List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
1～45 item / All 675 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
A belt grinding machine that has been in use for about 50 years since 1973. In addition to trust and proven results, the lineup is also extensive.
- Other machine tools
Belt grinding machine "Veda Machine" has high durability and a wide range of service parts.
The "Bader Machine" is our belt grinder that boasts excellent polishing performance for each individual unit. By selecting models and types according to the shape and size of the workpiece, and by equipping it with a polishing belt suitable for the task, it can flexibly accommodate a wide variety of items across various fields. Please make extensive use of it for high-efficiency polishing and grinding, reduction of work time, labor-saving, and standardization of tasks. 【Lineup】 ■ Portable type BP-K (air motor type) ■ Made-to-order machine PC-1 (wheel centerless), BC (standard dust cover) ■ Installed type BM (basic type), SBA-1, BH-2 ■ Wheel type SBD-4S, SBD-7, BWd *For more details, please download the PDF or contact us.
Share of bumps on a maximum 12-inch wafer, the best bond tester for tweezer pull tests.
- Semiconductor inspection/test equipment
Techno Alpha is the Japanese distributor of K&S wire bonders, which boasts a top-class global share in wire bonding, as well as consumables for wire bonders.
- Bonding Equipment
- Other semiconductor manufacturing equipment
- Semiconductor inspection/test equipment
It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute for...
- Semiconductor inspection/test equipment
- Other Sanitation Inspections
- Other appearance and image inspection equipment
We will exhibit a particulate visualization system at SMART ENERGY WEEK 2025 "PV EXPO 21st Solar Power Generation Exhibition" (September 17 (Wed) - September 19 (Fri), 2025 / Makuhari Messe).
The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are expanding our sales of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, inside and outside manufacturing equipment, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. At this exhibition, we will demonstrate our particle visualization system along with three new products that were just released last year. Please experience the excitement of high particle detection performance and visualization at the venue. 【Date】 September 17 (Wed) - September 19 (Fri), 2025 【Time】 10:00 AM - 5:00 PM 【Venue】 Makuhari Messe, Hall 6 E20-21 Free entry. Pre-registration for attendance is required on the organizer's website. https://www.wsew.jp/autumn/ja-jp.html#/
Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo unit...
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
- Defect Inspection Equipment
We will exhibit a particulate visualization system at SMART ENERGY WEEK 2025 "PV EXPO 21st Solar Power Generation Exhibition" (September 17 (Wed) - September 19 (Fri), 2025 / Makuhari Messe).
The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are expanding our sales of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, inside and outside manufacturing equipment, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. At this exhibition, we will demonstrate our particle visualization system along with three new products that were just released last year. Please experience the excitement of high particle detection performance and visualization at the venue. 【Date】 September 17 (Wed) - September 19 (Fri), 2025 【Time】 10:00 AM - 5:00 PM 【Venue】 Makuhari Messe, Hall 6 E20-21 Free entry. Pre-registration for attendance is required on the organizer's website. https://www.wsew.jp/autumn/ja-jp.html#/
High-speed line inspection at SWIR 2K×1, 110kHz
- Monochrome camera
- Semiconductor inspection/test equipment
By using heat reflection and laser technology, LIT narrows down the heat generation points beneath the metal layer, which were difficult to detect, to as small as 2μm, breaking through the limits of h...
- Semiconductor inspection/test equipment
- Defect Inspection Equipment
Full support from FPC design, prototyping, and mass production to board power-on testing, appearance inspection systems, and FA automation! TAIYO FPC SOLUTIONS!
- Semiconductor inspection/test equipment
- Printed Circuit Board
- Circuit board design and manufacturing
High Cost Performance Mixed Signal Tester
- Semiconductor inspection/test equipment
Leave silicon carbide and silicon nitride to JFC.
- Fine Ceramics
- Other machine elements
- Semiconductor inspection/test equipment
Exhibited at the 2017 High-Performance Ceramics Exhibition at Tokyo Big Sight from April 5 to 7.
Thank you to everyone who visited us. We will be exhibiting at the "High-Performance Ceramics Exhibition" held at Tokyo Big Sight in April. At our booth, we will showcase: - A new product that further enhances the fracture resistance of silicon nitride ceramics and improves thermal conductivity. - A new material that does not bend like iron, utilizing the lightweight properties of aluminum, known as "composite materials of metals and ceramics." - "Ceramic substrates" characterized by thin film and film formation technology. If you have any concerns regarding equipment design, component design, thermal design, or anything else, please feel free to stop by our booth for a consultation. We look forward to seeing you.
Measurement error of 0.1 nm per meter. Has a track record of delivering over 1,000 units as a light source for precision interferometric measurements to major manufacturers.
- Optical Measuring Instruments
- Semiconductor inspection/test equipment
Frequency stability of 10⁻¹¹. Over 1,000 units delivered to major manufacturers as light sources for precision interferometric measurements for smartphone and automotive lenses, as well as semiconduct...
- Optical Measuring Instruments
- Semiconductor inspection/test equipment
For nanometer measurements in a wide range of fields. We have a track record of delivering over 1,000 units as a light source for precision interferometric measurements to major manufacturers.
- Optical Measuring Instruments
- Semiconductor inspection/test equipment
You can download a free document summarizing the causes of the current semiconductor shortage.
- Semiconductor inspection/test equipment
High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.
- Semiconductor inspection/test equipment
- Tester
Quantification of anions in high-concentration sodium hydroxide solution for semiconductor manufacturing using ion chromatography.
- Wafer
- Analytical Equipment and Devices
- Semiconductor inspection/test equipment
Analyze industry and market trends in semiconductors, focusing on chiplet technology, advanced packaging technology, chiplet packaging technologies, materials, and equipment configuration!
- Other semiconductors
- Other semiconductor manufacturing equipment
- Semiconductor inspection/test equipment
Flagship model: A handler that thoroughly pursues excellent stability and significant reductions in working time.
- Semiconductor inspection/test equipment
- Circuit Board Inspection Equipment
- Testing Equipment and Devices
Process analyzer / Online analyzer for continuous monitoring of hydrogen peroxide concentration in the CMT process!
- Analytical Equipment and Devices
- Semiconductor inspection/test equipment
- Wafer
For the semiconductor industry! Process analyzer / Online analyzer for monitoring tetramethylammonium hydroxide (TMAH) in developer solutions!
- Analytical Equipment and Devices
- Wafer
- Semiconductor inspection/test equipment
We provide high-quality circuit processing and wiring processing services using FIB. We achieve a high processing yield!
- Semiconductor inspection/test equipment
- Semiconductors and ICs
- Microcomputer
Quality control of high-purity lithium salts used in various manufacturing processes with an automatic titration device.
- Analytical Equipment and Devices
- Electrotitrator
- Semiconductor inspection/test equipment
![[Ion Chromatography Data] Measureme...](https://image.mono.ipros.com/public/product/image/06c/2000505020/IPROS20489339410741671084.png?w=280&h=280){kind=small}
Automating the concentration process involving neutralization and matrix removal in ion chromatography to measure impurities in high-purity ammonium hydroxide used in semiconductor manufacturing.
- Analytical Equipment and Devices
- Ion Chromatography
- Semiconductor inspection/test equipment
Measurement of hydrogen peroxide trimethylamine and standard cations for semiconductor manufacturing using ion chromatography.
- Ion Chromatography
- Semiconductor inspection/test equipment
- Analytical Equipment and Devices
A super high-resolution camera capable of wide-angle and ultra-high-definition imaging, suitable for various MV applications.
- Monochrome camera
- Color camera
- Semiconductor inspection/test equipment
Inspection is possible only on the surface of the double-sided implementation substrate! Also compatible with 3D tomography inspection. *Detailed explanatory materials will be provided.
- Semiconductor inspection/test equipment
- X-ray inspection equipment
Automatically inspect crystal defect voids inside silicon wafers!
- Semiconductor inspection/test equipment
- X-ray inspection equipment
X-ray observation device for analysis with a high resolution of 0.25 μm focal spot size.
- Semiconductor inspection/test equipment
- X-ray inspection equipment
Automated X-ray inspection device for inspecting solder bumps on wafers.
- Semiconductor inspection/test equipment
- X-ray inspection equipment
High-precision inspection equipment compatible with transparent materials.
- Semiconductor inspection/test equipment