Measuring probe - 企業ランキング(全3社)
更新日: 集計期間:Aug 20, 2025〜Sep 16, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。
企業情報を表示
会社名 | 代表製品 | ||
---|---|---|---|
製品画像・製品名・価格帯 | 概要 | 用途/実績例 | |
【Other Features】 ■ Ruby guide can be inserted into the brass lower guide ■ Tungsten carbide or osmium alloy needle tip ■ Repair and configuration services * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us. | 【Applications】 ■ Measurement of resistivity of silicon ingots ■ Four-point measurement of wafer resistivity ■ Four-point measurement of epitaxial layers, ion-implanted layers, and diffusion layers ■ Four-point measurement of metal films and other films * You can download the English version of the catalog. * For more details, please refer to the PDF document or feel free to contact us. | ||
---
--- |
--- | --- |
-
- 代表製品
-
Contact Probe for Resistance Measurement for Semiconductor Testing
- 概要
- 【Other Features】 ■ Ruby guide can be inserted into the brass lower guide ■ Tungsten carbide or osmium alloy needle tip ■ Repair and configuration services * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.
- 用途/実績例
- 【Applications】 ■ Measurement of resistivity of silicon ingots ■ Four-point measurement of wafer resistivity ■ Four-point measurement of epitaxial layers, ion-implanted layers, and diffusion layers ■ Four-point measurement of metal films and other films * You can download the English version of the catalog. * For more details, please refer to the PDF document or feel free to contact us.
-
すべてを閲覧するには会員登録(無料)が必要です。
すでに会員の方はこちら