JTAG Test Introduction Seminar - 238th Session December 7, 2016, Wednesday

Recently, the circuit boards of embedded products have become more complex and advanced, leading to renewed attention on JTAG boundary scan testing, which will be explained in an easy-to-understand manner!
【Seminar Content】
1. Overview of JTAG Boundary Scan Testing
Introduction to JTAG boundary scan architecture and its application fields
2. Background of JTAG Boundary Scan Testing
Changes due to high-density packaging of LSI
Issues related to BGA implementation defects and miniaturization/high density
Overview of 3D LSI/2.5 LSI using embedded components and TSV technology
3. Inspection methods and characteristics of implemented circuit boards
Types of faults detectable by each testing method
Complementarity with in-circuit testing / functional testing / X-ray inspection / automated optical inspection (AOI)
4. JTAG ProVision Demonstration
Introduction of the procedure for conducting board inspection with a live demonstration
5. Domestic companies implementing JTAG testing and case studies of problem-solving
Utilization in development sites and shortening of development periods
Utilization in manufacturing sites and reduction of inspection costs
Utilization in service sites and reduction of repair costs

Date and time | Wednesday, Dec 07, 2016 01:30 AM ~ 05:00 PM |
---|---|
Capital | Venue: Andor System Support Co., Ltd. Tokyo Headquarters Transportation: 6 minutes on foot from Keihin Kyuko Shinbaba Station South Exit (Local train, Yokohama direction ticket gate) 10 minutes on foot from Keihin Kyuko Aomono-Yokocho Station (Express, Limited Express, Local train) 10 minutes on foot from Rinkai Line Shinagawa Seaside Station (Local train) Address: 2-15-8 Minamishinagawa, Shinagawa-ku, Tokyo 140-0004 Phone Number: 03 (3450) 7201 |
Entry fee | Free |
Inquiry about this news
Contact Us OnlineMore Details & Registration
Details & Registration