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  1. Home
  2. Testing, Analysis and Measurement
  3. アジレント・テクノロジー株式会社
  4. Starting from here: Analysis of ICP-OES and ICP-MS
SEMINAR_EVENT
  • Mar 17, 2025
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Mar 17, 2025

Starting from here: Analysis of ICP-OES and ICP-MS

アジレント・テクノロジー株式会社 アジレント・テクノロジー株式会社
【In response to requests, a re-broadcast has been decided!】 For those who want to see again the highly acclaimed "Starting with ICP-OES and ICP-MS Analysis," as well as for newcomers, this is a must-see!! The content is a re-broadcast of the webinar recording held in July 2024. Please note that it will be duplicate content for those who have already participated. ============= Day 1 Analysis Section Recent analytical instruments, not limited to ICP-OES and ICP-MS, can provide some measurement values when measured, but are those measurement values what you are looking for in your analysis? In this seminar, we will review together the minimum things that need to be confirmed to turn the measurement values obtained from ICP-OES and ICP-MS into analytical values. This content is suitable for those who are starting to analyze with ICP-OES and ICP-MS, those who have concerns about their usual measurement results, and those who want to gain more confidence. By participating in this seminar, you can gain confidence in your analysis starting today. The content is not dependent on the instruments or manufacturers you own. We look forward to your participation.
Starting from here: Analysis and Measurement of ICP-OES and ICP-MS
Starting from here: Analysis and Measurement of ICP-OES and ICP-MS
Date and time Tuesday, Apr 15, 2025
02:00 PM ~ 03:30 PM
Capital
Entry fee Free
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Related Documents

ここから始める ICP-OES、ICP-MS の分析案内状v3 final.pdf[147078]

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5900 ICP-OES-small.jpg

Agilent 5900 ICP-OES

ICP emission spectrometry device Smartly achieves minimal ownership costs and maximum productivity Agilent 5900 ICP-OES

Agilent 5900 ICP-OES Features - Industry's fastest class CCD detector dedicated to ICP-OES, reducing total running costs through rapid measurements - Simultaneous measurement of axial and radial - High matrix tolerance achieved through vertical torch and unique high-frequency technology - Full wavelength high-speed scanning (Intelli Quant 2.0) Measurement for all samples Display of spectral interference information from other elements for each sample - Automatic calculation of detection limits from calibration curves (QC function) - Data analysis support through statistical and testing functions for measurement values - Continuous monitoring of nebulizer gas pressure (PRO Software) - Notification of maintenance timing (notification timing can be customized) - Compact optical design achieved through unique technology, further improving detection limits and resolution

  • Spectroscopic Analysis Equipment

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Agilent 5800 ICP-OES

ICP Emission Spectroscopy Analyzer: A Smart System to Enhance Productivity and Reliability - Agilent 5800 ICP-OES

Agilent 5800 ICP-OES Features - Reduction of total running costs through rapid measurements enabled by the world's fastest CCD detector dedicated to ICP-OES - High matrix tolerance achieved through a vertical torch and unique high-frequency technology - High-speed scanning across all wavelengths (Intelli Quant 2.0) Measurement for all samples Display of spectral interference information from other elements for each sample - Automatic calculation of detection limits from calibration curves (QC function) - Support for data analysis through statistical and testing functions for measurement values - Continuous monitoring of nebulizer gas pressure (PRO Software) - Notification of maintenance timing (notification timing can be customized) - Compact optical design achieved through unique technology, further improving detection limits and resolution

  • Spectroscopic Analysis Equipment

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ICP mass spectrometer "Agilent 8900 Triple Quadrupole"

Achieving MS/MS functionality! A mass spectrometer capable of handling challenging applications.

The "Agilent 8900 Triple Quadrupole ICP-MS (ICP-QQQ)" is a device that has emerged as the high-end model of "Agilent ICP-MS." It combines the well-established features of ICP-MS with the unique power of MS/MS, making it a groundbreaking analytical instrument capable of handling very challenging applications. By eliminating spectral interferences, it fully utilizes the true potential of reaction chemistry, enhancing accuracy and reliability of analysis in complex sample matrices. 【Features】 ○ Realizes MS/MS functionality ○ Achieves ultra-high sensitivity and low background ○ Significantly reduces polyatomic ion interferences ○ Enables high-sensitivity analysis of S, P, and Cl ○ Achieves sub-ppt BEC for Ca, among others For more details, please contact us or download the catalog.

  • Other inspection equipment and devices

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ICP mass spectrometer "Agilent 7900 ICP-MS"

Powerful and highly flexible single quadrupole ICP-MS

The "Agilent 7900 Series ICP-MS" is a next-generation quadrupole ICP-MS that brings together innovative technology and achieves powerful automation. With matrix tolerance of several tens of % TDS, a dynamic range of up to 11 digits, and an effective helium collision mode, it accommodates all applications and enables highly accurate analysis. All components are designed to achieve excellent performance and reliability, enhancing analytical efficiency. 【Features】 ○ Powerful automation ○ Outstanding matrix tolerance ○ Exceptional dynamic range ○ Trace level detection ○ Suitable for all applications For more details, please contact us or download the catalog.

  • Analytical Equipment and Devices

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ICP Mass Spectrometer "Agilent 7850 ICP-MS"

It can detect a wide dynamic range from trace amounts to high concentrations, and it is easy to set conditions for high matrix samples and complex applications.

What if there were a way to conduct analyses more accurately and efficiently? If we could prevent wasting time, staff could focus on tasks that enhance lab results. The Agilent 7850 ICP-MS makes that possible. Daily operations become smoother, reducing staff stress. Additionally, productivity increases, and the reliability of analytical results improves.

  • Analytical Equipment and Devices

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image_28.png

Consumables for ICP-OES

Easily removable injectors! Introducing products that eliminate the need to remove the entire torch!

Agilent ICP-OES parts and consumables are designed, manufactured, and tested based on strict specifications, supporting your analysis with comprehensive support. They are powerful tools that simplify analysis and help you achieve the necessary results. Among them, the "Full Demantable Torch" is compatible with the "Agilent 5000 Series ICP-OES" and can reduce maintenance burdens. 【Full Demantable Torch Features】 ■ Flexibility: Meets the demands of a wide range of applications ■ Increased productivity: Easy maintenance of injectors ■ No manual optimization required: Consistent results before and after injector replacement ■ Easy maintenance: Quick replacement possible *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment

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Consumables for ICP-MS

Parts and consumables that improve the performance and analytical quality of ICP-MS! Supports rapid screening of large samples.

Agilent ICP-MS parts and consumables are designed, manufactured, and tested based on strict specifications, supporting your analysis with comprehensive support. They are powerful tools that simplify analysis and help you achieve the necessary results. They enable reliable trace analysis, reduce interference, and contribute to increased productivity. Additionally, the "Agilent Cone Care Kit and Magnifier" enhance the reliability of ICP-MS interface cone inspections and reduce the burden. 【Features of the Agilent Cone Care Kit and Magnifier】 - Inspection of the condition of the sampling cone or gap cone - Check for the presence of matrix accumulation on the chip - Confirmation of the success of cleaning and maintenance procedures - Check the necessity for cone replacement (especially due to enlargement or damage of the opening) - Elimination of the hassle of removing the cone from the lab for inspection under a microscope *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment

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Related catalog(9)

ADS 2 Catalog

ADS 2 Catalog

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Agilent 7900 ICP-MS

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Agilent 7850 ICP-MS

Agilent 7850 ICP-MS

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Agilent 8900 Triple Quadrupole ICP-MS

Agilent 8900 Triple Quadrupole ICP-MS

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Agilent's ICP-OES Full Demountable Torch

Agilent's ICP-OES Full Demountable Torch

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Improving the reliability of interface cone inspection and reducing the burden <Consumables for ICP-MS>

Improving the reliability of interface cone inspection and reducing the burden <Consumables for ICP-MS>

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Agilent 5900 ICP-OES Catalog

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Agilent 5800 ICP-OES Catalog

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Femtosecond laser ablation ICP-MS enabling direct analysis of solid samples.

Femtosecond laser ablation ICP-MS enabling direct analysis of solid samples.

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We have a permanent exhibition of plant-based deodorants and deodorizing devices. Exhibition location: Osaka ATC Green Eco Plaza.

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【Exhibition Information】 Exhibition Location: Osaka ATC Green Eco Plaza Date and Time: 10:00 AM to 4:30 PM (Closed on Mondays and during the New Year holidays) Address: 2-1-10 Nanko-Kita, Suminoe-ku, Osaka City, ATC Building ITM West Side, 11th Floor New Business Creation Zone - We are exhibiting the industrial deodorant "Deofure (R)" and the household disinfectant deodorant "Marimo Ball (R)." - The product technology for "Marimo Ball (R)" has obtained a patent (Patent No. 7042498). - We are displaying deodorants and usage devices. - A deodorization experience corner is set up. - Staff at the exhibition will provide a brief explanation of the products. - It is also possible for our employees to visit the exhibition space at scheduled times. *For more details, please refer to the materials.

May 19, 2026

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Exhibition Information : 28th INTERPHEX Week Tokyo

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Dear Sir or Madam, We hope this message finds you well and that your company continues to prosper. FUKUDA will be exhibiting at the 28th INTERPHEX Week Tokyo. At the exhibition, we will be showcasing 100% inspection equipment compliant with Container Closure Integrity Testing (CCIT) standards, as well as sampling inspection machines. We sincerely invite you to visit our booth at this opportunity and would greatly appreciate your attendance despite your busy schedule. Yours sincerely, [Dates] May 20 (Wed) - 22 (Fri), 2026 10:00-17:00 (JST) [Venue] Makuhari Messe, Japan 8 Hall Booth No. 41 - 36

May 18, 2026

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gPROMS Formulated Products Crystallization Workshop

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"gPROMS Formulated Products Crystallization Workshop" Target Audience: • For those interested in crystallization modeling with gPROMS Overview ・Date: July 1 (Wednesday) 13:00–17:30 ・Format: Virtual classroom via remote Teams ・Language: Japanese *The text will be in English only. Details will be provided after registration. ・Machine: Exercises will be conducted on a virtual machine using gPROMS. Internet access and a personal laptop are required. Further details will be provided to registered participants later. ・Cost: Free *Registration may be declined for competitors or those using free email addresses.

May 18, 2026

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Notice of Participation in the 12th Extreme Heat Countermeasures Exhibition from July 15 (Wednesday) to July 17 (Friday), 2026.

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Tōyoko Support Co., Ltd. will be exhibiting at the "12th Extreme Heat Countermeasures Exhibition" held at Tokyo Big Sight. This exhibition is a specialized event focused on solving challenges related to heat. By directly seeing and experiencing demonstrations and live performances, you can achieve a high level of satisfaction. We look forward to your visit.

May 18, 2026

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Creating 3D plots using Igor Pro

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Creating 3D Plots Using Igor Pro ~3D Scatter Plots and Surface Plots~ This document introduces how to create a 3D scatter plot from a point cloud data given in XYZ coordinates using Igor Pro, as well as how to create a surface plot using the same data. 1. Overview of 3D Plots 2. Operation Demo: Creating a Scatter Plot 3. Operation Demo: Creating a Surface Plot

May 18, 2026

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