パンソリューションテクノロジーズ Product Lineup

The "VWECER-100-S" conducts quality measurements of silicon wafers using the newly developed technology "HS-CMR method" at Tohoku University’s Institute of Metal Materials Research. Since it is possible to accurately determine and sort the quality at the wafer stage, low-quality wafers can be eliminated without being turned into cells. This allows for the reduction of waste in the cell manufacturing process and improves the yield rate. 【Features】 ■ Measures all elements related to energy conversion efficiency within silicon wafers (electrons, holes, defects, impurities, etc.) ■ Capable of measuring the performance of silicon wafers as solar cells as "potential conversion efficiency," which cannot be confirmed visually ■ Can sort out silicon wafers with low potential conversion efficiency without turning them into cells ■ Can significantly reduce manufacturing costs ■ Can also contribute to the improvement of pn junction technology *For more details, please feel free to contact us.

• Other measurement, recording and measuring instruments

Good news for manufacturers of solar cell ingots, wafers, and cells. We have a wafer quality measurement device that can measure in about 10 seconds per wafer, significantly shortening the inspection process. ■Solution for Crystal Technology Our silicon wafer quality measurement device for solar cells, equipped with the measurement technology (HS-CMR method) we developed, can accurately measure the quality of silicon wafers for solar cells without turning them into cells. By analyzing the obtained data, it contributes to reducing solar cell manufacturing costs and improving quality. 【Features】 ◆ High correlation with conversion efficiency ◆ Measurement time of about 10 seconds per wafer ◆ Simple device configuration *For more details, please download the catalog or feel free to contact us.

• Other machine elements