Leave material and defect analysis to us! X-ray microfocus inspection: X-ray CT imaging.

Pixel resolution is approximately 7 to 120 µm! Measuring voids in aluminum die-cast products and solder!
Our company conducts "X-ray microfocus inspection: X-ray CT imaging." We irradiate the sample with X-rays and perform imaging while rotating it 360 degrees on the sample stage. This non-destructive method allows for a wide range of products to be observed in three dimensions, confirming internal structures and defects.
Due to the ease of X-ray penetration, contrast is created based on the constituent elements (density). Additionally, elements with higher density appear bright, while those with lower density appear dark.
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