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This document is a collection of case studies on the implementation of "optical wireless communication systems." It introduces solutions to customer challenges and requests, including cases between buildings across roads, the use of surveillance cameras, and spot area expansion using existing infrastructure. Our optical wireless communication can operate at a constant speed of 100 Mbps. Additionally, it is possible to extend the communication distance, accommodating over 100 meters through optical wireless communication relays. [Contents (partial)] ■ Product Information ■ Features of Our Optical Wireless Communication ■ Customer Challenges and Solution 1 ■ Challenges and Solution 2 ■ Customer Requests and Solution 1 *For more details, please refer to the PDF document or feel free to contact us.
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Free membership registrationThe "optical wireless communication system" is a wireless communication technology that transmits data by modulating information onto light emitted from sources such as LEDs. By rapidly blinking the light at a speed that is imperceptible to the human eye (over 100 million times per second), it is possible to achieve stable wireless communication at a speed of 100 Mbps. Since it does not use radio waves, it is unaffected by interference from radio waves, allowing for wireless communication even in locations where traditional wired communication or radio-based wireless communication is difficult to secure. 【Features】 ■ Ensures communication even in locations where wired communication is challenging ■ Easy installation and relocation (cost reduction in installation expenses) ■ High communication quality due to immunity from radio interference and electromagnetic wave effects ■ High confidentiality due to secure one-to-one communication ■ Exempt from radio law regulations, eliminating communication costs ■ Ultra-low latency (below 10 μsec) *For more details, please refer to the PDF document or feel free to contact us.
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Free membership registration"In Situ De-embedding (ISD)" is software that allows for the de-embedding of measurement data from the entire fixture containing the device under test, enabling the extraction of S-parameter data for the device under test with very simple operations. Additionally, during the de-embedding process, the S-parameters are corrected in the time domain, resulting in outcomes that satisfy passivity and causality. 【Features】 ■ Compared to other methods such as the general TRL method, it allows for the easy and accurate extraction of data for the device under test. ■ It can be used for high-frequency components such as capacitors, inductors, resistors, filters, ICs, multi-terminal components like differential devices and high-speed transmission connectors, as well as high-frequency elements measured on-wafer, all of which are evaluated using S-parameters. *For more details, please download the PDF or feel free to contact us.
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