Electronic Components and Semiconductors

日本電子材料

EstablishmentApril 1960
capital98310Ten thousand
number of employees610
addressHyogo/Amagasaki-shi/2-5-13 Nishichōzuma, Japan
phone06-6482-2007
last updated：
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日本電子材料 List of Products and Services

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Probe card for semiconductor testing.

A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.

The "probe card" is used in the semiconductor manufacturing process during the electrical inspection known as wafer testing. Our flagship product, the "Advanced Probe Card (M-type Probe Card)," excels at simultaneously measuring a large number of microchips created on semiconductor wafers. It is used for testing DRAM and NAND flash memory, which are also incorporated in smartphones. 【Features】 ■ Excellent at simultaneously measuring a large number of microchips ■ Usable for testing DRAM and NAND flash memory ■ Incorporates advanced technology known as MEMS *Please feel free to contact us.

  • Inspection fixture
  • Semiconductor inspection/test equipment

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