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  6. [Materials and Defect Analysis] X-ray Microfocus Inspection: X-ray CT Imaging

[Materials and Defect Analysis] X-ray Microfocus Inspection: X-ray CT Imaging

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last updated:Dec 22, 2022

ミツバ環境ソリューション
ミツバ環境ソリューション
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Pixel resolution is approximately 7 to 120 µm! Measuring voids in aluminum die-cast products and solder.

Our company conducts "X-ray Microfocus Inspection: X-ray CT Imaging." X-rays are irradiated onto the sample, which is rotated 360 degrees on the sample stage for imaging. This non-destructive method allows for the three-dimensional observation of a wide range of products, including the internal structure and defects of the sample. Due to the varying penetrability of X-rays, contrast is created based on the constituent elements (density). Elements with higher density appear bright, while those with lower density appear dark. 【Features】 - Target sample size: Diameter 150 × Height 170 mm (for vertical imaging) and up to 5 kg - X-rays are irradiated onto the sample, which is rotated 360 degrees on the sample stage for imaging - Enables three-dimensional observation of a wide range of products, including the internal structure and defects of the sample - Contrast is created based on the constituent elements (density) due to the varying penetrability of X-rays - Elements with higher density appear bright, while those with lower density appear dark *For more details, please refer to the related links or feel free to contact us.

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[Materials and Defect Analysis] X-ray Microfocus Inspection: X-ray CT Imaging

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  • Related Link - https://www.t-clover.co.jp/material/x-ray/

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【Examples】 ■ Internal observation - Confirmation of foreign matter ■ Confirmation of voids in aluminum wire solder ■ Investigation of casting defects occupancy rate (defect analysis) *For more details, please refer to the related links or feel free to contact us.

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Applications/Examples of results

【Applications】 ■Internal structure observation  ・Internal defect detection  ・3D shape measurement  ・Fiber orientation analysis (approximately 20mm square shooting area) *For more details, please refer to the related links or feel free to contact us.

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Leave it to us for material and defect analysis! X-ray microfocus inspection: X-ray CT imaging.

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Pixel resolution is approximately 7 to 120 µm! Measuring aluminum die-cast products, voids in solder, etc. Our company conducts "X-ray micro-focus inspection: X-ray CT imaging." We irradiate the sample with X-rays and perform imaging while rotating it 360 degrees on the sample stage. This non-destructive method allows for a wide range of products to be observed in three dimensions, confirming internal structures and defects. Due to the ease of X-ray penetration, contrast is created based on the constituent elements (density). Additionally, elements with higher density appear bright, while smaller elements appear dark. Please feel free to contact us when you need our services.

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Leave material and defect analysis to us! X-ray microfocus inspection: X-ray CT imaging.

  • Product news

Pixel resolution is approximately 7 to 120 µm! Measuring voids in aluminum die-cast products and solder! Our company conducts "X-ray microfocus inspection: X-ray CT imaging." We irradiate the sample with X-rays and perform imaging while rotating it 360 degrees on the sample stage. This non-destructive method allows for a wide range of products to be observed in three dimensions, confirming internal structures and defects. Due to the ease of X-ray penetration, contrast is created based on the constituent elements (density). Additionally, elements with higher density appear bright, while those with lower density appear dark. Please feel free to contact us when you need our services.

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Leave it to us for material and defect analysis! X-ray microfocus inspection: X-ray CT imaging.

  • Product news

Pixel resolution is approximately 7 to 120 µm! Measuring voids in aluminum die-cast products and solder! Our company conducts "X-ray micro-focus inspection: X-ray CT imaging." We irradiate the sample with X-rays and perform imaging while rotating it 360 degrees on the sample stage. This non-destructive method allows for three-dimensional observation of a wide range of products, confirming internal structures and defects. Due to the ease of X-ray penetration, contrast is created based on the constituent elements (density). Additionally, elements with higher density appear bright, while smaller elements appear dark. Please feel free to contact us when you need our services.

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Leave it to us for material and defect analysis! X-ray microfocus inspection: X-ray CT imaging.

  • Product news

Pixel resolution is approximately 7 to 120 µm! Measuring voids in aluminum die-cast products and solder! Our company conducts "X-ray micro-focus inspection: X-ray CT imaging." We irradiate the sample with X-rays and perform imaging while rotating it 360 degrees on the sample stage. This non-destructive method allows for the three-dimensional observation of a wide range of products, confirming internal structures and defects. Due to the ease of X-ray penetration, contrast is created based on the constituent elements (density). Additionally, elements with higher density appear bright, while smaller elements appear dark. Please feel free to contact us when you need our services.

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ミツバ環境ソリューション

ミツバ環境ソリューション

Testing, Analysis and Measurement

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In particular, the "environmental management" that we propose is not merely a means to enhance corporate image or a passport for transactions. For example, within the efforts to obtain "ISO 14001 certification," we believe that it is fundamentally an initiative towards "management reform," aiming to create a company that practices "organizational development," "human resource development," and "improvements in materials and production methods," while accurately executing the "PDCA cycle."

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