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At Sanko Analysis Center Co., Ltd., we conduct infrared spectroscopy (FT-IR) analysis targeting solids and liquids such as plastics, powders, paints, and oils. By irradiating the sample with infrared light, where the wavelength continuously varies, light at the same frequency as the inherent vibration frequency is absorbed, allowing us to obtain an infrared spectrum (FT-IR) corresponding to the chemical structure. We will report the obtained infrared spectrum (FT-IR). Additionally, we will identify organic and inorganic compounds through comparison with our database, as well as perform molecular structure analysis of organic compounds and provide a report. *For more details, please download the PDF or feel free to contact us.*
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Free membership registrationAt Sanko Analysis Center Co., Ltd., we conduct analyses using a scanning electron microscope (SEM) and an energy-dispersive X-ray spectrometer (EDS). With the scanning electron microscope (SEM), we scan the sample with an electron beam and observe the shape of the sample by converting secondary electrons and backscattered electrons emitted from the surface into images. (30x to 300,000x) With the energy-dispersive X-ray spectrometer (EDS), we perform qualitative elemental analysis by detecting characteristic X-rays emitted from the sample when the electron beam is scanned, and we conduct quantitative elemental analysis using the fundamental parameter method by measuring the intensity of the characteristic X-rays. Additionally, we take photographs of the SEM images of the specified areas and report them. Length measurement and 3D imaging are available upon request. *For more details, please download the PDF or feel free to contact us.
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