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Characteristics Measurement System - 企業ランキング(全5社)

更新日: 集計期間:Aug 13, 2025〜Sep 09, 2025
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会社名 代表製品
製品画像・製品名・価格帯 概要 用途/実績例
【General Measurement System Configuration】 ■ Electronic Cooling Spectrometer ■ Measurement Wavelength Range: 200–950nm, Wavelength Resolution: 2.5nm (reference value)  ※ Suggestions tailored to excitation light and fluorescence wavelengths ■ Excitation Light Source (LED, Laser, etc.)  ※ Suggestions based on the wavelength and output under consideration ■ Complete Measurement Stage ■ Two Optical Fibers (for irradiation and reception) ■ Sample Holder (customized to fit the samples under consideration) ■ OPwave+ Dedicated Software ※ The above is a general configuration example. Customization is possible based on your considerations. ※ For more details, please refer to the PDF materials or feel free to contact us. 【Usage】 ■ Fluorescence measurement, luminous intensity distribution measurement * For more details, please refer to the PDF document or feel free to contact us.
【List of Reflection Measurement Systems】 ■ Spectral system for measuring specular and diffuse reflection characteristics OP-FLMS-RF-ST1 ■ System for measuring diffuse transmission and diffuse reflection characteristics OP-TR/RF-GONIO-MN ■ Reflectance and color measurement system with separated reflection/diffuse reflection OP-RF-VIS-GT50 series ■ Reflectance and color measurement system with diffuse light irradiation/diffuse reflection light reception OP-DFZ/RF-VIS series ■ Spectralon standard reflection panel SRS series ■ Mirror reflection panel for high reflectance STAN-SSH *For more details, please refer to the PDF document or feel free to contact us. For more details, please refer to the PDF document or feel free to contact us.
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  1. 代表製品
    Fluorescent Diffusion Characteristics Measurement System "OP-FL-GONIO-MN Series"Fluorescent Diffusion Characteristics Measurement System "OP-FL-GONIO-MN Series"
    概要
    【General Measurement System Configuration】 ■ Electronic Cooling Spectrometer ■ Measurement Wavelength Range: 200–950nm, Wavelength Resolution: 2.5nm (reference value)  ※ Suggestions tailored to excitation light and fluorescence wavelengths ■ Excitation Light Source (LED, Laser, etc.)  ※ Suggestions based on the wavelength and output under consideration ■ Complete Measurement Stage ■ Two Optical Fibers (for irradiation and reception) ■ Sample Holder (customized to fit the samples under consideration) ■ OPwave+ Dedicated Software ※ The above is a general configuration example. Customization is possible based on your considerations. ※ For more details, please refer to the PDF materials or feel free to contact us.
    用途/実績例
    【Usage】 ■ Fluorescence measurement, luminous intensity distribution measurement * For more details, please refer to the PDF document or feel free to contact us.
    What is specular reflection? What is diffuse reflection?What is specular reflection? What is diffuse reflection?
    概要
    【List of Reflection Measurement Systems】 ■ Spectral system for measuring specular and diffuse reflection characteristics OP-FLMS-RF-ST1 ■ System for measuring diffuse transmission and diffuse reflection characteristics OP-TR/RF-GONIO-MN ■ Reflectance and color measurement system with separated reflection/diffuse reflection OP-RF-VIS-GT50 series ■ Reflectance and color measurement system with diffuse light irradiation/diffuse reflection light reception OP-DFZ/RF-VIS series ■ Spectralon standard reflection panel SRS series ■ Mirror reflection panel for high reflectance STAN-SSH *For more details, please refer to the PDF document or feel free to contact us.
    用途/実績例
    For more details, please refer to the PDF document or feel free to contact us.