テセック Product Lineup

We handle the weight drop handler "LT4530." The "LT4530-T" is a state-of-the-art machine that fully supports high throughput, 8 sites, high and low temperature measurements, and high-frequency contacts. The "LT4530-D" is specialized for high temperature measurements with 4 sites and incorporates the thorough JAM prevention measures realized in the LT9900, achieving a high operating rate. Two models are available upon request. 【Features of LT4530-T】 ■ High throughput ■ High operating rate ■ Expansion of high-frequency measurement (PTB method) to QFN ■ High and low temperature measurements *The downloadable PDF document is the English version of the catalog. For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The "4170-IH" is a film frame test handler that tests leadless devices such as QFN and CSP directly on the wafer after dicing. By performing visual position correction (xyzθ) before measurement, accurate position information of the device and optimal probe pin pressure are maintained across all devices on the strip, achieving stable measurements and high-speed indexing. 【Features】 ■ High throughput ■ High load capacity, high thrust table ■ Expanded strip attachment area - Within 260mm in length × 300mm in width (WLCSP within φ300mm) ■ LOT management compatible with barcode/2D code reader ■ Switching between varieties is a simple exchange involving only the measurement socket replacement and screen settings. *The downloadable PDF material is the English version of the catalog. For more details, please refer to the PDF material or feel free to contact us.

• Other inspection equipment and devices

The "471-TT" is a DC tester that achieves a significant reduction in data communication time by adopting LAN technology. By utilizing the measurement techniques accumulated over many years, it enables simultaneous measurement of multiple chips in the wafer measurement process. It also inherits our strengths in high voltage and high current measurement technology. By processing simultaneous measurements of multiple chips, it significantly improves productivity compared to conventional testers. 【Features】 ■ Improved cost performance through simultaneous measurement of multiple chips (8 parallel/16 parallel) ■ Significant reduction in data communication time by adopting LAN technology ■ Reduction in measurement time through accelerated relay switching ■ Stable measurements in parallel measurement, leveraging our measurement technology (Max 2kV/20A) ■ Capability to set voltage/current limits, reducing the load on probe pins ■ Automatically divides and sets the number of chips to be measured simultaneously to be below the pre-set maximum current value (current capacity of the prober chuck) *For more details, please refer to the PDF document or feel free to contact us.

• Tester

The "431-TT" is a new concept DC tester that inherits the know-how of power device measurement and adopts a V/I source measurement module. It features an open architecture, allowing for flexible and diverse system configurations. It supports high current and high voltage measurements, as well as high-speed and parallel measurements, and includes maintenance functions such as waveform monitoring on the operation screen. 【Features】 ■ VI source measurement module configuration ■ Capable of measuring up to 1.2KV/130A (maximum 2.2KV/200A) ■ High-speed measurement ■ Multi-device testing (testing two DUTs simultaneously, such as 2-in-1 devices) ■ Wafer parallel testing (simultaneous measurement of two chips) *For more details, please refer to the PDF document or feel free to contact us.

• Tester

"ULTRA P" is a handler developed for the final testing of MEMS devices such as accelerometers and gyroscopes. By using a unique transport method, it achieves simultaneous measurements of up to 96 sites, enabling low-temperature and high-temperature measurements, as well as 6DOF (3 positions, 3-axis gyroscope) measurements. Additionally, we have prepared a measurement unit called "ULTRA L" that allows for manual measurements for research and development purposes. 【Features】 ■ Simultaneous measurement of many units (up to 96 DUT) ■ High-precision temperature control (within ±1℃) ■ Measurement at 60OF is possible ■ Achieves over 20,000 UPH ■ Magnetic testing (optional) is available *For more details, please refer to the catalog or feel free to contact us.

• Other measurement, recording and measuring instruments
• Semiconductor inspection/test equipment