Supports large current and high voltage measurements, as well as high-speed and parallel measurements! Flexible and diverse system configurations are possible.
The "431-TT" is a new concept DC tester that inherits the know-how of power device measurement and adopts a V/I source measurement module. It features an open architecture, allowing for flexible and diverse system configurations. It supports high current and high voltage measurements, as well as high-speed and parallel measurements, and includes maintenance functions such as waveform monitoring on the operation screen. 【Features】 ■ VI source measurement module configuration ■ Capable of measuring up to 1.2KV/130A (maximum 2.2KV/200A) ■ High-speed measurement ■ Multi-device testing (testing two DUTs simultaneously, such as 2-in-1 devices) ■ Wafer parallel testing (simultaneous measurement of two chips) *For more details, please refer to the PDF document or feel free to contact us.
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【Other Features】 ■ Waveform monitor on PC screen ■ Compatible with our existing high current units and high temperature pressure units *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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TESEC Corporation is a company engaged in the development, manufacturing, and sales of semiconductor testing equipment such as handlers, testers, and parts. Utilizing measurement technology cultivated since its establishment, the company plays a crucial role in ensuring the high quality and performance of semiconductor products, centered around handlers and testers. In response to the demands for energy conservation and a low-carbon society, TESEC has contributed to the world as a leading company in the measurement of power devices, which are essential for low power consumption and high-efficiency power conversion, thereby establishing the "TESEC brand." Additionally, through accurate measurement technology and innovative measurement methods in complex measurement environments, TESEC has proposed high-value-added testing equipment, including the MAP (Matrix Alley Package) System and Strip Test System, which have received high acclaim for significantly improving production efficiency.
