List of Tester products

  • classification:Tester

1~45 item / All 122 items

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Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

  • small-mistcollector.png
  • air conditioning

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Designed for the removal ratio of common mode signals in EEG and system noise testing!

  • Tester

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Intensive shock tests at 15-second intervals due to enhanced resistance improve productivity!

  • Tester

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Suitable for the development of reflective PPG products! Outputs analog signals of R and IR.

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  • Tester

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Designed for system verification and evaluation of software algorithms!

  • Tester

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A tester suitable for the development of finger clip oximeters and patient monitors!

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  • Tester

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An electrocardiogram simulator designed for performance testing!

  • simulator
  • Tester

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We have combined accuracy, convenience, and test automation into one!

  • Tester

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Compatible with flat cables! Equipped with automatic mechanisms, manual mechanisms, and desktop mechanisms, etc.

  • Tester

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Micro-capacity inspection with high resolution! Capable of inspecting various products such as thin-film RF filters and accelerometers.

  • Tester

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Achieved over 50% higher throughput compared to conventional serial testers by adopting Per-Pin architecture!

  • Tester

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opie invitation.png

Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26

Yonata Electronics Co., Ltd. will exhibit at "OPIE '26," which will be held at Pacifico Yokohama from April 22 (Wednesday) to April 24 (Friday), 2026. We will showcase various test solutions for optical communication, silicon photonics, and semiconductors, including a live demo of the PXIe/benchtop SMU, a 1.6T compatible DCA/BERT, LD testing, CPO, PCIe high-speed cable BER, WAT/WLR, and more. We sincerely look forward to your visit. 【Highlights】 - Live demo of the 1.6T optical transceiver evaluation solution - First public unveiling of the PCIe high-speed cable BER tester - Live demo of the high-precision SMU - Display of CPO solutions and LD evaluation proposals for AI data centers 【Exhibition Information】 ■ Venue: Pacifico Yokohama ■ Date: April 22 (Wednesday) to April 24 (Friday), 2026 ■ Address: 1-1-1 Minatomirai, Nishi-ku, Yokohama, Kanagawa 220-0012 ■ Booth: K-14 For more details, please refer to: https://www.opie.jp/2026/list/info.php?id=5296&ex=

High-performance wafer-level test system compatible with wafers from 8 inches to 12 inches!

  • Tester

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opie invitation.png

Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26

Yonata Electronics Co., Ltd. will exhibit at "OPIE '26," which will be held at Pacifico Yokohama from April 22 (Wednesday) to April 24 (Friday), 2026. We will showcase various test solutions for optical communication, silicon photonics, and semiconductors, including a live demo of the PXIe/benchtop SMU, a 1.6T compatible DCA/BERT, LD testing, CPO, PCIe high-speed cable BER, WAT/WLR, and more. We sincerely look forward to your visit. 【Highlights】 - Live demo of the 1.6T optical transceiver evaluation solution - First public unveiling of the PCIe high-speed cable BER tester - Live demo of the high-precision SMU - Display of CPO solutions and LD evaluation proposals for AI data centers 【Exhibition Information】 ■ Venue: Pacifico Yokohama ■ Date: April 22 (Wednesday) to April 24 (Friday), 2026 ■ Address: 1-1-1 Minatomirai, Nishi-ku, Yokohama, Kanagawa 220-0012 ■ Booth: K-14 For more details, please refer to: https://www.opie.jp/2026/list/info.php?id=5296&ex=

Supports PAM4/NRZ signals and covers the 1.6TBASE/CEI-224G standard!

  • Tester

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opie invitation.png

Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26

Yonata Electronics Co., Ltd. will exhibit at "OPIE '26," which will be held at Pacifico Yokohama from April 22 (Wednesday) to April 24 (Friday), 2026. We will showcase various test solutions for optical communication, silicon photonics, and semiconductors, including a live demo of the PXIe/benchtop SMU, a 1.6T compatible DCA/BERT, LD testing, CPO, PCIe high-speed cable BER, WAT/WLR, and more. We sincerely look forward to your visit. 【Highlights】 - Live demo of the 1.6T optical transceiver evaluation solution - First public unveiling of the PCIe high-speed cable BER tester - Live demo of the high-precision SMU - Display of CPO solutions and LD evaluation proposals for AI data centers 【Exhibition Information】 ■ Venue: Pacifico Yokohama ■ Date: April 22 (Wednesday) to April 24 (Friday), 2026 ■ Address: 1-1-1 Minatomirai, Nishi-ku, Yokohama, Kanagawa 220-0012 ■ Booth: K-14 For more details, please refer to: https://www.opie.jp/2026/list/info.php?id=5296&ex=

The versatile bond tester DAGE4000 has been completely redesigned, becoming more multifunctional and achieving higher precision, thus being reborn!

  • Tester

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It can handle various bonding strength tests in the assembly process of various semiconductor components and electronic parts, as well as in the mounting process on substrates, all with one machine!

  • Tester

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Leak tester that supports the reliability of aircraft maintenance.

  • Calibration and repair
  • Tester
  • Other measurement, recording and measuring instruments

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A mid-range model that pursues excellent stability and reduced working hours.

  • Tester
  • Circuit Board Inspection Equipment

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A handler that thoroughly pursues excellent stability and reduced working hours.

  • Tester
  • Circuit Board Inspection Equipment

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A mid-range handler that supports the efficiency of IC testing in AI development.

  • Tester
  • Circuit Board Inspection Equipment

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A handler that thoroughly pursues excellent stability and reduced working hours.

  • Tester
  • Circuit Board Inspection Equipment

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Streamlining IC testing for small home appliances while ensuring high quality.

  • Tester
  • Circuit Board Inspection Equipment

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High-speed, high-precision IC test handler that supports the reliability of automotive components.

  • Tester
  • Circuit Board Inspection Equipment

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A mid-range handler that thoroughly pursues excellent stability and reduced working hours.

  • Tester
  • Circuit Board Inspection Equipment

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A mid-range IC test handler that pursues excellent stability and reduced working time.

  • Tester
  • Circuit Board Inspection Equipment

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High-precision pressure calibration equipment that supports the safe operation of aircraft.

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  • 2022-03-09_15h08_09.png
  • Calibration and repair
  • Tester
  • Other measurement, recording and measuring instruments

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Eliminating keypad operations, we have adopted an intuitive touchscreen method!

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  • 03.png
  • Tester

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One unit compatible with LIV·EA·spectrum — fully automatic, ultra-high efficiency tester, essential for mass production.

  • Tester

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A smart test system optimized for mass production screening of silicon photonics.

  • Tester

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Overwhelming mass production capability at 4000 UPH. Automatic for dynamic, static, and high-temperature conditions.

  • Tester

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Compatible with SFP112/QSFP112! Can be mounted in the compact FTB-1 HPDC chassis.

  • ネットワークテスター『FTBx-8848x』シリーズ2.png
  • Tester

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Customize the optical integrated circuit you want to measure! Introducing our testing solutions.

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  • Tester

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Starting the 800GbE point-to-point test, also supporting breakout tests with 2x400GbE and 8x100GbE!

  • 800GbEネットワークテスター『FTBx-8880x』シリーズ2.png
  • 800GbEネットワークテスター『FTBx-8880x』シリーズ3.png
  • 800GbEネットワークテスター『FTBx-8880x』シリーズ4.png
  • Tester

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A modular measurement platform for testing optical passive components 24 hours a day, 365 days a year!

  • 光コンポーネントテスタ『CTP10』2.png
  • Tester

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Full support for testing transmission standards of 800G/400G/200G/100G!

  • ビットエラーレートテスター『BA-4000』2.png
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  • ビットエラーレートテスター『BA-4000』5.png
  • ビットエラーレートテスター『BA-4000』6.png
  • Tester

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Introduction to Theoretical Analysis of Wire Probe Wear

  • probe
  • Tester
  • Semiconductor inspection/test equipment

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The layout and operability of the NS series remain unchanged, achieving stable low-temperature measurements.

  • Tester
  • Other semiconductor manufacturing equipment

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Changing the common sense of testing. AMB5600, an innovative platform that supports diverse ICs.

  • AMB5600-img01-1024x882.png
  • AMB5600-img02-768x669.png
  • Tester
  • Testing Equipment and Devices

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Supports up to 4096 channels, a multi-site open short tester that achieves the fastest test time in the industry.

  • AMB1831-img02-768x539.png
  • Tester
  • Testing Equipment and Devices

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High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.

  • Semiconductor inspection/test equipment
  • Tester

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High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.

  • Tester
  • Circuit Board Inspection Equipment

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Middle Range Model: A handler that thoroughly pursues excellent stability and significant reduction in work time.

  • Tester
  • Circuit Board Inspection Equipment

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Middle-range model: A handler that thoroughly pursues excellent stability and significant reduction in working time.

  • Tester
  • Circuit Board Inspection Equipment

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If you do not perform a proof test, it can also be used as a regular winding machine!

  • Tester
  • Testing Equipment and Devices

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