Metrix Company Overview

High resolution × high sensitivity × quantification! Atomic and nanoscale electrical property evaluation using eSPM.

Our company provides contract measurement and analysis services focused on advanced measurement and analysis technologies centered around eSPM (Electrical Scanning Probe Microscopy) for semiconductor, electronic devices, and battery materials, including C-AFM and SSRM. We aim to eliminate bottlenecks in the development of new materials and processes through two-dimensional nanoprobing, accelerating practical application. Even if the analysis conditions are not yet established, please feel free to contact us first. We will listen to your applications and challenges and propose the optimal measurement plan.