Notice of publication of a written article in the May 2012 issue of Applied Physics.

In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM).
● Magazine Overview
- Publisher: Japan Society of Applied Physics
- Published Issue: May 2012, Applied Physics
- Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy"
● MST Contribution Overview
- Author:
Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology
- Content:
Applications of scanning electron microscopy in research and development - Case studies and uses
Please take a look.

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