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西華貿易有限公司 （西華産業）

addressChina/(All areas)/3-3-1 Marunouchi, 3rd Floor, New Tokyo Building
phone03-5221-7119
last updated：

西華貿易有限公司 Product Lineup

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Spectroscopic ellipsometer

Spectroscopic ellipsometer for thin film measurement. Supports high-precision measurement of various thin films.

It is possible to select a system for high-speed and wide wavelength range measurement (190-1700 nm) using a CCD detector, as well as high optical resolution measurement (190-2050 nm) using a double monochromator. By adding various options (such as infrared spectroscopic ellipsometer, GXR, etc.), more precise measurements can be achieved.

  • Semiconductor inspection/test equipment
  • Microscope
  • Other semiconductors

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