Height Measuring Instrument - 企業ランキング(全4社)
更新日： 集計期間:Jul 09, 2025〜Aug 05, 2025
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企業情報を表示
| 会社名 | 代表製品 | ||
|---|---|---|---|
| 製品画像・製品名・価格帯 | 概要 | 用途/実績例 | |
| 【Lineup (excerpt)】 ■KY-120-P type ■KY-120-TV type ■KY-90-TV type ■KY-90-P type ■KY-60-P type *For more details, please download the PDF or feel free to contact us. | For more details, please download the PDF or feel free to contact us. | ||
| 【Features】 ○ Changed the illumination of the projection slit, incident lighting, and reference slit to a combination of halogen and fiber optics. ○ Suitable for long measurement tasks with stable brightness in both area and spot illumination. ○ Large sample stage to accommodate larger measurement objects. | 【Applications】 ○ Height measurement of thick film ICs ○ Height measurement of sealants for adhesion ○ Variation in height displacement of lead frame pin tips ○ Height measurement of chamfer on the edge surface of discs | ||
| 【Features】 ○ Easy measurement while viewing the TV monitor screen ○ Vertical movement in the Z-axis ○ Fine adjustment in the Y' axis to measure uneven surfaces in 1μm increments ● For other functions and details, please contact us. | For more details, please contact us. | ||
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日商精密光学
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- 代表製品
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Micron Depth Height Measuring Machine
- 概要
- 【Lineup (excerpt)】 ■KY-120-P type ■KY-120-TV type ■KY-90-TV type ■KY-90-P type ■KY-60-P type *For more details, please download the PDF or feel free to contact us.
- 用途/実績例
- For more details, please download the PDF or feel free to contact us.
Slit Intersecting Depth and Height Measuring Device
- 概要
- 【Features】 ○ Changed the illumination of the projection slit, incident lighting, and reference slit to a combination of halogen and fiber optics. ○ Suitable for long measurement tasks with stable brightness in both area and spot illumination. ○ Large sample stage to accommodate larger measurement objects.
- 用途/実績例
- 【Applications】 ○ Height measurement of thick film ICs ○ Height measurement of sealants for adhesion ○ Variation in height displacement of lead frame pin tips ○ Height measurement of chamfer on the edge surface of discs
Light Cut-off Measurement Device Horizontal Micron Depth and Height Measuring Instrument
- 概要
- 【Features】 ○ Easy measurement while viewing the TV monitor screen ○ Vertical movement in the Z-axis ○ Fine adjustment in the Y' axis to measure uneven surfaces in 1μm increments ● For other functions and details, please contact us.
- 用途/実績例
- For more details, please contact us.
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日商精密光学
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