Power supply for driving electric distortion elements "ENP-152"
The maximum output voltage can be set according to the maximum load specifications.

製品の高性能化に貢献するナノテクノロジー関連の製品・技術を一挙公開!
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46~76 item / All 76 items
The maximum output voltage can be set according to the maximum load specifications.
Shin Nippon Air Technologies Company
Are you troubled by oil mist, fumes, and foreign substances generated during processing? This is a fine particle visualization system that has solved many problems that are not visible to the naked eye.
Shin Nippon Air Technologies Company
It counts particles in gas in real time while simultaneously performing particle size classification. It is a continuously monitored measurement system that can be customized according to specific purposes and applications.
Shin Nippon Air Technologies Company
Are you troubled by the contamination or adhesion of foreign substances? Our experienced particle and airflow visualization system will solve your quality issues. Please feel free to consult with us!
Oji Group Functional Materials Company
Light diffusion control sheet using fine uneven structures (nano buckling).
Milled fibers with a diameter of 200 to 800 nm and a length of 1 to 15 µm, having a fibrous aspect ratio.
Milled fibers with a diameter of 200 to 800 nm and a length of 1 to 20 µm, having a fibrous aspect ratio.
We will guide you through the roles, performance, and features of each process and equipment, as well as a tour of the printed circuit board manufacturing factory!
We are KIBAN, a super-demand company that has shaped images into reality.
Consistent service provided! On-site seminars and factory tours related to circuit boards are available at any time!
The integrated power supply improves mobility. Due to its handheld design, it is also capable of partial treatment of large objects and plasma irradiation on three-dimensional items.
Introducing the functions required of the support for separation membranes, the technical challenges, and the technological innovations of separation membrane supports using heterogeneous two-layer non-woven fabrics in an article.
We are sure to have a spray nozzle that meets your needs! We select based on material, diameter, spray pattern, flow rate, and intended use.
Dust collection efficiency = 99.9%, flame retardant, anti-static industrial dust collector dedicated long-life filter now available for sale at Monotaro!
Filters for various applications and dust collectors.
Observe the fine structure inside the sample in three dimensions with a spatial resolution of 100 nm!
SAXS analysis allows for the understanding of the statistical distribution of particle sizes! It can be evaluated in situ regardless of whether in a solid or liquid state.
Nano-simulation is a computational science method that handles atoms and molecules based on the laws of physics and chemistry, and it can be utilized to understand various phenomena.
Achieving material development DX from the nanoscale through high-speed molecular simulation and machine learning.
Panel mount USB Type-C (USB 3.1) female-to-female black [USB 3.1 compatible] [Neutrik type bezel set]
Utilize handheld terminals and barcodes! Manage item numbers, lots, and quantities.
ISOLITE INSULATING PRODUCTS CO.,LTD.
Introduction of the flexible LTC-FL, a new product from the LTC series of micro-porous ultra-low thermal conductivity materials that are not subject to RCF regulations.
We introduce a rich lineup of small diameter and ultra-small diameter PCD tools for printed circuit boards and semiconductor products!
We have extensive experience in processing semiconductor components, expanding from Φ0.03 to 0.09 mm!
Microfabrication for semiconductor inspection jigs, diffusion plates, shower heads, etc., with a diameter of 0.1mm to 2mm! Achieving long lifespan and high hole precision!
Introducing a wet media-free micronization experimental machine that performs three functions: emulsification, dispersion, and crushing, all in one unit!
Improved resolution for TEM and STEM! Performance has been significantly enhanced, allowing for EDS analysis with four detectors.
Comprehensive analysis of the structure of MEMS components using a combination of non-destructive and destructive methods!
Cross-section preparation for structural observation and defect analysis of semiconductors! Cross-section preparation comparable to FIB and CP is possible.
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