Testing, Analysis and Measurement

Metrix 本社

addressTokyo/Fuchu-shi/1-31-4 Midorimachi
phone-
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Metrix Inc. Business Introduction

We provide contracted measurement and analysis services categorized by analysis and evaluation methods, or by materials and devices, depending on the target to be evaluated or the information to be obtained.

Metrix Inc. supports the resolution of research and development and technical issues through contract evaluation and measurement services, analysis support, and technical consulting utilizing eSPM. We conduct "Conductive Atomic Force Microscopy (C-AFM)" to visualize the local current distribution on sample surfaces and assess leakage paths and electrical inhomogeneities. Additionally, we perform "Scanning Spreading Resistance Microscopy (SSRM)" to evaluate local resistance distribution, which is used for analyzing electrical characteristics in semiconductor cross-sections and within devices. 【Services】 ■ Services by Analysis and Evaluation Method - Conductive Atomic Force Microscopy (C-AFM) - Scanning Spreading Resistance Microscopy (SSRM) *For more details, please refer to the related links or feel free to contact us.

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