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This document is a technical report explaining the measurement of fluctuations on glass surfaces using a single beam emission probe. A probe with a standard emission method (based on the same concept as the standard optical system) was created, and the photoelectric conversion device was constructed based on an APD. Using this probe and others, the characteristics of raw glass surfaces were evaluated in real mode. 【Contents】 ■ Configuration of the beam emission probe, etc. ■ About the samples ■ Examples of displacement fluctuations ■ Impact on measurements from the backside ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report that explains the results in air and vacuum under the condition of zero optical path length in a multi-type optical system. It discusses the "impact of air refractive index under zero optical path length conditions" and analyzes "examples of displacement variation (reposting of previous report data)" using graphs and other illustrations. [Contents] ■ Impact of air refractive index under zero optical path length conditions ■ Analysis of examples of displacement variation (reposting of previous report data) ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report explaining the measurement results in a vacuum under the condition of zero optical path length difference for a multi-type optical system. It reports the measurement results in a vacuum under the setting condition of zero optical path length difference for a multi-type optical system. In the optical system with zero optical path length in a vacuum, it has been experimentally demonstrated that temperature fluctuations of the air and the presence of air do not need to be considered. 【Contents】 ■ Issues regarding measurements in a vacuum under zero optical path length conditions ■ Examples of displacement fluctuations ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report explaining the measurement results in the atmosphere at zero optical path length difference for a multi-type optical system. The optical system is set to essentially zero the difference in the REF side optical path length, and long-duration measurements in real mode were conducted. Compared to settings with a 40mm optical path length difference, the displacement variation was significantly smaller, with fluctuations of ±1nm observed over a period of 4000 seconds. [Contents] ■ Theory and practice of zero optical path length ■ Examples of displacement variation ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report explaining the long-duration measurement results in real mode (reconfirming reproducibility). Re-measurements were conducted under the same conditions as "Technical Report Vol.14-8." (In the case of a multi-type optical system with a path length difference of 40mm; R7) The long-duration displacement measurements and temperature variation measurements are explained using graphs. [Contents] ■ Real mode settings ■ Long-duration displacement measurement results and temperature variations ■ Discussion *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report discussing the measurement of a multi-type optical system with a path length difference of 40mm in the atmosphere and the confirmation of reproducibility. In "Technical Report Vol. 14-7," results from the multi-type optical system (path length difference = 40mm) were presented, demonstrating that the measurement results can be explained by optical-based linear expansion. The reproducibility has now been confirmed. The long-term displacement measurements and temperature fluctuation measurements are explained using graphs. [Contents] ■ Long-term displacement measurement results and temperature fluctuations ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report explaining measurements taken in the atmosphere with a path length difference of 40mm in a multi-type optical system. In a high-precision measurement multi-type optical system, the path length difference was set to 40mm, and the displacement changes were evaluated in the atmosphere with significant temperature fluctuations. The report explains long-duration displacement measurements and temperature fluctuation measurements using graphs. [Contents] - Long-duration displacement measurement results and temperature fluctuations - Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report on the long-term measurement results in real mode (regarding the operation of the standard optical system in a vacuum). Two points that are likely to be problematic in a vacuum, "variations in the refractive index of air" and "distortion of the optical system due to atmospheric pressure," have been examined. It has been considered that these will not cause significant issues. Variations in displacement can be explained by temperature fluctuations, and an expansion value of approximately 40% of free expansion can be inferred. The vertical resolution has also been confirmed to be below 1 nm. [Contents] ■ Expansion and the presence of air ■ Displacement measurement results and temperature fluctuations ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report on long-duration measurement results in real mode (using a standard optical system). After resolving several issues in the heterodyne processing system, real mode measurements were conducted. The real mode measurements allow for the selection of various conditions. In the standard optical system, long-duration measurements were performed, and the fluctuations were recorded. Displacement amounts and temperature variations were measured simultaneously. [Contents] ■ Real mode settings ■ Long-duration displacement measurement results and temperature variations ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report explaining real-mode measurement targeted at long-duration measurements. In the heterodyne processing system, we constructed measurement technology in real mode. The main focus of the construction was the signal processing device. We confirmed the operation according to theory using a synthesizer and verified a resolution of less than 1 nm. Additionally, we obtained the operational range of various parameters. Using this device, we conducted measurements in air and inside a vacuum chamber with a standard optical system. [Contents] ■ Real-mode settings for long-duration measurements ■ Data measurement and analysis using a synthesizer ■ Data measurement and analysis with a standard optical system ■ Data measurement and analysis with a standard optical system in a vacuum chamber ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report explaining the vertical resolution of signal processing devices. In a heterodyne processing system, the presence or absence of vertical resolution in the signal processing device was verified in real mode using a synthesizer. When the frequency difference between the two signals was more than 1 mHz, the resolution obtained was as theoretical. Particularly, during a 5-minute measurement in real mode, the resolution was below 1 nm, and this resolution was maintained even in repeated measurements. Similar results were obtained using three types of synthesizers, confirming the characteristics of the signal processing device. [Contents] ■ About the signal processing device ■ About the signal processing software ■ Theory regarding frequency differences ■ Experiments regarding frequency differences ■ Reflection and discussion *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical report on the program constants CLK and BEAT values. It seeks to determine two important constant factors (CLK constant and BEAT constant) in signal processing circuits. The experimental results for measuring the CLK constant and the BEAT constant are explained in detail using graphs. [Contents] ■ About CLK and BEAT values ■ Measurement results ■ Discussion and reflections *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical material published by Photon Probe Co., Ltd., which manufactures and sells optical measurement instruments and components, and provides consulting related to optical measurements. It includes questions and answers regarding measurement issues. We address questions such as "What is optical measurement?", "What are the advantages and disadvantages of optical measurement?", and "What is optical heterodyne measurement?". [Contents] ■ What is optical measurement? ■ What are the advantages and disadvantages of optical measurement? ■ What is optical heterodyne measurement? ■ Why use lasers? What are the advantages of lasers? *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

This document is a technical material published by Photon Probe Co., Ltd., which manufactures and sells optical measurement instruments and components, and provides consulting related to optical measurement. It presents technology related to optical measurement and optical testing in a Q&A format. Questions such as "What is relative measurement?" and "How can we suppress fluctuations in the optical beam?" are addressed regarding optical measurement and testing. [Contents] ■ What is relative measurement? ■ How to configure optical circuits? ■ What are the criteria for selecting optical components? ■ How to suppress fluctuations in the optical beam? *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments
• Other measurement, recording and measuring instruments

The "Fiber Collimator HV-FC" is an optical component that emits collimated light (parallel light) from a fiber. We offer three types: "Standard Fiber Collimator," "Large Diameter Fiber Collimator," and "High Collimation Fiber Collimator." Please choose according to your application. 【Features】 ■ The emitted light from the fiber is collimated light (parallel light) ■ Three types available to suit different applications *For more details, please refer to the catalog or feel free to contact us.

• Other optical parts

This document is a report on the tuning fork characteristic experiments conducted using the optical heterodyne displacement meter "HV400" for tuning fork vibration measurements. Through this experiment, it is shown that the tuning fork does not vibrate in a single mode but rather exhibits complex vibrations that are superimposed. It reveals that there are vibrations containing multiple low-frequency components, rather than just the harmonic (high-frequency side) components explained by modes. Additionally, numerous examples demonstrating tuning fork characteristics are included. [Contents] ■ HV400 Tuning Fork Vibration Measurement (Part 1) ■ HV400 Tuning Fork Vibration Measurement (Part 2) ■ HV400 Tuning Fork Vibration Measurement (Part 4) ■ FFT Analysis of HV400 Tuning Fork Vibration Measurement (Part 1) ■ FFT Analysis of HV400 Tuning Fork Vibration Measurement (Part 2) *For more details, please refer to the catalog or feel free to contact us.

• Optical Measuring Instruments

The emitted light from the fiber is a collimated light (parallel light) optical component. We offer three types to suit your needs. 【Features】 ○ Standard Fiber Collimator By incorporating an aspherical lens into a standard fiber ferrule (standard product), this collimator utilizes the conventional FC connector, making it easy to introduce spatially transmitted light into the fiber. ○ Large Diameter Fiber Collimator This product enhances light-gathering power by using a larger lens than the standard fiber collimator. It provides a simple collimator for the receiving optical system. ○ High Collimation Fiber Collimator Maintains very high collimation quality, offering a simple collimator for the emitted optical system. ● For other functions and details, please download the catalog.

• Other physicochemical equipment
• Optical Measuring Instruments

Optical Heterodyne Displacement Meter HV400 【Features】 ○ 1nm resolution 0.001 microns in vertical resolution The measurement reference is the wavelength of a frequency-stabilized HeNe laser ○ Records transient phenomena every 1μs at the shortest Measures, records, and displays events that fluctuate in a short time The fluctuations are clearly visible on the PC's LCD screen ○ Records up to 1 million points, data processing Significantly increases recording time The vast number of recorded points can all be processed on a PC, with filtering and Excel conversion possible ○ Eliminates error factors based on base vibrations through relative measurements Measures the relative displacement between two measurement points Clearly identifies only the relative fluctuation, allowing for the removal of error factors such as base vibration components ● For other functions and details, please download the catalog.

• Distance measuring device

A frequency shifter optimal for heterodyne measurements that slightly shifts the frequencies of two lights and stabilizes the difference between the two frequencies. 【Configuration】 It consists of two AOMs (acousto-optic modulators) and their drivers. The incident light with a light frequency (f0; for HeNe laser, 474THz) is split into two paths, and each light frequency is shifted to f0+f1 (approximately 80MHz) and f0+f2. The shift amount is very small (f1/f0 ~ 0.0000002), but this slight shift enables processing by electronic circuits, realizing optical heterodyne measurements. The frequency stability of the frequency shifter is achieved by synchronizing the oscillation frequencies of the two drivers that supply high-frequency power to the two AOMs. This provides a level of frequency stability that cannot be achieved with independent drivers. ● For other functions and details, please download the catalog.

• Distance measuring device

Measurement of the Young's modulus of thin films by applying uniform stress to the thin film and measuring the amount of strain. A bulge tester that utilizes the highly versatile characteristics of an optical heterodyne displacement meter. 【Features】 ○ Control of the heterodyne displacement meter, pump operation, and valve operation via PC to acquire data. The acquired data is used for curve fitting to determine the Young's modulus and internal stress. ○ Non-contact and high-precision measurement. ○ Fully automated measurement, with easy repeatability. ○ Compatible with various thin films by replacing the thin film fixing part. ○ Displacement resolution: 1nm (when using HV400), 10nm (when using HV250). ○ Pressure measurement resolution: 0.1Torr. ○ Maximum applied pressure: -300Torr. ○ Maximum sample diameter: 15cm. ○ Maximum diameter of the sample in the measurement area: 50mm. ○ Measurement modes: fully automatic mode or manual mode. ○ Automatic control capability through changes in vacuum systems, stage systems, etc. Specifications such as stress range can be customized according to user requirements. ● For other functions and details, please download the catalog.

• Distance measuring device

A probe type optical heterodyne displacement meter with one probe and one emission is installed at the top of the microscope tube, allowing for simultaneous measurement of displacement while observing with the microscope. 【Features】 ○ Pinpoint measurement of the measurement point on the object ○ Parallel measurement possible while observing the state of the object ○ Equipped with a reflected illumination system and a CCD camera, allowing the object to be viewed as a regular microscope, while using the CCD camera to observe the state of the measurement surface on a display (CRT) ○ Various devices can be attached to the stage ○ Automation is possible by attaching an automatic stage to the stage ○ The size of the configuration differs depending on whether a manual stage or an automatic stage is used. ○ Either HV400 or HV250 can be selected for the heterodyne displacement meter. ● For other functions and details, please download the catalog.

• Distance measuring device

Maintaining the advantages of optical heterodyne measurement, the HV400 simplifies functionality and achieves a low price. It is an optical heterodyne displacement meter equipped with both analog and digital output functions. 【Features】 ○ Maintains a resolution of 10nm with an operating distance of 1000mm ○ Compact and low-cost body and probe ○ Real-time measurement, LED display, analog and digital output ○ Highly versatile ○ Probe shape and optical system configuration can be customized according to the intended use, including shape and options. ● For other functions and details, please download the catalog.

• Distance measuring device

This is a light source for optical heterodyne displacement measurement. It is an essential item for achieving high resolution and high precision, and is indispensable for optical measurements. For high-precision measurements, the stability of the "ruler" is desired. The HeNe laser serves as a reference laser due to its stable frequency as a gas laser. However, even in a free-running state (simply connecting the laser to a power source to turn it on, in a commercially available emission state), the frequency stability is high at f/f ~ 10, but it is insufficient for measurements with high precision, particularly at a resolution of 1 nm. Frequency-stabilized lasers enhance frequency stability and improve the reliability of high-precision measurements. They are essential for conducting high-precision optical measurements. (The frequency stability is highest in solid-state lasers, followed by gas lasers and semiconductor lasers. However, solid-state lasers are expensive, and semiconductor lasers do not provide sufficient stability. Gas lasers are the most practical. However, there are no stabilized lasers for argon lasers or HeCd lasers.) *For more details, please inquire through a request for materials or download.*

• Distance measuring device
• Other optical parts