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  1. Home
  2. Electronic Components and Semiconductors
  3. アイテス
Electronic Components and Semiconductors
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アイテス

EstablishmentJanuary 1, 1993
capital3000Ten thousand
number of employees106
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
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last updated:Nov 27, 2025
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  • Company information
  • Products/Services(353)
  • catalog(349)
  • news(106)

アイテス Company Profile

We are an analytical company that responds with advanced technical skills, based on the principle of "strict confidentiality for our clients."

Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

Business Activities

【Analysis and Reliability Evaluation Business】  ■ Analysis and evaluation from data collection of various electronic components to failure analysis  ■ Evaluation of raw materials and characteristics in research and development and manufacturing 【Inspection Equipment Development Business】  ■ Development and sales of solar panel inspection and measurement instruments 【Electronic Equipment Repair Business】  ■ Repair of industrial equipment and computers 【Wafer Processing Business】  ■ Wafer processing services and sales

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Products/Services (353)

Ultrasonic microscope observation of semiconductor packages product image
Ultrasonic microscope observation of semiconductor packages
[Analysis Case Study] Observation of Adhesion State Through Metal Plates Using Ultrasonic Microscopy product image
[Analysis Case Study] Observation of Adhesion State Through Metal Plates Using Ultrasonic Microscopy
Evaluation of thermal degradation rubber by DMA product image
Evaluation of thermal degradation rubber by DMA
Moisture and heat resistance test for adhesive product image
Moisture and heat resistance test for adhesive

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catalog(349)

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Ultrasonic microscope observation of semiconductor packages

Ultrasonic microscope observation of semiconductor packages

TECHNICAL
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Observation of adhesive conditions through a metal plate using an ultrasonic microscope.

Observation of adhesive conditions through a metal plate using an ultrasonic microscope.

TECHNICAL
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Evaluation of heat degradation rubber by DMA

Evaluation of heat degradation rubber by DMA

TECHNICAL
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Moisture and heat resistance test for adhesive

Moisture and heat resistance test for adhesive

TECHNICAL
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news(106)

SAT image_metal plate.png

Observation of adhesive conditions through a metal plate using an ultrasonic microscope.

  • PRODUCT

Here is an introduction to a case where the adhesive condition was observed through a metal plate using an ultrasonic microscope. The ultrasonic microscope can reveal internal information that cannot be confirmed from the appearance, as long as the ultrasonic waves can pass through the material. After reliability testing, we observed the condition of the adhesive remaining on the metal plate from the metal side in a sample where the chip had come off. Please refer to the PDF document for details and results of the observations.

Jan 22, 2026

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SAT image_transistor.png

Ultrasonic microscope observation of semiconductor packages

  • PRODUCT

This is an introduction to the ultrasonic microscope observation of semiconductor packages conducted by our company. Due to storage conditions and mounting conditions, delamination may occur between the metal parts (die pad) and the package resin in semiconductor packages. Delamination inside the package is a defect that significantly affects product quality, but it cannot be detected through visual inspection. By using an ultrasonic microscope, we can clearly capture the internal structure of the package, contributing to reliability evaluation.

Jan 22, 2026

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thermal degradation_NBR rubber.png

Evaluation of heat degradation rubber by DMA

  • PRODUCT

This paper introduces the evaluation of thermally degraded rubber using dynamic viscoelastic measurements. A constant temperature chamber capable of circulating air within the chamber was used as a suitable device for thermal degradation testing, and NBR rubber and EPDM rubber were heated at 100°C for a specified time. The changes in viscoelastic behavior due to heating time were investigated. For both types of rubber, as the heating time increased, the tanδ (= E"/E') peak shifted towards higher temperatures, and a decrease in peak value was observed. It is believed that the loss of rubber elasticity and the decrease in elastic modulus resulted in the shift of Tg towards higher temperatures. By measuring dynamic viscoelasticity, it becomes possible to confirm the changes in physical properties associated with material degradation and to gain insights into structural changes. Additionally, conducting other chemical analyses can clarify more specific changes in chemical structure.

Jan 07, 2026

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Detailed information

Company name アイテス
number of employees106
Contact addresspostalcode 520-2151 Shiga/ Otsu-shi/ 1-60 Kuribayashi TownView on map TEL:077-599-5015 FAX:077-544-7710
Industry Electronic Components and Semiconductors
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