Starting from here: Analysis of ICP-OES and ICP-MS - Measurement Edition

ICP emission spectrometry device Smartly achieves minimal ownership costs and maximum productivity Agilent 5900 ICP-OES

Agilent 5900 ICP-OES Features - Industry's fastest class CCD detector dedicated to ICP-OES, reducing total running costs through rapid measurements - Simultaneous measurement of axial and radial - High matrix tolerance achieved through vertical torch and unique high-frequency technology - Full wavelength high-speed scanning (Intelli Quant 2.0) Measurement for all samples Display of spectral interference information from other elements for each sample - Automatic calculation of detection limits from calibration curves (QC function) - Data analysis support through statistical and testing functions for measurement values - Continuous monitoring of nebulizer gas pressure (PRO Software) - Notification of maintenance timing (notification timing can be customized) - Compact optical design achieved through unique technology, further improving detection limits and resolution

• Spectroscopic Analysis Equipment

ICP Emission Spectroscopy Analyzer: A Smart System to Enhance Productivity and Reliability - Agilent 5800 ICP-OES

Agilent 5800 ICP-OES Features - Reduction of total running costs through rapid measurements enabled by the world's fastest CCD detector dedicated to ICP-OES - High matrix tolerance achieved through a vertical torch and unique high-frequency technology - High-speed scanning across all wavelengths (Intelli Quant 2.0) Measurement for all samples Display of spectral interference information from other elements for each sample - Automatic calculation of detection limits from calibration curves (QC function) - Support for data analysis through statistical and testing functions for measurement values - Continuous monitoring of nebulizer gas pressure (PRO Software) - Notification of maintenance timing (notification timing can be customized) - Compact optical design achieved through unique technology, further improving detection limits and resolution

• Spectroscopic Analysis Equipment

Achieving MS/MS functionality! A mass spectrometer capable of handling challenging applications.

The "Agilent 8900 Triple Quadrupole ICP-MS (ICP-QQQ)" is a device that has emerged as the high-end model of "Agilent ICP-MS." It combines the well-established features of ICP-MS with the unique power of MS/MS, making it a groundbreaking analytical instrument capable of handling very challenging applications. By eliminating spectral interferences, it fully utilizes the true potential of reaction chemistry, enhancing accuracy and reliability of analysis in complex sample matrices. 【Features】 ○ Realizes MS/MS functionality ○ Achieves ultra-high sensitivity and low background ○ Significantly reduces polyatomic ion interferences ○ Enables high-sensitivity analysis of S, P, and Cl ○ Achieves sub-ppt BEC for Ca, among others For more details, please contact us or download the catalog.

• Other inspection equipment and devices

Powerful and highly flexible single quadrupole ICP-MS

The "Agilent 7900 Series ICP-MS" is a next-generation quadrupole ICP-MS that brings together innovative technology and achieves powerful automation. With matrix tolerance of several tens of % TDS, a dynamic range of up to 11 digits, and an effective helium collision mode, it accommodates all applications and enables highly accurate analysis. All components are designed to achieve excellent performance and reliability, enhancing analytical efficiency. 【Features】 ○ Powerful automation ○ Outstanding matrix tolerance ○ Exceptional dynamic range ○ Trace level detection ○ Suitable for all applications For more details, please contact us or download the catalog.

• Analytical Equipment and Devices

It can detect a wide dynamic range from trace amounts to high concentrations, and it is easy to set conditions for high matrix samples and complex applications.

What if there were a way to conduct analyses more accurately and efficiently? If we could prevent wasting time, staff could focus on tasks that enhance lab results. The Agilent 7850 ICP-MS makes that possible. Daily operations become smoother, reducing staff stress. Additionally, productivity increases, and the reliability of analytical results improves.

• Analytical Equipment and Devices

Easily removable injectors! Introducing products that eliminate the need to remove the entire torch!

Agilent ICP-OES parts and consumables are designed, manufactured, and tested based on strict specifications, supporting your analysis with comprehensive support. They are powerful tools that simplify analysis and help you achieve the necessary results. Among them, the "Full Demantable Torch" is compatible with the "Agilent 5000 Series ICP-OES" and can reduce maintenance burdens. 【Full Demantable Torch Features】 ■ Flexibility: Meets the demands of a wide range of applications ■ Increased productivity: Easy maintenance of injectors ■ No manual optimization required: Consistent results before and after injector replacement ■ Easy maintenance: Quick replacement possible *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices
• Spectroscopic Analysis Equipment

Parts and consumables that improve the performance and analytical quality of ICP-MS! Supports rapid screening of large samples.

Agilent ICP-MS parts and consumables are designed, manufactured, and tested based on strict specifications, supporting your analysis with comprehensive support. They are powerful tools that simplify analysis and help you achieve the necessary results. They enable reliable trace analysis, reduce interference, and contribute to increased productivity. Additionally, the "Agilent Cone Care Kit and Magnifier" enhance the reliability of ICP-MS interface cone inspections and reduce the burden. 【Features of the Agilent Cone Care Kit and Magnifier】 - Inspection of the condition of the sampling cone or gap cone - Check for the presence of matrix accumulation on the chip - Confirmation of the success of cleaning and maintenance procedures - Check the necessity for cone replacement (especially due to enlargement or damage of the opening) - Elimination of the hassle of removing the cone from the lab for inspection under a microscope *For more details, please refer to the PDF materials or feel free to contact us.

• Analytical Equipment and Devices
• Spectroscopic Analysis Equipment

We will hold an online seminar as follows. The corporate perspective on the introduction of monitoring systems is changing year by year. We will explain the monitoring systems for machine tools that are currently needed, using various case studies to discuss the changes in the industry environment, what challenges customers perceive, their expectations for monitoring systems, and the effects of their implementation. This seminar will provide insights into specific approaches for your company's introduction of monitoring systems. Date and Time: February 12, 2025 (Thursday) 14:00 - 15:00 Instructor: Monitoring System Representative, ARTIS (MARPOSS Corporation Sales Development Department) Target Audience: - Customers considering the introduction of monitoring systems who want to know the specific process leading to implementation. - Customers interested in what challenges other companies have identified that led to the introduction of monitoring systems. - Customers researching the latest trends in monitoring systems for machine tools. We sincerely look forward to your participation.

■Title: "Fluorine-Free Water and Oil Repellent Treatment Technology Achievable - Guidelines and Examples for Surface Design to Improve Wetting Fundamentals and Liquid Sliding Properties" As PFAS regulations accelerate, surface designs that achieve water and oil repellency without fluorine are gaining attention. This seminar will systematically explain the fundamentals of wetting, dynamic wettability evaluation, design guidelines for improving sliding properties, and the latest examples of fluorine-free surface treatments by leading researchers. ■Date and Time: April 14, 2026 (Tuesday) 13:30 - 16:30 ■Target Audience for the Seminar - Individuals engaged in surface treatment and modification operations - Those involved in research and development related to imparting water and oil repellency, stain resistance, and anti-adhesion properties to various substrate surfaces - Individuals engaged in research and development of fluorine (PFAS) alternative technologies and fluorine-free surface treatment and modification technologies ■Knowledge Gained from the Seminar - Fundamental knowledge/theory regarding wettability - Correct knowledge of wettability evaluation techniques (static/dynamic contact angle, contact angle hysteresis, sliding/falling angle) - Know-how for creating surfaces/interfaces with excellent water and oil repellency, stain resistance, and anti-adhesion properties without fluorine

The "Jumbo Surprise Exhibition," which solves the challenges faced by the manufacturing industry all at once, will be held again this year. In the FA zone, the latest FA equipment, control and drive devices, and energy-saving and labor-saving proposals will be displayed all in one place. You can experience concrete solutions that are immediately useful on-site, such as automation, productivity improvement, equipment renewal, and maintenance efficiency. Representatives from each manufacturer will be available to provide direct explanations, making it a great opportunity to learn about the latest trends and case studies. If you are looking for hints to solve your challenges or considering new equipment investments, please come and visit us. We will provide encounters that will lead your business to the next stage.

■Title: "Flexible Substrates and FPC Formation Technology for 5G/6G - LCP-FCCL and Its Development" ――A must-see for developers of high-frequency FPCs. Provides knowledge useful for future FPC substrate design, from the key technologies for LCP multilayering to examples of new low-dielectric films. ■Date and Time: April 15, 2026 (Wednesday) 13:30 - 16:30 ■Target Audience for the Seminar 　Development engineers engaged in the development of high-frequency FPCs and their substrates ■Knowledge Gained from the Seminar 　・Basic properties required for FPC substrates 　・Reasons for using LCP and polyimide films in FPCs 　・Key technologies for LCP multilayering 　・Points to consider when processing LCP films 　・Examples of hybridization methods between LCP and low-dielectric materials

A systematic explanation from the basics of semiconductor packaging to the design and evaluation of encapsulation materials. A leading expert thoroughly organizes practical perspectives from WLP/PLP to high thermal conductivity materials. ■ Title: Basic Information on Semiconductor Packaging Technology: Comprehensive Explanation ■ Date and Time: April 10, 2026 (Friday) 10:30 AM - 4:30 PM ■ Target Audience for the Seminar - Individuals involved in semiconductor packaging (sales, technology) - Those interested in semiconductor packaging technology - Those interested in semiconductor resin encapsulation and encapsulation materials ■ Knowledge Gained from the Seminar - Development history of semiconductor packaging (PKG) - Development history of semiconductor packaging technology (methods, materials) - Specifications of semiconductor encapsulation materials (raw materials, composition, manufacturing equipment, evaluation methods, etc.)