Leave it to us for materials and defect analysis! X-ray microfocus inspection: X-ray CT imaging.

Pixel resolution is approximately 7 to 120 µm! Measuring voids in aluminum die-cast products and solder!
Our company conducts "X-ray microfocus inspection: X-ray CT imaging." We irradiate the sample with X-rays and rotate it 360 degrees on the sample stage for imaging. This non-destructive method allows for three-dimensional observation of a wide range of products, confirming internal structures and defects.
Due to the ease of X-ray penetration, contrast is created based on the constituent elements (density). Additionally, elements with higher density appear bright, while smaller elements appear dark.
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