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  1. Home
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  3. Yonata Electronics
  4. Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26
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  • Apr 06, 2026
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Apr 06, 2026

Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26

Yonata Electronics
Yonata Electronics Co., Ltd. will exhibit at "OPIE '26," which will be held at Pacifico Yokohama from April 22 (Wednesday) to April 24 (Friday), 2026. We will showcase various test solutions for optical communication, silicon photonics, and semiconductors, including a live demo of the PXIe/benchtop SMU, a 1.6T compatible DCA/BERT, LD testing, CPO, PCIe high-speed cable BER, WAT/WLR, and more. We sincerely look forward to your visit. 【Highlights】 - Live demo of the 1.6T optical transceiver evaluation solution - First public unveiling of the PCIe high-speed cable BER tester - Live demo of the high-precision SMU - Display of CPO solutions and LD evaluation proposals for AI data centers 【Exhibition Information】 ■ Venue: Pacifico Yokohama ■ Date: April 22 (Wednesday) to April 24 (Friday), 2026 ■ Address: 1-1-1 Minatomirai, Nishi-ku, Yokohama, Kanagawa 220-0012 ■ Booth: K-14 For more details, please refer to: https://www.opie.jp/2026/list/info.php?id=5296&ex=
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DCA6065_1.jpg

65 GHz Sampling Oscilloscope 'DCA6065'

Supports eye pattern testing of ultra-fast optical signals at 1.6T/800G/400G!

The DCA6065 is a high-performance 65 GHz sampling oscilloscope. It features a 65 GHz optical port bandwidth and offers selectable 1/2/4 channel configurations. It has a built-in TDECQ feed-forward equalizer (FFE) with a maximum of 64 taps. It supports flexible network configurations and includes a clock data recovery (CDR) system with 120 GBaud, or an independent CDR module can be added as an option. 【Key Specifications (Partial)】 ■ Optical Bandwidth: 65 GHz ■ Wavelength Range: 1250–1600 nm ■ Supported Standard Rates: 106.25/112 GBaud PAM4, 53.125/56 GBaud PAM4 ■ ADC Resolution: 14 Bit *For more details, please download the PDF or feel free to contact us.

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1.6T Bit Error Rate Tester 'B3224'

Supports PAM4/NRZ signals and covers the 1.6TBASE/CEI-224G standard!

The B3224 is a high-performance Bit Error Rate Tester (BERT) for physical layer characteristic evaluation and consistency testing. With excellent signal quality, a wealth of features, and flexible testing modes (integrated MCB or remote head), it provides powerful performance and flexibility from research and development to manufacturing testing of high-speed serial circuit products. It supports data rates from 24.33 to 120 Gbaud. The test patterns include various PRBS, SSPRQ, JP03A/B, Square Wave, and custom-defined patterns. 【Key Specifications (Partial)】 ■ Output Signal: Differential PAM4/NRZ (AC Coupled) ■ Output Amplitude: 800 mVp-p (Differential) ■ Rise/Fall Time: < 4.5 ps ■ Input Signal: Differential PAM4/NRZ (AC Coupled) ■ Clock Mode: Built-in Clock Recovery *For more details, please download the PDF or feel free to contact us.

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B6064C_1.jpg

PCIe High-Speed Cable BERT 'B6064C'

Supports high-density testing with up to 64 lanes (128 differential pairs)!

The "B6064C" is a high-density, versatile solution that supports bit error rate (BER) testing for high-speed cables compliant with PCIe 6.0 and earlier standards. Equipped with automatic link training and up to 40dB of insertion loss compensation, it is ideal for research and development, verification, and manufacturing testing of high-speed PCIe cables. It enables comprehensive system-level signal integrity verification in data center interconnects, providing essential quality assurance for cable manufacturers and system integrators. 【Key Specifications (Partial)】 ■ Test Unit: 2 x 64 Pair TRx ■ Terminal: AC Coupled ■ Supported Rates: 64GT/s, 32GT/s, 16GT/s, 8GT/s, 5GT/s, 2.5GT/s ■ Protocol Compliance: PCIe 6.0/5.0/4.0/3.0/2.0 *For more details, please download the PDF or feel free to contact us.

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B0201 & B1201_1.jpg

High-precision benchtop SMU 'B0201 & B1201'

Compact and cost-effective single/dual channel benchtop SMU!

The "B0201 & B1201" is a high-precision benchtop SMU that can simultaneously output and measure voltage and current. It is an ideal choice for various IV measurement tasks that require high resolution and accuracy. It offers a wide voltage source (±200V) and current source (±1A DC, ±3A pulse) functionality, excellent precision, and a 6.5-digit display (minimum display resolution of 1fA/100nV). Additionally, it features an outstanding color LCD graphical user interface. 【Main Specifications (Partial)】 ■ Maximum Output Voltage: ±200V ■ Maximum Output Current: ±1A (DC), ±3A (Pulse) ■ Maximum Output Power (per channel): 20W ■ Minimum Measurement Resolution: 1fA/100nV ■ Maximum Sampling Rate: 1MS/s *For more details, please download the PDF or feel free to contact us.

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B2031 & B3031_1.jpg

High-Precision Benchtop SMU 'B2031 & B3031'

Compact and cost-effective 4-channel/8-channel desktop precision source/measurement unit!

The "B2031 & B3031" is a high-precision benchtop SMU that has the capability to output and measure voltage and current simultaneously. It can output a maximum of ±30V and ±500mA (DC/Pulse), and features an excellent color LCD graphical user interface (GUI). It also supports traditional SMU SCPI commands. Transitioning from existing test code can be done quickly and easily. 【Key Specifications (Partial)】 ■ Model: B2031 (4 channels) / B3031 (8 channels) ■ Maximum Output: Voltage ±30V, Current ±500mA (DC/Pulse) ■ Minimum Measurement Resolution: Voltage 60µV, Current 100pA ■ Maximum Sampling Rate: 500 kS/s *For more details, please download the PDF or feel free to contact us.

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SWT5100_1.jpg

Silicon Photonics Wafer Test System 'SWT5100'

High-performance wafer-level test system compatible with wafers from 8 inches to 12 inches!

The "SWT5100" is a high-performance wafer-level test system designed for automated testing of silicon photonics wafers. It offers a fully automated testing process from wafer loading to optical alignment. Equipped with a chuck capable of temperature control from 25°C to 150°C, it supports optical, DC, and RF testing. It accommodates both GC and EC coupling and can be flexibly configured from single fibers to fiber arrays. 【Main Specifications (Partial)】 ■ Supported Wafer Size: 8 to 12 inches ■ Supported Wafer Thickness: 200 to 2000 um ■ Chuck Temperature Range: 25°C to 150°C ■ Supported Tests: Optical, DC, RF ■ Coupling Method: Grating coupling and edge coupling *For more details, please download the PDF or feel free to contact us.

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PPT8200_1.jpg

Wafer Acceptance Test (WAT) Parallel Parametric Tester 'PPT8200'

Achieved over 50% higher throughput compared to conventional serial testers by adopting Per-Pin architecture!

The "PPT8200" is a high-performance parallel parametric test system designed with a "Per-Pin" architecture to optimize test efficiency. Equipped with SMUs and PGUs for each pin, it achieves over 50% higher throughput compared to traditional serial testers. The advanced software environment simplifies the development of test programs. It accelerates mass production launches, supports array testing, and provides a solution that balances high reliability and cost efficiency. 【Key Specifications (Partial)】 ■ Architecture: Per-Pin Architecture ■ Number of Pins: 48 Pins ■ Configuration: Per-Pin SMU, Per-Pin PGU ■ Voltage Range: ±200V ■ Current Range: ±1A ■ Throughput: >50% improvement compared to serial testers *For more details, please download the PDF or feel free to contact us.

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YONATA ELECTRONICS Product Catalog

YONATA ELECTRONICS Product Catalog

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Testing, Analysis and Measurement
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Fukuda's leak test, leak inspection, leak detection, leak test, integrity test.

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Fukuda Co., Ltd. has been pursuing leak detection for 60 years and is committed to advancing the future of leak testing. 【 Supporting Various Leak Tests: Air Leak Test / Gas Leak Test (Hydrogen Gas, Helium Gas) 】 We develop, manufacture, and sell leak testing equipment to inspect airtightness and sealing properties. We will propose the appropriate testers and devices for each inspection target. 【 Target Industries and Examples of Inspection Targets 】 - Automotive Industry: Engines, FC components, valves and piping, various parts - Electronic Components Industry: Smartphones, keyless switches, various small sensors - Pharmaceuticals / Food / Cosmetics Industry: Bottle containers, syringes, vials, eye drop containers, pillow packaging, PTP packaging We will propose the most suitable leak testers for each industry. 【 ISO Certification 】JIS Q 9001:2015 (ISO 9001:2015)

Jun 05, 2026

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Setting overly optimistic 'projections' compared to reality!? 'Planning Fallacy'

"SBS Marketing Co., Ltd." Tending to set overly optimistic "forecasts"?! 'Planning Fallacy'

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Based on practical experience in support companies and business companies, SBS Marketing Co., Ltd. provides consulting services related to marketing, sales promotion, and customer acquisition primarily in the BtoB (business-to-business) sector. On June 4, 2026, we published a page titled "Do We Tend to Set 'Forecasts' Too Optimistically? The 'Planning Fallacy'." The 'Planning Fallacy' refers to the psychological phenomenon where the time, costs, and risks required to complete tasks are "underestimated," while the benefits are "overestimated." The page explains examples of its occurrence, the factors that lead to it, and methods to overcome it. (Page Overview: Excerpts) ■ What is the 'Planning Fallacy'? ■ Examples of the 'Planning Fallacy' ■ Why does the 'Planning Fallacy' occur? ■ What are the methods to overcome the 'Planning Fallacy'? (DL content only) ▼ For more details, please visit this page. https://sbsmarketing.co.jp/blog/planning-fallacy-2026-06/

Jun 05, 2026

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Introducing the applications to be released in May.

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Introducing the applications we publish on our website every Wednesday. Ideal for charging power supplies! Regenerative combo power supply equipped with a mechanical relay for output ON/OFF: https://www.keisoku.co.jp/app/492/ AC/DC power supply capable of high voltage output of ±1000Vdc: https://www.keisoku.co.jp/app/493/ About the high-speed current response technology of the high-end multifunctional electronic load "Load Fast Series": https://www.keisoku.co.jp/app/494/

Jun 05, 2026

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It has been published in the list of telework-related tools (Japan Telework Association).

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Our IP phone service "Rimofon" has been newly listed in the Japan Telework Association's "List of Telework-Related Tools." It is introduced as a telephone response support tool in conjunction with the carrier's FMC (Fixed-Mobile Convergence) service. The Japan Telework Association provides information related to telework, including guidelines for its implementation. It is an organization with a wealth of knowledge on telework and specific case studies. They offer the latest information to companies considering the introduction of telework and work style digital transformation (DX). https://japan-telework.or.jp/news/news_20260601/

Jun 05, 2026

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[Information] Shirutoku Report 118: What is Device Modeling?

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This time, I will talk about creating device models for simulation (device modeling). [Contents] ■ What is device modeling? ■ Device modeling of high-frequency power amplifiers ■ Measurements to determine parameters

Jun 05, 2026

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