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Measuring probe - 企業ランキング(全3社)

更新日: 集計期間:Aug 20, 2025〜Sep 16, 2025
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会社名 代表製品
製品画像・製品名・価格帯 概要 用途/実績例
【Other Features】 ■ Ruby guide can be inserted into the brass lower guide ■ Tungsten carbide or osmium alloy needle tip ■ Repair and configuration services * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us. 【Applications】 ■ Measurement of resistivity of silicon ingots ■ Four-point measurement of wafer resistivity ■ Four-point measurement of epitaxial layers, ion-implanted layers, and diffusion layers ■ Four-point measurement of metal films and other films * You can download the English version of the catalog. * For more details, please refer to the PDF document or feel free to contact us.
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  1. 代表製品
    Contact Probe for Resistance Measurement for Semiconductor TestingContact Probe for Resistance Measurement for Semiconductor Testing
    概要
    【Other Features】 ■ Ruby guide can be inserted into the brass lower guide ■ Tungsten carbide or osmium alloy needle tip ■ Repair and configuration services * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.
    用途/実績例
    【Applications】 ■ Measurement of resistivity of silicon ingots ■ Four-point measurement of wafer resistivity ■ Four-point measurement of epitaxial layers, ion-implanted layers, and diffusion layers ■ Four-point measurement of metal films and other films * You can download the English version of the catalog. * For more details, please refer to the PDF document or feel free to contact us.