A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.
The "probe card" is used in the semiconductor manufacturing process during the electrical inspection known as wafer testing. Our flagship product, the "Advanced Probe Card (M-type Probe Card)," excels at simultaneously measuring a large number of microchips created on semiconductor wafers. It is used for testing DRAM and NAND flash memory, which are also incorporated in smartphones. 【Features】 ■ Excellent at simultaneously measuring a large number of microchips ■ Usable for testing DRAM and NAND flash memory ■ Incorporates advanced technology known as MEMS *Please feel free to contact us.
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[Purpose] ■ Fixture for semiconductor front-end process inspection *Please feel free to contact us.
Company information
Nihon Electronic Materials Co., Ltd. was established in 1960, focusing on cathodes and heaters for cathode ray tubes as its main products, and has led the industry as a pioneer of today's venture companies. In 1965, it developed the world's first tungsten-based electronic tube for fluorescent character displays, and further developed and began production of probe cards for semiconductor wafer testing. Since then, the company has expanded its domestic bases centered around the probe card business and has also expanded its presence in the United States, Europe, and Asia, engaging in global development. With a constant focus on technological development, it has been introducing new products ahead of other companies. In particular, it aims to be a leading company in the world with cutting-edge probe cards, including the VC series (vertical contact probe cards) and the VS series (vertical spring contact probe cards). Every employee continues to challenge themselves daily, striving to create a "dream company" where each individual can take pride in their work and a "creative company" that continues to grow with a global perspective.
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