-low temperature measurements, which are essential for liquid helium. Helium is used in a wide range of fields, including superconducting magnets, medical devices, and scientific research. However, due to a decrease in supply and a global increase in demand, it has become increasingly difficult to obtain in recent years. At TRC, we have established a system to recover helium gas that vaporizes from NMR superconducting magnets and liquid helium containers for reuse, and we have begun operations. This allows us to provide stable services for NMR and ultra-low temperature measurements while contributing to the effective utilization of helium. TRC will continue to strive to provide sustainable advanced analytical services while responding to changes in the resource supply environment, based on our fundamental philosophy of "contributing to society through advanced technology." For more details, please check the related links.

Our company (hereinafter referred to as "TRC") has become the first domestic contract analysis company to offer high-sensitivity analysis services for catalyst surfaces in catalytic reactions under high-temperature and high-pressure conditions, particularly mimicking actual processes, using infrared spectroscopy. A catalyst is a substance that facilitates a chemical reaction without changing itself before and after the reaction. To improve the performance of a catalyst, it is important to investigate how substances adsorb and react on the catalyst's surface. TRC has made it possible to analyze catalytic reactions under controlled conditions at high temperatures and pressures (up to 700°C and 10 MPa) by using a special diffusion reflection infrared spectroscopy cell that can withstand high pressure, along with circulating reaction gases such as hydrogen and carbon monoxide. This enables the investigation of synthesis reactions for liquid hydrocarbons, which can serve as alternative fuels, under high-temperature and high-pressure conditions that mimic actual processes. In addition to optimizing the reaction conditions of catalysts, insights into reaction mechanisms can also be obtained, which is expected to contribute to the design, development, and improvement of catalysts that are crucial for achieving carbon neutrality. For more details, please check the related link.

HALT (Highly Accelerated Limit Test) is a testing method that exposes products to very strong temperature and vibration stresses in a short period of time to reveal potential weaknesses. It has a proven track record with various devices such as smartphones and communication equipment, allowing for the early identification of structural defects and substrate issues before mass production, significantly reducing troubles in the market. We verify how much the product can withstand under harsh conditions and provide total support from investigating the causes of failures to formulating countermeasures. For more details, please visit this page: https://www.toray-research.co.jp/analysis-evaluation/ana_071.html

We are pleased to announce that we will be hosting the third webinar regarding our DNA chip "3D-GeneⓇ," which is sold through our agency, aimed at those who are researching or considering extracellular vesicles. This webinar will be conducted in three parts: foundational, measurement, and application, focusing on extracellular vesicles. In the first (foundational) and second (measurement) sessions, we had the honor of having Dr. Yusuke Yoshioka, a director of the Japanese Society for Extracellular Vesicles and a lecturer at the Department of Molecular Cell Therapy, Institute of Medical Science, Tokyo Medical University, present on research methods and the latest information regarding extracellular vesicles. The third session will introduce the industrial applications and evaluation methods of extracellular vesicles utilizing the content from the previous sessions, presented by the Toray Group. We sincerely look forward to your participation. ● Seminar Registration Information - Participation Fee: Free - Format: Online Seminar If you wish to participate, please register using the "Details & Registration" button below. ● Date and Time January 29 (Wednesday) 17:00-17:40 (Live Broadcast) February 6 (Thursday) 19:00-19:40 (Rebroadcast) February 14 (Friday) 12:00-12:40 (Rebroadcast)