List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
1～45 item / All 745 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
We provide comprehensive support from design to manufacturing and maintenance!
- Contract manufacturing
Please use it for demonstration tests and research and development.
- Processing Contract
- Contract manufacturing
- Semiconductor inspection/test equipment
Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo unit...
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
- Defect Inspection Equipment
17th High-Performance Materials WEEK [Tokyo] We will be exhibiting a fine particle visualization system at the 17th High-Performance Film Exhibition. (September 30, 2026 (Wed) - October 2, 2026 (Fri) / Makuhari Messe, Hall 2)
The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are expanding our sales of visualization systems and providing evaluation services (such as investigating particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of cleaning products, and proposing yield improvement measures) both domestically and internationally. We consistently support the identification of causes and the formulation of countermeasures by visualizing fine foreign substances, particle adhesion due to static electricity, and variations in cleanliness that are problematic in the film manufacturing process. The following are some examples of applications, but by utilizing our technology, we can strongly promote the resolution of various issues such as the deterioration of defect rates caused by fine foreign substances, visualization of clean airflow, and concerns regarding site cleanliness. - Visualization of foreign matter contamination and adhesion mechanisms in the coating and drying processes - Visualization of dust generation and re-adhesion during roll transportation and consideration of countermeasures - Evaluation of airflow and cleanliness within clean booths/clean rooms - Identification of dust sources within manufacturing equipment and promotion of cleanliness - Reduction of foreign matter adhesion risk on film surfaces and improvement of yield
It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute for...
- Semiconductor inspection/test equipment
- Other Sanitation Inspections
- Other appearance and image inspection equipment
17th High-Performance Materials WEEK [Tokyo] We will be exhibiting a fine particle visualization system at the 17th High-Performance Film Exhibition. (September 30, 2026 (Wed) - October 2, 2026 (Fri) / Makuhari Messe, Hall 2)
The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are expanding our sales of visualization systems and providing evaluation services (such as investigating particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of cleaning products, and proposing yield improvement measures) both domestically and internationally. We consistently support the identification of causes and the formulation of countermeasures by visualizing fine foreign substances, particle adhesion due to static electricity, and variations in cleanliness that are problematic in the film manufacturing process. The following are some examples of applications, but by utilizing our technology, we can strongly promote the resolution of various issues such as the deterioration of defect rates caused by fine foreign substances, visualization of clean airflow, and concerns regarding site cleanliness. - Visualization of foreign matter contamination and adhesion mechanisms in the coating and drying processes - Visualization of dust generation and re-adhesion during roll transportation and consideration of countermeasures - Evaluation of airflow and cleanliness within clean booths/clean rooms - Identification of dust sources within manufacturing equipment and promotion of cleanliness - Reduction of foreign matter adhesion risk on film surfaces and improvement of yield
There is a track record of adopting load ports. We propose brush seals as a solution for gaps in semiconductor manufacturing equipment.
- Other semiconductor manufacturing equipment
- Semiconductor inspection/test equipment
- Molding Equipment
Test solution that does not damage solder balls or measurement substrates with soft contact!
- Semiconductor inspection/test equipment
- Printed Circuit Board
A sheet socket that enables stable inspection in semiconductor back-end process inspection! What is "PCR" that allows for high-speed and high-density measurements? Technical materials on operating pri...
- Other electronic parts
- socket
- Semiconductor inspection/test equipment
The embedded vapor barrier reduces the risk of corrosion under insulation (CUI).
- Piping Materials
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
![[Semiconductor/Wafer Inspection] AI...](https://image.mono.ipros.com/public/product/image/2009087/IPROS10607066819809733241.jpg?w=280&h=280){kind=small}
For manufacturing sites troubled by excessive detection. This inspection device accurately determines fine defects in wafers through AI analysis and full-color image inspection, achieving improved yie...
- Semiconductor inspection/test equipment
- Wafer
- Circuit Board Inspection Equipment
It is a device that automatically supplies semiconductor wafers to the inspection machine. It employs a vibration isolation mechanism to prevent vibrations during inspection.
- Semiconductor inspection/test equipment
Supports manufacturing with precision of +0, -0.005mm (5μm) in outer diameter grinding processing. Centerless finishing of free-cutting phosphor bronze round bars.
- probe
- Semiconductor inspection/test equipment
- Non-ferrous metals
Strong durability against ultraviolet rays and high temperatures.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
- Piping Materials
IQI for verifying the image quality and reproducibility of electronic components and semiconductor devices.
- Semiconductor inspection/test equipment
Sales of the semiconductor and electronic components image quality meter "Semiconductor Wire IQI" will begin on July 30, 2026.
NDT Advance Co., Ltd., which sells non-destructive testing equipment, will begin selling the Semiconductor Wire IQI (Image Quality Indicator for Semiconductors and Electronic Components) on July 30, 2026, to verify image quality and reproducibility in radiographic testing of electronic components and semiconductor devices. The Semiconductor Wire IQI is an IQI based on ASTM E801, designed to confirm image quality and reproducibility in radiographic testing of electronic components and semiconductor devices. It is composed of transparent acrylic resin, shim material, lead particles, tungsten wire, and lead identification numbers, and is used according to the transmission conditions of the electronic components being inspected.
Identify the disconnection point without opening the package!
- Semiconductor inspection/test equipment
- Defect Inspection Equipment
- Other inspection equipment and devices
It can achieve high sensitivity detection for all AMC categories.
- Semiconductor inspection/test equipment
High cleaning performance! The internal structure is very simple with no fluid retention areas! No metal leaching!
- Semiconductor inspection/test equipment
Notice of Participation in the 28th Interphex Japan
We will be exhibiting at the "28th Interphex Japan" trade show, which will be held from May 20 to 22, 2026, featuring auto connectors, automatic piping switching devices, Quitto, and electronic listening rods. At our booth, we will have demonstration units of the auto connectors and automatic piping switching devices, allowing you to see how the connectors automatically align and how the piping is attached and detached. In the Quitto experience corner, you can try out the new product "Quitto" for easy attachment and detachment with just one action. Additionally, we will also display the actual electronic listening rod Kirari MUSE, a diagnostic device that digitizes and visualizes "sound." If you are interested in factory automation, facing challenges with automation, want to eliminate the hassle of Hurel clamps, or are troubled by abnormal sound diagnostics, please stop by. We sincerely look forward to your visit. "28th Interphex Japan" Date: May 20 (Wed), May 21 (Thu), May 22 (Fri), 2026, 10:00 AM - 5:00 PM Venue: Makuhari Messe (Booth Number: 30-27) Exhibits: Auto connectors for powder, automatic piping switching devices, "Quitto," electronic listening rods.
Expansion of measurement conditions and built-in 64 LCR meters enable faster and more accurate inspections!
- Tester
- Semiconductor inspection/test equipment
- Circuit Board Inspection Equipment
Overall positioning accuracy ±2.5µm! A high-precision inspection device ideal for inspecting large, multi-pin semiconductor package substrates.
- Semiconductor inspection/test equipment
- Other inspection equipment and devices
- Circuit Board Inspection Equipment
Supports a maximum of 112Kp up and down! Achieving multi-pin and high-precision inspection of large HDI boards.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
- Circuit Board Inspection Equipment
![[Ion Chromatography Data] Measureme...](https://image.mono.ipros.com/public/product/image/06c/2000505020/IPROS20489339410741671084.png?w=280&h=280){kind=small}
Automating the concentration process involving neutralization and matrix removal in ion chromatography to measure impurities in high-purity ammonium hydroxide used in semiconductor manufacturing.
- Analytical Equipment and Devices
- Ion Chromatography
- Semiconductor inspection/test equipment
Support for a total of 48K points in both vertical and horizontal directions! A high-speed inspection solution for multi-panel arrangements of large full-panel PCBs (500×620mm).
- Semiconductor inspection/test equipment
- Circuit Board Inspection Equipment
The optimal imaging inspection device for TGV inspection has been completed!
- Printed Circuit Board
- Semiconductor inspection/test equipment
- Visual Inspection Equipment
Full panel size support! A high-capacity, high-speed, and high-precision inspection solution compatible with a maximum point count of 24Kch.
- Semiconductor inspection/test equipment
Full panel size support! A high-capacity, high-speed, and high-precision inspection solution compatible with a maximum point count of 24Kch.
- Semiconductor inspection/test equipment
For the semiconductor industry! Process analyzer / Online analyzer for monitoring tetramethylammonium hydroxide (TMAH) in developer solutions!
- Analytical Equipment and Devices
- Wafer
- Semiconductor inspection/test equipment
Measurement of hydrogen peroxide trimethylamine and standard cations for semiconductor manufacturing using ion chromatography.
- Ion Chromatography
- Semiconductor inspection/test equipment
- Analytical Equipment and Devices
Device temperature measurement probe
- Semiconductor inspection/test equipment
Analytical methods essential for the processes and quality control in semiconductor manufacturing.
- Wafer
- Semiconductor inspection/test equipment
- Semiconductors and ICs
We will provide high-value-added analysis services by integrating AI with cutting-edge analytical technologies.
- Contract Analysis
- Contract Analysis
- Semiconductor inspection/test equipment
Full-color appearance inspection device "AURCA Series"
- Semiconductor inspection/test equipment
- Visual Inspection Equipment
- Circuit Board Inspection Equipment
Process analyzer / Online analyzer for continuous monitoring of hydrogen peroxide concentration in the CMT process!
- Analytical Equipment and Devices
- Semiconductor inspection/test equipment
- Wafer
Simultaneous analysis of ammonium hydroxide, hydrogen peroxide, and hydrochloric acid in the wafer cleaning tank monitored by inline near-infrared analyzer!
- Spectroscopic Analysis Equipment
- Wafer
- Semiconductor inspection/test equipment
Chemical filter system for high-end semiconductor exposure equipment, such as ArF liquid immersion lithography.
- Other filters
- Other semiconductor manufacturing equipment
- Semiconductor inspection/test equipment
Connecting from planning to beyond with "innovation." Your solution partner for testing and quality.
- Semiconductor inspection/test equipment
- Visual Inspection Equipment
- Other assembly machines