シナジーオプトシステムズ List of Products and Services

The 『PMD002/POL』 is a polarization extinction ratio measurement module using a spatial polarizer rotation method. It directly measures the polarization state of collimated incident light. By using an objective lens, it can measure the output polarization state of optical fibers and semiconductor lasers. Additionally, the polarization measurement sensor head can be used independently or mounted and combined with a prober for wafer-level polarization measurements of VCSELs and other devices. 【Features】 ■ Capable of measuring polarization extinction ratios with high speed, high resolution, and reproducibility ■ Controls the rotation of the polarizer with a pulse rotation stage for high angular accuracy ■ Compatible with the attachment of objective lenses ■ Capable of measuring various lasers and spatial light measurements of VCSELs in addition to optical fibers ■ Capable of measuring large diameter beams (up to φ10mm collimated light) and more *For more details, please download the PDF or feel free to contact us.

• Optical Measuring Instruments

The "High-Performance NFP Measurement Device for High-Power Lasers" is an optical beam shape measurement device compatible with NFP measurement of high-power lasers in the ~10W class. The optical system features our high-performance NFP measurement optical system M-Scope type HS for high-power lasers, allowing for the measurement of near-field images (NFP) with the installation of high-power resistant objective lenses. Additionally, by measuring without the objective lens, it is also possible to measure the radiation angle distribution (FFP) in a narrow angular range. 【Features】 ■ High-Performance NFP Measurement Optical System M-Scope type HS for High-Power Lasers ■ High-Function Optical Beam Analysis System "Optical Beam Analysis Module AP013" *For more details, please download the PDF or feel free to contact us.

• Optical Measuring Instruments

The "FFP Measurement Device for High-Power Lasers" is a device that rapidly and accurately measures the radiation angle distribution (far-field pattern) of high-power lasers in the ~10W class. By combining a specially designed optical system for high-power lasers, the M-Scope type HF, with a two-dimensional image detector and image processing method, it is possible to acquire and measure the radiation angle distribution (FFP: far-field pattern) of the emitted beam from high-power light-emitting devices and modules in real-time. 【Features】 ■ Uses the M-Scope type HF optical system for FFP measurement of high-power lasers up to ~10W class ■ The light detector employs a 1-inch high-precision CMOS detector ISA061 (dedicated) ■ The optical beam analysis module AP013 includes an analysis device, optical beam analysis software, detector driver, and correction data as a set *For more details, please download the PDF or feel free to contact us.

• Optical Measuring Instruments

The "Optical System Method Ultra-Fine Waveguide Insertion Loss Measurement Device" is an automatic measurement device for insertion loss using our simplified optical measurement system, M-Scope type J. With the optical fiber measurement port and coaxial observation image detector, it allows for direct observation of the core end face images on both the incident and outgoing sides of the waveguide being measured, while simultaneously performing automatic power alignment using optical fibers. By combining coarse alignment through image processing with fine alignment using optical fibers (optical power alignment), it is possible to efficiently measure the insertion loss of ultra-fine waveguides with high speed and high reproducibility. 【Features】 ■ Equipped with our general-purpose polarization-resistant optical measurement system M-Scope type J/PF ■ Insertion loss measurement under conjugate conditions with optical fiber alignment method ■ Dedicated image processing and automatic alignment software provided ■ Combination with an electric positioning stage enables high-speed and highly reproducible automatic measurements through image processing and automatic alignment, among others. *For more details, please download the PDF or feel free to contact us.

• Optical Measuring Instruments

The "AP013" is an image processing and analysis module designed for measuring light beam profiles, including lasers, optical fibers, and optical modules, as well as various light emission parameters such as NFP, FFP, and collimated light. When combined with our optical measurement systems, the M-Scope series and the 2D optical detector ISA series, it can be applied to observe various light beams and measure light parameters in the visible to near-infrared wavelength range. 【Features】 ■ Immediately usable as a set with the analysis device (PC main unit), analysis software, detector driver, and correction data. ■ High-performance optical beam measurement and analysis software compatible with various light beam profile measurements, based on the Optometrics BA Standard. *For more details, please download the PDF or feel free to contact us.

• Optical Measuring Instruments

The "Optical Tester (High-Speed Continuity Inspection Device for Optical Wiring Waveguides)" is a device that inspects the continuity of multi-channel polymer optical waveguides for optical wiring substrates with high speed and precision. With the measurement light bulk irradiation method and high-speed continuity inspection software, it is possible to measure the optical continuity of multiple channels of optical waveguides simultaneously and rapidly. As a result, high-speed optical continuity testing in the mass production stage of optical wiring waveguides, which could not be achieved with conventional fiber alignment loss measurement methods, has become possible. 【Features】 ■ Non-alignment and high-speed measurement using the measurement light bulk excitation method ■ High-speed, high-precision, and high-reproducibility continuity and relative loss measurements compatible with mass production inspection, enabled by the measurement light bulk excitation light source unit, high N.A. detection optical system, and high-speed image processing algorithm, which extracts, processes, and determines only the waveguide propagation signals of the optical waveguides using dedicated software ■ Support for defocus measurement mode and automation of measurements through combination with an electric stage *For more details, please download the PDF or feel free to contact us.

• Optical Measuring Instruments

The "Wafer-Level Light Emitting Device Optical Characteristic Measurement System" is a system that analyzes the electrical and optical characteristics of various light-emitting devices such as VCSELs at the wafer level. In addition to the electrical characteristic measurements necessary for VCSEL characterization, it is capable of performing optical characteristic measurements at the wafer level, including light beam profile measurement, FFP measurement (radiation angle distribution measurement), IVL measurement, and polarization measurement. 【Features】 ■ By combining with manual probers and semi-automatic probers, it enables the measurement of various electrical and optical characteristics of light-emitting devices such as VCSELs at the wafer level. ■ The linkage function with the Form Factor semi-automatic prober system achieves automation, acceleration, and labor-saving of various measurements. ■ Equipped with our optical measurement and analysis software, Optometrics Customized Version for LD, among others. *For more details, please download the PDF or feel free to contact us.

• Optical Measuring Instruments

The "PMD002/IVL" is a photometric module that allows for easy measurement of the IVL characteristics of light-emitting devices such as semiconductor lasers and VCSELs. The compact and lightweight IVL measurement sensor head can be used independently or mounted on the objective lens revolver of our high-performance NFP measurement optical system, M-Scope type S. Additionally, it can be used for wafer-level IVL measurements of VCSELs and other devices by being mounted and combined with a prober. 【Features】 - Uses a large 18mm square Si photodiode, covering a wide N.A. - Wide measurement power range with the use of a neutral density filter - Can be mounted on the manual revolver section of our high-performance NFP measurement optical system, M-Scope type S - Compatible with installation and use in prober systems - Capable of IVL measurement of VCSELs at the wafer level *For more details, please download the PDF or feel free to contact us.

• Optical Measuring Instruments

The "M-Scope type HF" is an optical system for measuring the radiation angle distribution (far-field pattern) of high-power lasers in the 1 to 10W class. It employs a specially designed far-field pattern measurement optical system compatible with high-power lasers, combined with a 2D image detector and image processing method. It is capable of acquiring and measuring the radiation angle distribution (FFP: far-field pattern) of the emitted beam from high-power light-emitting devices or modules in real time. 【Features】 - Real-time measurement of the radiation angle distribution (FFP) of high-power lasers in the 1W to 10W output class. - The combination of a beam sampler (two stages behind the objective lens) and a neutral density filter allows for attenuation of the high-power laser to a suitable level for measurement. - Expanded measurement area with a beam diameter of approximately 3mmφ and a measurement angle range of about ±43°. - Real-time measurement of FFP images using a dedicated optical system and image processing method. - Designed for a long working distance, approximately 4mm. *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments

The "FFP Measurement Device" is a device that measures the FFP (Far Field Pattern: far-field image) of semiconductor lasers, optical fibers, optical waveguides, optical modules, and more. With a dedicated optical system and image processing method, it can be applied to FFP measurement, radiation angle distribution measurement, output N.A. measurement, and analysis of various optical devices. By selecting the appropriate optical detector, it is possible to construct various systems ranging from the visible range to the 1550nm near-infrared wavelength band used in optical communications. 【Features】 ■ Uses FFP measurement optical system M-Scope type F ■ Quick measurements and easy adjustments with a dedicated optical system and image processing analysis method ■ Long working distance design with approximately 6mm working distance ■ Capable of measurements from the visible range to the near-infrared range by selecting the appropriate optical detector ■ Equipped with the optical beam analysis module AP013, which includes an analysis device, optical beam analysis software, detector driver, and correction data *For more details, please refer to the PDF materials or feel free to contact us.

• Other measurement, recording and measuring instruments

The "M-Scope type HS" is an optical system for measuring the emission beam profile of high-power lasers in the 1 to 10W class. The light beam emitted from the sample being measured passes through an objective lens, is attenuated to about 99.99% by a two-stage beam sampler, and is then focused onto a two-dimensional image detector using an imaging lens. This allows for accurate measurement of the emission beam profile and beam shape of high-power lasers under various objective lens magnifications. 【Features】 ■ The combination of a beam sampler (two-stage behind the objective lens) and an attenuation filter allows for the measurement of high-power laser power at an appropriate level. ■ Various objective lens magnifications can be selected (various objective lenses from the M-Plan Apo NIR and M-Plan Apo NUV series). ■ Collimated light measurement is possible (without the objective lens). ■ A standard coaxial reflected illumination port is equipped, enabling microscope image observation and alignment using real images when combined with a coaxial reflected illumination device (optional). *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments
• Other electronic measuring instruments
• Other analyses

The "Light Beam NFP Measurement Device" is a versatile optical beam profiler system capable of a wide range of applications, from observing and measuring the light beam profile of light-emitting elements, optical fibers, optical waveguides, and various optical modules to analyzing optical characteristics. The optical system uses our high-performance NFP measurement optical system (a simplified NFP measurement optical system is also available), and in combination with various optical detectors and the light beam analysis module AP013, it can be used for NFP measurement, light beam shape observation, and light beam profile measurement and analysis of various optical devices. Additionally, by selecting different optical detectors, it is possible to construct various systems ranging from the visible spectrum to the 1550 nm near-infrared wavelength band used in optical communications. 【Features】 ■ Uses the high-performance NFP measurement optical system M-Scope type S ■ Capable of measurements from the visible spectrum to the near-infrared range by selecting optical detectors ■ Enables measurement and analysis of various optical devices in combination with the light beam analysis module AP013 ■ System construction is possible at a low cost *For more details, please feel free to contact us.

• Other inspection equipment and devices
• Optical Measuring Instruments

The "Wafer-Level Optical Device Characterization System" is a system that analyzes the electrical and optical characteristics of light-emitting devices such as VCSELs and LEDs, as well as light-receiving devices like photodiodes and illuminance sensors, at the wafer level. This product combines a prober system for semiconductor failure analysis, such as a semi-auto prober or manual prober, with our various optical measurement systems from the M-Scope series, measurement light sources, and measuring instruments to analyze and collect data on the electrical and optical characteristics of optical semiconductor devices at the wafer level. Additionally, by combining with a semi-auto prober, it is also possible to support automatic measurement of wafers. 【Features】 ■ Capable of measuring various electrical and optical characteristics of light-emitting and light-receiving devices at the wafer level ■ Achieves automation, speed-up, and labor-saving for various measurements ■ Can be equipped with various optical systems from our M-Scope series for optical measurement ■ Includes the Optometrics Customized Version optical measurement and analysis software ■ Capable of wide-ranging applications from individual device measurements to inline use *For more details, please feel free to contact us.

• Microscope
• Other measurement, recording and measuring instruments
• Optical Measuring Instruments

The "M-Scope type I" is a high-performance optical system designed for versatile optical applications such as light irradiation measurement, light reception measurement, and light beam profile measurement. It is equipped with a fiber optic port for optical measurement and a port for image detectors used in image processing and analysis, enabling multiple optical measurements. Additionally, various optical measurement components can be added according to the purpose, allowing for the easy construction of optical measurement units tailored to measurement objectives, items, and cycles. Optimal lenses and optical components can be selected and mounted according to the measurement target and the wavelength used for measurement, enabling various measurements to be conducted under optimal optical conditions. 【Features】 - Equipped with a fiber optic connection port for optical measurement - Equipped with a coaxial image observation port - The introduction position of the measurement light to the sample and the reception position can be directly observed with a coaxial observation camera - Capable of light beam profile measurement - Usable for optical beam measurement applications such as beam profile measurement *For more details, please feel free to contact us.

• Laser Components
• Other electronic measuring instruments
• Other measurement, recording and measuring instruments

The "M-Scope typeH" is an NFP measurement optical system for measuring the light beam profile of high-output lasers in the 5W class. It employs a method where approximately 5% of the light beam emitted from the sample being measured is reflected by a beam sampler, and this reflected light is focused onto a two-dimensional image detector using an objective lens and an imaging lens. This allows for the accurate measurement of the light beam profile and shape of high-output lasers, and in combination with a fine motion stage, it is also possible to measure changes in the emission direction of the beam shape by moving the optical system in the focal direction. 【Features】 ■ Attenuates to an appropriate level for measuring the power of high-output lasers ■ Up to 20x magnification for observation optics ■ Standard equipped with a coaxial incident illumination port ■ Allows for microscope image observation and alignment using real images in combination with a coaxial incident illumination device (optional) ■ Enables the construction of a high-output laser NFP measurement system in conjunction with the optical beam analysis module AP013 *For more details, please feel free to contact us.

• Laser Components
• Other electronic measuring instruments
• Other measurement, recording and measuring instruments

Synergy Opto Systems Co., Ltd.'s "Wafer-Level Light Emitting Device Measurement System for VCSEL/LED" is a system for analyzing light-emitting devices such as VCSELs and LEDs in wafer form. By combining various measuring instruments, it is possible to construct a system that measures various electrical and optical characteristics of light-emitting devices at the wafer level. Depending on customer specifications, we can accommodate the selection of probers, customization of measurement optical systems, and measurement software. We also have a wafer-level light-receiving device measurement system that can measure the electrical and optical characteristics of light-receiving elements such as photodiodes in wafer form. 【Features】 ■ Compatible with various probers ■ Capable of proposing an integrated measurement environment through combinations with various measuring instruments *For more details, please refer to the catalog or feel free to contact us.

• Other inspection equipment and devices

The "Encircled Flux Measurement System" is a system that enables the analysis of mode distribution, which is particularly important for evaluating the performance of fibers such as encircled flux and coupled power counts. By analyzing the NFP (Near Field Pattern) of optical fibers, it quickly evaluates and measures the mode propagation of multimode fibers. Additionally, with optional features, it is possible to change the irradiation N.A. and beam diameter by combining it with our company's exclusive air-excited optical system. 【Features】 ■ Standardized parameter measurement function ■ Variable irradiation condition function (optional) ■ Measurement in the near-infrared region (1.3μm band) is possible (optional) *For more details, please refer to the catalog or feel free to contact us.

• Other inspection equipment and devices

The "M-Scope type C / Collimated Light Adjustment System" is an optical system designed for collimated light adjustment, such as for LD modules, utilizing a dedicated optical system and image analysis. By applying this optical system and processing device, it is also possible to propose various module adjustment devices combined with various precision positioning stages. Depending on the choice of detector, it can accommodate visible light to near-infrared. 【Features】 ■ Selection of detectors is possible ■ Compatible with visible light to near-infrared *For more details, please refer to the catalog or feel free to contact us.

• Other inspection equipment and devices

The "M-Scope typeS/NFP Measurement System" is a high-performance optical beam observation and measurement optical system, M-Scope typeS, along with its dedicated processing system, capable of handling everything from beam spot observation to advanced optical characteristic analysis of optical devices. It supports observation and analysis of tiny spots with a maximum optical magnification of 200 times (when using a 100x objective lens). Thanks to the uniquely developed high-performance optical beam analysis software, Optometrics, it can be widely applied from optical beam pattern analysis to the assembly of optical modules. 【Features】 ■ Equipped with a manual revolver ■ Allows switching between multiple objective lenses ■ Maximum optical magnification of 200 times (when using a 100x objective lens) ■ Supports observation and analysis of tiny spots ■ Positioning using real images is possible *For more details, please refer to the catalog or feel free to contact us.

• Other inspection equipment and devices

The "Synergy Opt Systems Co., Ltd. Comprehensive Catalog" is a comprehensive catalog of the "Optical Beam Observation and Measurement Optical System Beam Measurement System" developed, manufactured, and sold by Synergy Opt Systems Co., Ltd., which mainly focuses on optical and precision equipment. It features the "M-Scope type S/NFP Measurement System" for optical beam observation and measurement, as well as its application system, the "Encircled Flux Measurement System," among others. It includes optical systems and systems that are optimal for beam observation, evaluation, and assembly adjustment of visible and near-infrared laser diodes for optical communication and various optical modules. [Contents] ■ Lineup of optical systems for optical beam observation and measurement ■ System and component selection guide *For more details, please refer to the catalog or feel free to contact us.

• Other inspection equipment and devices
• others