Interferometer - Company Ranking(14 companies in total)
Last Updated： Aggregation Period:Sep 17, 2025〜Oct 14, 2025
This ranking is based on the number of page views on our site.
Display Company Information
| Company Name | Featured Products | ||
|---|---|---|---|
| Product Image, Product Name, Price Range | overview | Application/Performance example | |
| 【Features】 - Capable of measuring samples such as wafers (silicon, compounds, oxides, glass), metal pieces, discs (aluminum, glass), and mec... | Research and development of semiconductor wafers (GaN, SiC, sapphire) for quality improvement in mass production lines. | ||
| 【Features】 - Capable of measuring samples such as wafers (silicon, compound, oxide, glass), metal pieces, disks (aluminum, glass), and mecha... | Research and development of semiconductor wafers (GaN, SiC, sapphire) for quality improvement in mass production lines. | ||
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ニデック コート本部
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- Featured Products
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Oblique Incidence Interference Method Flatness Tester 'FT-17'
- overview
- 【Features】 - Capable of measuring samples such as wafers (silicon, compounds, oxides, glass), metal pieces, discs (aluminum, glass), and mec...
- Application/Performance example
- Research and development of semiconductor wafers (GaN, SiC, sapphire) for quality improvement in mass production lines.
Oblique Incidence Interference Method Flatness Tester 'FT-900'
- overview
- 【Features】 - Capable of measuring samples such as wafers (silicon, compound, oxide, glass), metal pieces, disks (aluminum, glass), and mecha...
- Application/Performance example
- Research and development of semiconductor wafers (GaN, SiC, sapphire) for quality improvement in mass production lines.
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ニデック コート本部
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