Latest Analysis Cases of LA-ICP-MS - Agilent LA-ICP-MS Seminar 2024

LA-ICP-MS (Laser Ablation Inductively Coupled Plasma Mass Spectrometry) is gaining attention as a highly effective method for trace element analysis of solid samples. This technique allows for the analysis of solid samples without the need for prior dissolution by directly introducing tiny particles (aerosols) generated by laser irradiation of the solid sample into the ICP-MS via a flow of He or Ar gas. LA-ICP-MS features high sensitivity analysis, simultaneous multi-element analysis, and localized analysis, demonstrating its power in applications such as materials analysis, semiconductor analysis, life sciences, and forensic science. In this seminar, a wide range of analysis cases from customers already using LA-ICP-MS will be presented, along with the latest technologies from laser ablation manufacturers, and Agilent will also provide the latest information. An information exchange session is also planned at the seminar venue, offering a valuable opportunity to speak directly with speakers and Agilent's application engineers.

Date and time | Wednesday, Nov 13, 2024 10:30 AM ~ 05:15 PM |
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Capital | Congress Square Nihonbashi, 2nd Floor, Hall AB 〒103-0027 Tokyo, Chuo-ku, Nihonbashi 1-3-13, Tokyo Tatemono Nihonbashi Building, 2nd Floor |
Entry fee | Free |
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