Significantly reduce manufacturing costs! Effective carrier measurement device for silicon wafers used in solar cells.
The "VWECER-100-S" conducts quality measurements of silicon wafers using the newly developed technology "HS-CMR method" at Tohoku University’s Institute of Metal Materials Research. Since it is possible to accurately determine and sort the quality at the wafer stage, low-quality wafers can be eliminated without being turned into cells. This allows for the reduction of waste in the cell manufacturing process and improves the yield rate. 【Features】 ■ Measures all elements related to energy conversion efficiency within silicon wafers (electrons, holes, defects, impurities, etc.) ■ Capable of measuring the performance of silicon wafers as solar cells as "potential conversion efficiency," which cannot be confirmed visually ■ Can sort out silicon wafers with low potential conversion efficiency without turning them into cells ■ Can significantly reduce manufacturing costs ■ Can also contribute to the improvement of pn junction technology *For more details, please feel free to contact us.
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We manufacture and sell inspection equipment for materials used in solar cells and semiconductors. The HS-CMR method we developed is a new principle born from solar cell research. Solar power generation is an excellent method of generating electricity that can uniquely harness energy from outside the Earth. As humanity, we have an obligation to continue advancing tirelessly towards a low-carbon society. From the forefront of crystal research in the Tohoku region, we will disseminate new crystal technologies and contribute to solving energy issues. Solution for the Crystal Technology.
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