W-CSP inspection probe card
Probe card for inspecting W-CSP (WLCSP) with balls implemented at the wafer level 【Features】 ○ User-friendly customization (including probe pins) ○ High maintainability ○ High durability performance accumulated by probe pins For more details, please contact us.
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basic information
Head probe card for inspecting W-CSP (WLCSP) with balls implemented at the wafer level 【Features】 ○ User-friendly customization (including probe pins) ○ High maintainability ○ High durability performance accumulated by probe pins For more details, please contact us.
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Applications/Examples of results
W-CSP is particularly used for high-frequency domain tests, especially for communication purposes. At RIKADENSHI, we can provide a stable inspection environment using short probes and narrow pitch compatible probes. By parallel production with the head section, we can assist in improving the efficiency and convenience of management for our customers while ensuring short delivery times.
Company information
With the development of the electronics industry, we have always upheld the management philosophy of "what we can do for our customers." As the market continues to expand, we believe that now is the time for the preservation and improvement of the global environment and mutual understanding for peace to become the foundation of global standards. I am confident that this can serve as an important guiding principle for "coexistence and mutual prosperity." This principle, along with "customer priority," "research and development," "quality focus," "self-improvement," "mutual development," and "profit sharing," serves as the guiding principles for our company and the entire group. Since the early 21st century, we have undergone significant transformation and have made continuous efforts to respond to diversifying needs. We are committed to doing our utmost to become innovators in next-generation technological innovation and product development. We sincerely ask for your continued guidance and encouragement.
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